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1. 发明公开

EP4022669A1 ELECTROSTATIC LENS FOR CONTROLLING BEAM OF ELECTRONS 审中-实审
公开(公告)号：EP4022669A1
公开(公告)日：2022-07-06
申请号：EP20856886.5
申请日：2020-08-27
申请人： Scienta Omicron AB
发明人： OLOFSSON, Mikael
IPC分类号： H01J49/44 , G01N23/227 , H01J37/05 , H01J49/00 , H01J49/28 , H01J49/46 , H01J49/48

2. 发明公开

EP4285401A1 ANGLE-RESOLVING PHOTOELECTRON SPECTROMETER AND METHOD 审中-实审
公开(公告)号：EP4285401A1
公开(公告)日：2023-12-06
申请号：EP22746346.0
申请日：2022-01-19
申请人： Scienta Omicron AB
发明人： OLOFSSON, Mikael , KARLSSON, Patrik
IPC分类号： H01J49/08 , G01N23/00 , G01N23/2273 , H01J37/12 , H01J49/00

3. 发明公开

EP3891774A1 METHOD AND ARRANGEMENT FOR DISTANCE CONTROL BETWEEN A SAMPLE AND AN APERTURE 审中-公开
公开(公告)号：EP3891774A1
公开(公告)日：2021-10-13
申请号：EP19821307.6
申请日：2019-12-06
申请人： Scienta Omicron AB
发明人： AMANN, Peter , NILSSON, Anders
IPC分类号： H01J37/285 , G01N23/227

4. 发明公开

EP4405905A1 CHARGED PARTICLE SPECTROMETER 审中-实审
公开(公告)号：EP4405905A1
公开(公告)日：2024-07-31
申请号：EP22873276.4
申请日：2022-09-07
申请人： Scienta Omicron AB
发明人： KARLSSON, Patrik
IPC分类号： G06T17/30 , G06F17/12 , H01J49/22 , G01N23/20 , H01J37/05
CPC分类号： H01J49/06 , H01J49/48

5. 发明公开

EP4314902A1 CHARGED PARTICLE SPECTROMETER AND METHOD FOR CALIBRATION 审中-实审
公开(公告)号：EP4314902A1
公开(公告)日：2024-02-07
申请号：EP22776222.6
申请日：2022-03-11
申请人： Scienta Omicron AB
发明人： HASHIMOTO, Takahiro , WIELL, Tomas
IPC分类号： G01T7/00 , G01T1/36 , G01N23/225 , G01T1/16 , H01J37/12 , H01J49/44 , H01J49/48

6. 发明公开

EP3891775A1 METHOD FOR DETERMINING A PRESSURE AT A SAMPLE SURFACE 审中-公开
公开(公告)号：EP3891775A1
公开(公告)日：2021-10-13
申请号：EP19827855.8
申请日：2019-12-06
申请人： Scienta Omicron AB
发明人： AMANN, Peter , NILSSON, Anders
IPC分类号： H01J37/285 , G01N23/227

7. 发明授权

EP2851933B1 Analyser arrangement for particle spectrometer 有权转让
标题翻译： AnalilatoranordnungfürTeilchenspektrometer
公开(公告)号：EP2851933B1
公开(公告)日：2016-10-19
申请号：EP14185601.3
申请日：2012-03-06
申请人： Scienta Omicron AB
发明人： Wannberg, Björn
IPC分类号： H01J49/06 , H01J37/05 , H01J49/48 , G01N23/227
CPC分类号： H01J49/48 , G01N23/2273 , G01N2223/085 , H01J37/05 , H01J49/0031 , H01J49/06 , H01J49/061 , H01J49/484 , H01J2237/0535
摘要： The present invention relates to a method for determining at least one parameter related to charged particles emitted from a particle emitting sample (11), e.g. a parameter related to the energies, the start directions, the start positions or the spin of the particles. The method comprises the steps of guiding a beam of charged particles into an entrance of a measurement region by means of a lens system (13), and detecting positions of the particles indicative of said at least one parameter within the measurement region. Furthermore, the method comprises the steps of deflecting the particle beam at least twice in the same coordinate direction before entrance of the particle beam into the measurement region. Thereby, both the position and the direction of the particle beam at the entrance (8) of the measurement region (3) can be controlled in a way that to some extent eliminates the need for physical manipulation of the sample (11). This in turn allows the sample to be efficiently cooled such that the energy resolution in energy measurements can be improved.
摘要翻译：本发明涉及一种用于确定与从粒子发射样品（11）发射的带电粒子有关的至少一个参数的方法，例如，与能量，起始方向，起始位置或颗粒的旋转相关的参数。该方法包括以下步骤：通过透镜系统（13）将带电粒子束引导到测量区域的入口，以及在测量区域内检测指示所述至少一个参数的粒子的位置。此外，该方法包括以下步骤：在粒子束进入测量区域之前，在相同的坐标方向上将粒子束偏转至少两次。因此，能够以在某种程度上不需要对样品（11）的物理操作的方式来控制测量区域（3）的入口（8）处的粒子束的位置和方向。这又允许样品被有效地冷却，使得能量测量中的能量分辨率可以得到改善。

8. 发明公开

EP3891776A2 APERTURE DEVICE AND ANALYSER ARRANGEMENT 审中-公开
公开(公告)号：EP3891776A2
公开(公告)日：2021-10-13
申请号：EP19821306.8
申请日：2019-12-06
申请人： Scienta Omicron AB
发明人： AMANN, Peter , NILSSON, Anders
IPC分类号： H01J49/00 , H01J37/285 , G01N23/227

9. 发明公开

EP3633360A1 HARD X-RAY PHOTOELECTRON SPECTROSCOPY ARRANGEMENT AND SYSTEM 有权
公开(公告)号：EP3633360A1
公开(公告)日：2020-04-08
申请号：EP19200530.4
申请日：2019-09-30
申请人： Scienta Omicron AB
发明人： WIELL, Tomas , LILJENBERG, Cristopher , PALMGREN, Pål
IPC分类号： G01N23/2273
摘要： The present invention relates to a hard X-ray photoelectron spectroscopy (HAXPES) system comprising an X-ray source providing a beam of photons which is directed through the system so as to excite electrons from an illuminated sample. An X-ray tube is connected to a monochromator vacuum chamber in which a crystal is configured to monochromatize and focus the beam onto an illuminated sample. A hemispherical electron energy analyser is mounted onto the analysis chamber. An air gap is provided between the X-ray tube and the monochromator chamber, which air gap is provided with a first radiation trap to shield the ambient air from the radiation when the air gap is illuminated with X-rays from the source.

10. 发明授权

EP2823504B1 ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER 有权转让
公开(公告)号：EP2823504B1
公开(公告)日：2018-08-01
申请号：EP12870629.8
申请日：2012-03-06
申请人： Scienta Omicron AB
发明人： WANNBERG, Björn
IPC分类号： H01J49/06 , H01J37/05 , H01J49/48 , G01N23/2273
CPC分类号： H01J49/48 , G01N23/2273 , G01N2223/085 , H01J37/05 , H01J49/0031 , H01J49/06 , H01J49/061 , H01J49/484 , H01J2237/0535
摘要： The present invention relates to a method for determining at least one parameter related to charged particles emitted from a particle emitting sample (11), e.g. a parameter related to the energies, the start directions, the start positions or the spin of the particles. The method comprises the steps of guiding a beam of charged particles into an entrance of a measurement region by means of a lens system (13), and detecting positions of the particles indicative of said at least one parameter within the measurement region. Furthermore, the method comprises the steps of deflecting the particle beam at least twice in the same coordinate direction before entrance of the particle beam into the measurement region. Thereby, both the position and the direction of the particle beam at the entrance (8) of the measurement region (3) can be controlled in a way that to some extent eliminates the need for physical manipulation of the sample (11). This in turn allows the sample to be efficiently cooled such that the energy resolution in energy measurements can be improved.

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