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1. 发明授权

EP1874044B1 SOLID STATE IMAGING DEVICE 有权
标题翻译： SEMICONDUCTORS成像元件
公开(公告)号：EP1874044B1
公开(公告)日：2016-10-12
申请号：EP06731667.9
申请日：2006-04-12
申请人： HAMAMATSU PHOTONICS K.K.
发明人： SUGIYAMA, Yukinobu , MIZUNO, Seiichiro
IPC分类号： H04N5/335 , H01L27/146
CPC分类号： H04N5/35554 , H04N5/347 , H04N5/3535
摘要： A solid-state imaging device 1 is provided with (1) a photodetecting section 11 in which MxN of pixels are two-dimensionally arranged in M rows and N columns, and a pixel P m,n at the m-th row and the n-th column includes a photodiode PD1 m , n , (2) a row selecting section 20 that selects one or more rows, out of M rows of the photodetecting section 11, instructs each pixel in the selected rows to accumulate an electric charge generated in the photodiode PD1 m,n in response to the incidence of light, and instructs to output data corresponding to the amount of accumulated electric charge of each pixel by each row of the photodetecting section 11, and (3) a first signal processing section 30 that inputs data of each pixel, outputted by each row of the photodetecting section 11 by an instruction from the row selecting section 20, and outputs the data by each pixel.

2. 发明授权

EP2099214B1 SOLID-STATE IMAGING DEVICE AND IMAGING METHOD 有权
标题翻译：固态图像传感器系统和成像方法的
公开(公告)号：EP2099214B1
公开(公告)日：2015-01-07
申请号：EP07832184.1
申请日：2007-11-20
申请人： Hamamatsu Photonics K.K.
发明人： SUGIYAMA, Yukinobu , MIZUNO, Seiichiro
IPC分类号： H04N5/32 , H04N5/335
CPC分类号： H04N5/32 , H04N5/357 , H04N5/378
摘要： A determination unit 70 determines whether there is incident light, based on an output value from an integrating circuit 62, and generates a determinated signal indicating a determinated result. A control unit 80 controls charge accumulating portions of an imaging light-receiving unit 10 whether or not to start accumulation of an electric charge, based on the determinated signal, and changes a charge accumulation capacitance value of the integrating circuit 62 of an output unit 60. Specifically, the control unit 80 varies the capacitance value for accumulation of an electric charge generated in a trigger light-receiving unit 20, depending upon the detection result on the presence/absence of incident light, to switch the sensitivity of the integrating circuit 62 to the trigger PD, thereby enabling optimal utilization of the trigger PD.

3. 发明公开

EP2129107A1 SOLID-STATE IMAGING APPARATUS 有权
标题翻译： FESTKÖRPER-BILDGEBERVORRICHTUNG
公开(公告)号：EP2129107A1
公开(公告)日：2009-12-02
申请号：EP07737541.8
申请日：2007-02-28
申请人： Hamamatsu Photonics K.K.
发明人： MIZUNO, Seiichiro , FUNAKOSHI, Haruhiro
IPC分类号： H04N5/335 , H01L27/146 , H04N1/028
CPC分类号： H04N5/37452
摘要： A solid-state imaging device 1 includes N pixel sections 10 i to 10 N , transimpedance circuits 20a and 20b, integrating circuits 30a and 30b, and a difference arithmetic circuit 40. Each pixel section 10 n includes a photoelectric converting circuit including a photodiode, and a first holding circuit and a second holding circuit which hold an output voltage of the photoelectric converting circuit. A voltage held by the first holding circuit of each pixel section 10 n is input into the difference arithmetic circuit 40 through a common wire 50a, the transimpedance circuit 20a, and the integrating circuit 30a. A voltage held by the second holding circuit of each pixel section 10 n is input into the difference arithmetic circuit 40 through a common wire 50b, the transimpedance circuit 20b, and the integrating circuit 30b. A voltage corresponding to a difference between the voltages output from the integrating circuits 30a and 30b, respectively, is output from the difference arithmetic circuit 40.
摘要翻译：固态成像装置1包括N个像素部分10i至10N，跨阻抗电路20a和20b，积分电路30a和30b以及差分运算电路40.每个像素部分10n包括光电转换电路，其包括光电二极管，以及保持光电转换电路的输出电压的第一保持电路和第二保持电路。每个像素部分10 n的第一保持电路保持的电压通过公共线50a，跨阻抗电路20a和积分电路30a输入差分运算电路40。每个像素部分10 n的第二保持电路保持的电压通过公共线50b，跨阻抗电路20b和积分电路30b输入差分运算电路40。从差分运算电路40输出对应于从积分电路30a和30b输出的电压之间的差分的电压。

4. 发明公开

EP1980208A1 SOLID STATE IMAGING DEVICE 审中-公开
标题翻译： HALBLEITER-BILDGEBUNGSBAUELEMENT
公开(公告)号：EP1980208A1
公开(公告)日：2008-10-15
申请号：EP07707703.0
申请日：2007-01-30
申请人： HAMAMATSU PHOTONICS K.K.
发明人： SUGIYAMA, Yukinobu , MIZUNO, Seiichiro
IPC分类号： A61B6/14 , G01T1/20 , H01L27/146 , H01L31/09 , H04N5/32
CPC分类号： H04N5/378 , A61B6/14 , G01T1/2018 , H03F3/08 , H04N5/32 , H04N5/357 , H04N5/3575 , H04N5/3745
摘要： A solid-state image pickup device 1 includes an imaging photodetecting section 10, a triggering photodetecting section 20, a row selecting section 30, a column selecting section 40, a voltage holding section 50, an output section 60, and a controlling section 70. The imaging photodetecting section 10 is for taking an image of incident light, and includes pixel sections P 1,1 to P M,N arrayed two dimensionally in M rows and N columns. The triggering photodetecting section 20 is for detecting an incidence of light, and includes a triggering photodiode that generates electric charge of an amount according to an incident light intensity. The output section 60 outputs pixel data of a value according to the amount of electric charge generated by a photodiode of any pixel section P m,n of the pixel sections P 1,1 to P M,N included in the imaging photodetecting section 10 and triggering data of a value according to the amount of electric charge generated by the triggering photodiode included in the triggering photodetecting section 20 to a common output signal line Lout.
摘要翻译：固体摄像装置1包括摄像受光部10，触发用光检测部20，行选择部30，列选择部40，电压保持部50，输出部60以及控制部70。成像光检测部分10用于拍摄入射光的图像，并且包括以M行和N列二维排列的像素部分P 1,1至PM，N。触发光检测部分20用于检测光的入射，并且包括产生根据入射光强度的量的电荷的触发光电二极管。输出部分60根据由成像光电检测部分10中包括的像素部分P 1,1至PM，N的任何像素部分P m，n的光电二极管产生的电荷量输出值的像素数据，并触发根据由触发光电检测部20中包含的触发光电二极管所产生的电荷量与公共输出信号线Lout的值的数据。

5. 发明公开

EP1330037A1 A/D CONVERTER AND SOLID-STATE CAMERA 有权
标题翻译： A / D-UMSETZER UNDFESTKÖRPERKAMERA
公开(公告)号：EP1330037A1
公开(公告)日：2003-07-23
申请号：EP01984390.3
申请日：2001-07-27
申请人： Hamamatsu Photonics K.K.
发明人： FUJITA, Kazuki , MIZUNO, Seiichiro
IPC分类号： H03M1/14 , H04N5/335
CPC分类号： H03M1/144 , H03M1/162 , H04N5/378
摘要： A signal from a photodiode PD is input to an A/D conversion circuit 30 via an integrating circuit 10 and connection switching circuit 20. Any residual in A/D conversion processing is amplified by an amplifier circuit 40. The amplified residual (analog value) is input to the A/D conversion circuit 30 via the connection switching circuit 20, and converted into a digital value by the A/D conversion circuit 30.
摘要翻译：来自光电二极管PD的信号通过积分电路10和连接切换电路20输入到A / D转换电路30.A / D转换处理中的任何残留都由放大器电路40放大。放大的残差（模拟值）经由连接切换电路20输入到A / D转换电路30，并由A / D转换电路30转换为数字值。

6. 发明公开

EP1223549A1 CAMERA SYSTEM FOR HIGH-SPEED IMAGE PROCESSING 有权
标题翻译： KAMERASYSTEMFÜRBILDVERARBEITUNG MIT HOHER BETRIEBSGESCHWINDIGKEIT
公开(公告)号：EP1223549A1
公开(公告)日：2002-07-17
申请号：EP00964646.4
申请日：2000-10-04
申请人： Hamamatsu Photonics K.K.
发明人： TOYODA, Haruyoshi , NAKAMURA, Kazuhiro , MIZUNO, Seiichiro , YAMAKAWA, Hiroo , MUKOHZAKA, Naohisa
IPC分类号： G06T1/20
CPC分类号： H04N5/335 , G06T1/20
摘要： The analog-to-digital converter array 13 includes one analog-to-digital converter 210 for each row of photodetectors 120 in the photodetector array 11. The image-processing unit 14 includes the plurality of processing circuits 400 for performing high-speed image processing. The signal converter 17 combines the output signals from the analog-to-digital converter array 13 with output signals from the image-processing unit 14. Under control of the control circuit 15 and the signal conversion controller 19, the signal converter 17 downconverts the composite signal at an important timing to a frame rate suitable for display on the monitor 18 and subsequently displays the signal on the monitor 18.
摘要翻译：模数转换器阵列13包括用于光电检测器阵列11中的每行光电检测器120的一个模拟 - 数字转换器210.图像处理单元14包括用于执行高速图像处理的多个处理电路400 。信号转换器17将来自模拟 - 数字转换器阵列13的输出信号与来自图像处理单元14的输出信号进行组合。在控制电路15和信号转换控制器19的控制下，信号转换器17将合成器信号在适合于在监视器18上显示的帧速率的重要定时，并随后在监视器18上显示信号。

7. 发明授权

EP1607715B1 OPTICAL SENSOR 有权
公开(公告)号：EP1607715B1
公开(公告)日：2018-03-28
申请号：EP04709757.1
申请日：2004-02-10
申请人： HAMAMATSU PHOTONICS K.K.
发明人： SUGIYAMA, Yukinobu , MIZUNO, Seiichiro
IPC分类号： G01B11/00 , H01L27/146 , H04N5/335 , H04N3/14 , G06F3/042
CPC分类号： G06F3/042 , G01B11/00 , H01L27/14603 , H04N3/1506 , H04N5/335
摘要： A signal processing circuit 20 has switches 21, a shift register 22, and an integrating circuit 23, and outputs voltages Vout indicating luminance profiles in a second direction and in a first direction of light incident to a photosensitive region 10. The switches 21 are provided corresponding to groups of photosensitive portions on one side electrically connected among a plurality of pixels arrayed in the first direction and corresponding to groups of photosensitive portions on another side electrically connected among a plurality of pixels arrayed in the second direction. The shift register 22 is an element for sequentially reading electric currents from the groups of photosensitive portions on one side in the second direction and for sequentially reading electric currents from the groups of photosensitive portions on another side in the first direction. The integrating circuit 23 sequentially imports the electric currents from the groups of photosensitive portions on one side and the groups of photosensitive portions on another side sequentially read by the shift register 22, and converts the electric currents into voltages.

8. 发明授权

EP2166373B1 BACK SURFACE INCIDENT TYPE DISTANCE MEASURING SENSOR AND DISTANCE MEASURING DEVICE 有权
标题翻译：返回活动距离测量传感器和距离测量装置
公开(公告)号：EP2166373B1
公开(公告)日：2015-09-09
申请号：EP08790809.1
申请日：2008-07-02
申请人： Hamamatsu Photonics K.K.
发明人： MASE, Mitsuhito , SUZUKI, Takashi , MIZUNO, Seiichiro , TAKEMURA, Mitsutaka
IPC分类号： G01S17/10 , H01L27/146 , H01L31/12
CPC分类号： H01L27/1464 , G01S7/4863 , G01S17/10 , G01S17/89 , H01L27/14612 , H01L27/14634 , H01L27/14636 , H01L2224/05001 , H01L2224/05124 , H01L2224/05568 , H01L2224/0557 , H01L2224/05624 , H01L2224/16225 , H01L2924/00014

9. 发明授权

EP1249789B1 PHOTODETECTOR DEVICE 有权
标题翻译：光电检测设备
公开(公告)号：EP1249789B1
公开(公告)日：2012-01-04
申请号：EP00976370.7
申请日：2000-11-20
申请人： HAMAMATSU PHOTONICS K.K.
发明人： MIZUNO, Seiichiro , MUKOZAKA, Naohisa , TOYODA, Haruyoshi
IPC分类号： G06T7/20 , H04N5/335 , H01L31/10 , G01J1/44
CPC分类号： G01J1/46 , H04N5/3745
摘要： N photodetectors (80 1-80N) each comprise a photo diode (PD), a capacitor (C d), and a switch (SW 0). An integrator circuit (10) includes a parallel circuit of an amplifier (A 1), a capacitor (C f1) and a switch (SW 11) between an input terminal and an output terminal. The capacitance of the capacitor (C f1) is equal to the capacitance of each capacitor (Cd) of the photodetectors (80 1-80N). A switch (SW 01) is provided between the switches (SW 0) of the photodetectors (80 1-80N) and the input terminal of the integrator circuit (10). A switch (SW 02) is provided between the output terminal of the integrator circuit (10) and the switches (SW 0) of the photodetectors (80 1-80N).

10. 发明公开

EP2187237A1 SOLID STATE IMAGING DEVICE AND DISTANCE IMAGE MEASUREMENT DEVICE 有权
标题翻译：固态图像装置和距离图像测量装置
公开(公告)号：EP2187237A1
公开(公告)日：2010-05-19
申请号：EP08827639.9
申请日：2008-08-22
申请人： Hamamatsu Photonics K.K.
发明人： MASE, Mitsuhito , MIZUNO, Seiichiro , TAKEMURA, Mitsutaka
IPC分类号： G01S17/10 , H01L27/146 , H04N5/335
CPC分类号： H04N5/2352 , G01S7/4863 , G01S17/10 , G01S17/89 , H01L27/14603 , H04N5/3559 , H04N5/374 , H04N5/37452
摘要： A pair of first gate electrodes IGR, IGL are provided on a semiconductor substrate 100 so that potentials φ TX1 , φ TX2 between a light-sensitive area SA and a pair of first accumulation regions AR, AL alternately ramp. A pair of second gate electrodes IGR, IGL are provided on the semiconductor substrate 100 so as to control the height of first potential barriers φ BG each interposed between the first accumulation region AR, AL and a second accumulation region FDR, FDL, and increase the height of the first potential barrier φ BG to carriers as a higher output of a background light is detected by a photodetector.

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