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    • 7. 发明公开
    • DIODE ELEMENT AND DETECTING DEVICE
    • DIODENELEMENT UND DETEKTOR
    • EP2732476A1
    • 2014-05-21
    • EP12741393.8
    • 2012-06-27
    • Canon Kabushiki Kaisha
    • SEKIGUCHI, RyotaKOTO, Makoto
    • H01L31/108H01L31/0224H01L29/872H01L29/06
    • H01L29/872H01L27/14H01L27/14612H01L27/14643H01L29/0619H01L29/456H01L31/022408H01L31/108
    • Provided is a diode element, a detecting device, and the like which solve problems of a conventional lateral diode element. In the conventional element, a semiconductor interface appears in current path between two electrodes on a surface thereof, and thus noise caused by the interface is large. The diode element includes: a first-conductive-type low carrier concentration layer (103); a first-conductive-type high carrier concentration layer (102); and a Schottky electrode (104) and an ohmic electrode (105) which are formed on a semiconductor surface. The low carrier layer (103) has a carrier concentration that is lower than that of the high carrier layer (102). The diode element includes a first-conductive-type impurity introducing region (106) formed below the ohmic electrode (105), and includes a second-conductive-type impurity introducing region (107) so as not to be in electrical contact with the Schottky electrode (104) on the semiconductor surface between the Schottky electrode (104) and the ohmic electrode (105). The second-conductive-type region (107) is in contact with the first-conductive-type region (106).
    • 提供了解决常规侧面二极管元件的问题的二极管元件,检测装置等。 在常规元件中,半导体界面出现在其表面上的两个电极之间的电流路径中,因此由界面引起的噪声较大。 二极管元件包括:第一导电型低载流子浓度层; 第一导电型高载流子浓度层; 以及形成在半导体表面上的肖特基电极和欧姆电极。 低载体层的载流子浓度低于高载流子层的载流子浓度。 二极管元件包括形成在欧姆电极下方的第一导电型杂质导入区域,并且包括第二导电型杂质导入区域,以便不与肖特基与肖特基二极管之间的半导体表面上的肖特基电极电接触 欧姆 第二导电型区域与第一导电型区域接触。