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    • 3. 发明公开
    • SELF-REFRENCE READ METHOD OF A SPIN TORQUE MAGNETIC RANDOM ACCESS MEMORY
    • 自旋转矩磁随机存取存储器的自折射读取方法
    • EP3188188A1
    • 2017-07-05
    • EP17150776.7
    • 2012-01-31
    • Everspin Technologies, Inc.
    • ALAM, Syed M.ANDRE, ThomasCROFT, Matthew R.SUBRAMANIAN, ChitraLIN, Halbert
    • G11C11/00G11C11/16G11C29/04G11C13/00G06F11/10
    • G11C11/1675G06F11/1048G06F11/1076G11C11/00G11C11/16G11C11/1673G11C11/1693G11C2013/0076G11C2029/0411
    • A spin-torque magnetoresistive memory comprises an array (602) of spin-torque magnetoresistive memory bits; a plurality of latches (626); array read circuits (610) coupled to the array of bits (602) and the plurality of latches (626), wherein the array read circuits are configured to:
      sample bits in a page within the array of bits, wherein sampling provides a sampled voltage for each of the bits in the page, wherein the array read circuits are configured to sample each bit in the page by applying a first voltage across the bit and converting a current resulting from applying the first voltage to the sampled voltage;
      after sampling the bits in the page, apply a first write current pulse to each of the bits in the page to set all of the bits in the page to a first logic state;
      after applying the first write current pulse to each of the bits in the page, resample each of the bits in the page to provide a resampled voltage for each bit in the page, wherein the array read circuits are configured to resample each bit by reapplying the first voltage across the bit and adding an offset current to a current resulting from reapplying the first voltage across the bit, wherein the array read circuits are configured to generate the resampled voltage for each bit using the offset current and the current resulting from reapplying the first voltage across the bit;
      for each bit in the page, compare the resampled voltage with the sampled voltage to determine a bit state for the bit, wherein the bit state for each bit is either the first logic state or a second logic state; and
      store the bit state for each bit in the page in a corresponding latch of the plurality of latches (626). The memory comprises further array write circuits (612) coupled to the array of bits (602) and the plurality of latches (626), the array write circuits (612) configured to, for each of the bits in the page having the second logic state as stored in the plurality of latches (626), initiate a write-back to reset the bit to the second state in the array, wherein the write-back for each bit includes applying a second write current pulse to set the bit to the second state.
    • 自旋扭矩磁阻存储器包括自旋扭矩磁阻存储器位的阵列(602) 多个锁存器(626); 耦合到所述位阵列(602)和所述多个锁存器(626)的阵列读取电路(610),其中所述阵列读取电路被配置为:对所述位阵列内的页中的位进行采样,其中采样提供采样电压 对于所述页面中的每个位,其中所述阵列读取电路被配置为通过在所述位上施加第一电压来采样所述页中的每个位,并且将通过将所述第一电压施加到所述采样电压而产生的电流转换; 在采样所述页面中的比特之后,向所述页面中的每个比特应用第一写入电流脉冲以将所述页面中的所有比特设置为第一逻辑状态; 在将所述第一写入电流脉冲施加到所述页面中的每个位之后,重新采样所述页面中的每个位以为所述页面中的每个位提供重新采样电压,其中所述阵列读取电路被配置为通过重新应用 在所述位上施加第一电压并且将补偿电流添加到通过在所述位上重新施加所述第一电压而产生的电流,其中所述阵列读取电路被配置为使用所述补偿电流和通过重新应用所述第一电压 位上的电压; 对于页中的每个位,比较重新采样电压和采样电压以确定该位的位状态,其中每个位的位状态是第一逻辑状态或第二逻辑状态; 并且将该页中每个比特的比特状态存储在多个锁存器(626)的相应锁存器中。 存储器包括耦合到位阵列(602)和多个锁存器(626)的另外的阵列写入电路(612),阵列写入电路(612)被配置为对于具有第二逻辑的页面中的每个位 状态存储在多个锁存器(626)中,启动回写以将该位复位到阵列中的第二状态,其中每个位的回写包括施加第二写入电流脉冲以将该位设置为 第二状态。
    • 5. 发明公开
    • METHOD OF WRITING TO A SPIN TORQUE MAGNETIC RANDOM ACCESS MEMORY
    • 方法写在一拧,扭矩磁直接访问存储器
    • EP2671229A1
    • 2013-12-11
    • EP12742660.9
    • 2012-01-31
    • Everspin Technologies, Inc.
    • ALAM, Syed M.ANDRE, ThomasCROFT, Matthew R.SUBRAMANIAN, ChitraLIN, Halbert
    • G11C11/00
    • G11C11/1675G06F11/1048G06F11/1076G11C11/00G11C11/16G11C11/1673G11C11/1693G11C2013/0076G11C2029/0411
    • A spin-torque magnetoresistive memory comprises an array (602) of spin-torque magnetoresistive memory bits; a plurality of latches (626); array read circuits (610) coupled to the array of bits (602) and the plurality of latches (626), wherein the array read circuits are configured to: sample bits in a page within the array of bits, wherein sampling provides a sampled voltage for each of the bits in the page, wherein the array read circuits are configured to sample each bit in the page by applying a first voltage across the bit and converting a current resulting from applying the first voltage to the sampled voltage; after sampling the bits in the page, apply a first write current pulse to each of the bits in the page to set all of the bits in the page to a first logic state; after applying the first write current pulse to each of the bits in the page, resample each of the bits in the page to provide a resampled voltage for each bit in the page, wherein the array read circuits are configured to resample each bit by reapplying the first voltage across the bit and adding an offset current to a current resulting from reapplying the first voltage across the bit, wherein the array read circuits are configured to generate the resampled voltage for each bit using the offset current and the current resulting from reapplying the first voltage across the bit; for each bit in the page, compare the resampled voltage with the sampled voltage to determine a bit state for the bit, wherein the bit state for each bit is either the first logic state or a second logic state; and store the bit state for each bit in the page in a corresponding latch of the plurality of latches (626). The memory comprises further array write circuits (612) coupled to the array of bits (602) and the plurality of latches (626), the array write circuits (612) configured to, for each of the bits in the page having the second logic state as stored in the plurality of latches (626), initiate a write-back to reset the bit to the second state in the array, wherein the write-back for each bit includes applying a second write current pulse to set the bit to the second state.