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    • 2. 发明公开
    • Method for producing optical part
    • 赫尔斯特朗·赫斯特伦
    • EP2243622A2
    • 2010-10-27
    • EP10003797.7
    • 2010-04-08
    • CANON KABUSHIKI KAISHA
    • Ito, Toshiki
    • B29D11/00
    • B29D11/00355B29D11/00442
    • A method for producing an optical part provided with composition ratio distributions, including a refractive index distribution, in an order of mm is provided. The method includes an irradiation process for irradiating a radiation-sensitive polymerizable composition (1) with a radiation (5). The composition (1) includes at least a polymerizable compound (a) and a polymerizable or non-polymerizable component (c). The irradiation process includes at least a first step of irradiating with a radiation (5) only a first irradiation region that is a portion of the composition (1) and a second step of irradiating with a radiation (5) only a second irradiation region that is a portion of the composition (1) and is different from the first irradiation region in at least one of size and position. When the component (c) is polymerizable, the polymerization rate of the component (c) is lower than that of the compound (a) in the first and the second steps.
    • 提供了一种制造具有包括折射率分布的组成比分布的光学部件的方法,其数量为毫米。 该方法包括用辐射(5)照射辐射敏感性聚合性组合物(1)的照射方法。 组合物(1)至少包含可聚合化合物(a)和可聚合或不可聚合组分(c)。 照射方法至少包括仅使用作为组合物(1)的一部分的第一照射区域的辐射(5)照射的第一步骤和仅照射第二照射区域的辐射(5)的第二步骤 是组合物(1)的一部分,并且在尺寸和位置中的至少一个中不同于第一照射区域。 当组分(c)可聚合时,组分(c)的聚合速率低于第一步和第二步中化合物(a)的聚合速率。
    • 5. 发明公开
    • Photosensitive compound, photosensitive composition, method for resist pattern formation, and process for device prodution
    • 方法zur Fotolack-Strukturierung und Prozess zur Herstellung eines Bausteins
    • EP1865379A1
    • 2007-12-12
    • EP07108733.2
    • 2007-05-23
    • CANON KABUSHIKI KAISHA
    • Ito, ToshikiYamaguchi, Takako
    • G03F7/004G03F7/039C07C205/35C07C205/00G03F7/023
    • C07C205/34G03F7/0045G03F7/023G03F7/039
    • A process for forming a resist pattern comprises the steps of applying on a substrate to form a photosensitive resist layer a photosensitive composition comprising at least one photosensitive compound having, in the molecule, two or more structural units represented by C 6 R 2-6 -CHR 1 -OR 7 or C 6 R 2-6 -CHR 1 -COOR 7 where R 1 is a hydrogen atom or an alkyl group, at least one of R 2 , R 3 , R 4 , R 5 , and R 6 is a nitro group, and others are selected from the group consisting of a hydrogen atom, a halogen atom, an alkyl, an alkoxy, a phenyl, a naphthyl, and an alkyl in which a part or the entire of hydrogen atoms are substituted by a fluorine atom, and R 7 is a substituted or unsubstituted phenylene or naphthylene group dissolved in an organic solvent, irradiating the resist layer selectively with a radiation ray, and developing a portion irradiated by the ray to form a pattern of the resist layer.
    • 用于形成抗蚀剂图案的方法包括以下步骤:在基材上施加光敏抗蚀剂层,所述感光组合物包含至少一种在分子中具有两个或更多个由C 6 R 2-6 - CHR 1 -OR 7或C 6 R 2-6 -CHR 1 -COOR 7其中R 1是氢原子或烷基,R 2,R 3,R 4,R 5和R 6中的至少一个是 硝基等,选自氢原子,卤素原子,烷基,烷氧基,苯基,萘基和其中一部分或全部氢原子被 氟原子,R 7为溶解在有机溶剂中的取代或未取代的亚苯基或亚萘基,用辐射线选择性地照射抗蚀剂层,并且使用该光线照射的部分显影以形成抗蚀剂层的图案。