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1. 发明公开

EP1575059A4 METHOD FOR GENERATING HIGH-SPEED PARTICLE AND SYSTEM FOR GENERATING HIGH-SPEED PARTICLE 有权
标题翻译：方法快速生产颗粒和系统生成快粒子
公开(公告)号：EP1575059A4
公开(公告)日：2010-08-04
申请号：EP03782852
申请日：2003-12-19
申请人： HAMAMATSU PHOTONICS KK
发明人： TAKAHASHI HIRONORI , INOUE TAKASHI , OHSUKA SHINJI , TSUCHIYA YUTAKA
IPC分类号： G21K1/00 , G21G1/12 , H05H1/24 , H05H6/00
CPC分类号： G21G1/12 , A61N2005/1088 , H05H6/00

2. 发明公开

EP0762467A3 Charged particle guide apparatus and image viewing apparatus for charged particle microscope using the same 失效
标题翻译：相同Ladungsträgerteilchen导向装置和图象使用用于Ladungsträgerteilchenmikroskop观看设备
公开(公告)号：EP0762467A3
公开(公告)日：1998-09-23
申请号：EP96306014
申请日：1996-08-16
申请人： JAPAN RES DEV CORP , HITACHI LTD , HAMAMATSU PHOTONICS KK
发明人： OSAKABE NOBUYUKI , ENDO JUNJI , KODAMA TETSUJI , URAKAMI TSUNEYUKI , TSUCHIYA HIROSHI , OHSUKA SHINJI
IPC分类号： H01J37/22 , H01J37/244 , H01J37/26
CPC分类号： H01J37/22 , H01J37/244
摘要： An electron-microscope image viewing apparatus capable of measuring of a moving speed or a vibration frequency of an atomic structure, a magnetic structure, an electric structure or the like of a specimen even when the structure changes at a high rate. The apparatus includes a charged particle source for emitting charged particles, an illuminating electron lens system for illuminating a specimen with a beam of the charged particles, an image magnifying/projecting lens system for magnifying an image of the specimen formed by charged particles scattered upon transmission through the specimen and projecting the magnified image onto an image forming plane, at least one charged particle extracting means provided on the image forming plane of the image magnifying/projecting lens system for taking out the charged particles from a predetermined portion of the charged particle beam projected onto the image forming plane, at least one charged particle detector for detecting the charged particles taken out through the charged particle extracting means, and a signal processing means for processing a signal outputted from the charged particle detector.

3. 发明公开

EP2634821A4 PHOTODIODE ARRAY 有权
公开(公告)号：EP2634821A4
公开(公告)日：2017-12-27
申请号：EP11836216
申请日：2011-10-24
申请人： HAMAMATSU PHOTONICS KK
发明人： SATO KENICHI , YAMAMURA KAZUHISA , OHSUKA SHINJI
IPC分类号： H01L27/144 , H01L27/146 , H01L31/02 , H01L31/107
CPC分类号： H01L27/1446 , H01L27/146 , H01L27/14643 , H01L31/02027
摘要： This photodiode array 10 includes quenching resistors 7 which are connected in series to respective avalanche photodiodes APDs, a peripheral wiring WL which surrounds a region in which the plurality of avalanche photodiodes APDs are formed, and a plurality of relay wirings 8 which are electrically connected to the peripheral wiring WL, so as to respectively connect at least two places of the peripheral wiring WL. One of an anode and a cathode of each avalanche photodiode APD is electrically connected to any one of the relay wirings 8 via the quenching resistor 7, and the other of the anode and the cathode of each avalanche photodiode APD is electrically connected to another electrode 6 provided on a semiconductor substrate.

4. 发明公开

EP3056927A4 COMPTON CAMERA 有权
标题翻译：康普顿佳美
公开(公告)号：EP3056927A4
公开(公告)日：2017-05-24
申请号：EP14852063
申请日：2014-09-26
申请人： UNIV WASEDA , HAMAMATSU PHOTONICS KK
发明人： KATAOKA JUN , NISHIYAMA TORU , OHSUKA SHINJI , HIRAYANAGI MICHITO , ADACHI SHUNSUKE , UCHIYAMA TETSUYA
IPC分类号： G01T1/29
CPC分类号： G01T1/244 , G01T1/2018 , G01T1/2921
摘要： A Compton camera 1 includes a scattering detection unit 10, an absorption detection unit 20, a signal processing unit 30, a first shield unit 41, and a second shield unit 42. The scattering detection unit 10 detects Compton scattering of incident radiation emitted from a radiation source 90. The absorption detection unit 20 detects absorption of incident radiation that has undergone Compton scattering at the scattering detection unit 10. The signal processing unit 30 obtains an image of the radiation source 90 based on coincident detection events of Compton scattering of radiation at the scattering detection unit 10 and absorption of radiation at the absorption detection unit 20. The first and second shield units 41 and 42 are provided between the scattering detection unit 10 and the absorption detection unit 20. The first shield unit 41 selectively allows forward-scattered radiation to pass and selectively blocks back-scattered radiation. This achieves a Compton camera capable of reducing noise.
摘要翻译：康普顿相机1包括散射检测单元10，吸收检测单元20，信号处理单元30，第一屏蔽单元41和第二屏蔽单元42.散射检测单元10检测从一个吸收检测单元20检测在散射检测单元10处已经经历康普顿散射的入射辐射的吸收。信号处理单元30基于辐射源90的康普顿散射的一致检测事件来获得辐射源90的图像散射检测单元10和吸收检测单元20处的辐射的吸收。第一和第二屏蔽单元41和42设置在散射检测单元10和吸收检测单元20之间。第一屏蔽单元41选择性地允许前向散射辐射通过并选择性地阻挡反向散射辐射。这实现了能够降低噪音的康普顿相机。

5. 发明公开

EP1577899A4 TARGET FOR GENERATING DEUTERON AND TARGET APPARATUS FOR GENERATING DEUTERON COMPRISING THE SAME 有权
标题翻译： TARGET于产生氘核和目标设备GENERATING氘核SO
公开(公告)号：EP1577899A4
公开(公告)日：2008-03-05
申请号：EP03780793
申请日：2003-12-16
申请人： HAMAMATSU PHOTONICS KK
发明人： TAKAHASHI HIRONORI , OKAZAKI SHIGETOSHI , OHSUKA SHINJI
IPC分类号： G21K5/08 , G21K1/00 , H05H3/02 , H05H6/00 , G21G1/10 , G21G4/08
CPC分类号： H05H6/00 , H05H3/02
摘要： A target for generating deuteron which comprises a base film comprising a halogen-containing organic compound as the main component thereof and, provided thereon, an upper film comprising a deuterated organic compound as the main component thereof; and an target apparatus for generating deuteron comprising the target. The target has a structure capable of generating deueron with good efficiency.

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