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    • 1. 发明公开
    • Picker and head assembly with the pickers
    • Greifer und Kopfanordnung mit dem Greifer
    • EP1903850A2
    • 2008-03-26
    • EP07116688.8
    • 2007-09-18
    • Mirae Corporation
    • Ahn, Jung-ugKim, Sun-hwalChoi, Wan-heeHur, Jung
    • H05K13/04
    • H05K13/0408
    • Provided is a picker for transferring packaged chips, including a picker base, a base block fixably connected to the picker base, a plurality of nozzle assemblies, provided to the base block, each nozzle assembly being movable up and down, and having a nozzle which a packaged chip is held against or released from by air pressure, an air pressure supplying unit supplying negative or positive pressure by which the packaged chip is held against or released from the nozzle, a plurality of first mechanisms, through each of which the negative or positive pressure is supplied to the nozzle; and a plurality of second mechanisms, each of which moves up and down each of nozzle assemblies.
    • 提供了一种用于传送包装芯片的拾取器,包括拾取器基座,可固定地连接到拾取器基座的基座,设置在基座上的多个喷嘴组件,每个喷嘴组件可上下移动,并且具有喷嘴 一个封装的芯片被保持在空气压力下或从空气压力中释放;一个空气压力供应单元,提供负压或正压,通过该压力供应封装的芯片被保持抵靠或从喷嘴释放;多个第一机构, 向喷嘴供给正压; 以及多个第二机构,每个机构每个喷嘴组件都上下移动。
    • 2. 发明公开
    • IC Sorter
    • IC-Sortierer
    • EP1752778A2
    • 2007-02-14
    • EP06117699.6
    • 2006-07-21
    • Mirae Corporation
    • Kim, Byoung-wooSeo, Yong-jin
    • G01R31/28
    • B07C5/344G01R31/2893
    • Provided are an IC sorter, a method for sorting a burn-in IC, an IC sorted using the method. The IC sorter according to one embodiment of the present invention includes a board table onto which a burn-in board is loaded, a tray loader and a tray unloader which are spaced from the board table in a first axis direction and extended parallel to each other in a second axis direction, a DC test buffer and unloading buffer which are spaced from the board table in a second axis direction with a working area of the board table in between, a sorting unit spaced from the board table, having at least one DC failure tray receiving ICs which fail a DC test and at least one sorting tray, a DC failure/loading head movable at least among a working location of the tray loader, the DC test buffer and a DC failure tray of the sorting unit, a unloading head movable at least among a working location of the tray unloader and the unloading buffer, a sorting head movable at least among the unloading buffer and the sorting tray of the sorting unit; and an insertion/removal head movable at least among the DC test buffer, the working area of the board table, and the unloading buffer.
    • 提供了一种IC分拣机,用于分拣老化IC的方法,使用该方法排序的IC。 根据本发明的一个实施例的IC分拣机包括一个装载有老化板的板台,一个托盘装载器和一个托盘卸载器,它们在第一轴线方向上与板台隔开并且彼此平行延伸 在第二轴方向上,DC测试缓冲器和卸载缓冲器,其在第二轴线方向上与所述板台间隔开,其中所述板台的工作区域在其间,与所述板台间隔开的分拣单元,具有至少一个DC 故障托盘接收不通过直流测试的IC和至少一个分类托盘,至少在托盘加载器的工作位置,DC测试缓冲器和分类单元的DC故障托盘之间移动的DC故障/加载头,卸载 至少在所述托盘卸载机的工作位置和所述卸载缓冲器之间移动的头部,至少在所述分拣单元的卸载缓冲器和分拣托盘之间移动的分拣头; 以及至少在DC测试缓冲器,板表的工作区域和卸载缓冲器之间可移动的插入/移除头。
    • 3. 发明公开
    • Chamber for an IC module handler
    • 室,用于对IC模块的操作装置
    • EP0995998A3
    • 2001-03-07
    • EP99120694.7
    • 1999-10-19
    • Mirae Corporation
    • An, Tae SungPark, Chan HoMoon, Yong SooSeong, Eun HyoungKim, Ku Kyong
    • G01R31/316G01R31/28
    • G01R31/2862
    • The present invention relates to an improved chamber for a module IC handler including a pre-heater for appropriately heating at a set temperature, that is, a generated temperature while a carrier served with a plurality of module ICs is moved, and a test site for enabling an outside tester to test by being pushed the carrier by a pusher. The present invention provides a chamber for a module IC handler including: a receiving piece installed at the lower plate of a chamber and formed with a plurality of receiving grooves at the upper surface thereof for being placed a carrier served with a module IC; an operating piece disposed in a predetermined portion of the receiving piece, disposed at the lowest point thereof in the upper surface of the receiving piece and formed at the upper surface thereof with a receiving groove same interval to the receiving groove of the receiving piece for performing up/down movement and advance/retreat movement; operating piece up/down movement means for going up/down the operating piece to be higher the upper surface thereof than the upper surface of the receiving piece; operating piece advance/retreat movement means for advancing/retreating the operating piece by one pitch same to the interval between the receiving grooves; and feeding means for holding the carrier on the feeding path served with the module IC heated at the test condition and for feeding toward the test site.
    • 4. 发明公开
    • Driving circuit of surface light source and method of driving the same
    • Treiberschaltung einerOberflächenlichtquelleund Verfahren zu deren Ansteuerung
    • EP1926351A1
    • 2008-05-28
    • EP07110163.8
    • 2007-06-13
    • Mirae Corporation
    • Hur, Jeong WookLee, Hwan Woong
    • H05B41/00
    • H05B41/386
    • A driving circuit of a surface light source and a method of driving the same are disclosed, which is suitable for decreasing the luminance-stabilization period of time and improving the low-temperature starting properties by optimizing a starting voltage and current, the driving circuit comprising an inverter controller which feedbacks a current supplied to the surface light source, and compares the feedback current to a preset reference value, to control the current supplied to the surface light source; a temperature sensor which senses an operation temperature of the surface light source; and a driving-condition determining controller which determines operation modes of the surface light source on the basis of the temperature sensed in the temperature sensor, and varies the feedback current inputted to the inverter controller according to the operation modes of the surface light source.
    • 公开了一种面光源的驱动电路及其驱动方法,其适用于通过优化起动电压和电流来降低亮度稳定时间段并提高低温启动特性,所述驱动电路包括 逆变器控制器,其反馈提供给所述表面光源的电流,并将所述反馈电流与预设的参考值进行比较,以控制提供给所述表面光源的电流; 感测表面光源的操作温度的温度传感器; 以及驱动条件确定控制器,其基于在温度传感器中感测的温度来确定面光源的操作模式,并且根据面光源的操作模式改变输入到逆变器控制器的反馈电流。
    • 5. 发明公开
    • Carrier for an integrated circuit module handler
    • Trägeranordnungfüreine HandhabungsvorrichtungfürModule von integrierten Schaltungen
    • EP0997741A2
    • 2000-05-03
    • EP99120888.5
    • 1999-10-28
    • Mirae Corporation
    • Lee, Sang SongLee, Wan GuKim, Jong WonKim, Hee SooOh, Young HakLee, Dong Chun
    • G01R31/316
    • G01R31/2867G01R1/04G01R31/2851G01R31/2893Y10T29/5313Y10T29/53174Y10T29/53178Y10T29/53261Y10T29/53265
    • A chamber for a module IC handler is disclosed which consists of a pre-heater for suitably heating a carrier containing a plurality of module IC at a preset temperature (which may be generated at the driving of the module IC) before the tests for the module IC are performed, and a test site for performing the tests with a external tester while pushing the carrier by using the pusher. The chamber consists of: a seating piece on which plural seating grooves are formed that place the carrier containing the module ICs thereon; a driving piece which is retractable and movable upward/downward, and on which a seating groove having the same spacing as that of the seating groove formed in the seating piece is formed; driving piece ascending/descending means for elevating/lowering the driving piece above a top surface of the seating piece relative to a top surface of the driving piece; driving piece advancing/retracting means for advancing/retracing the driving piece by one pitch corresponding to a spacing between the seating grooves formed in the seating piece; and transferring means for holding and transferring the carrier, which has the module IC heated in accordance with the tests conditions, positioned on a transfer path of the test site toward the test site.
    • 公开了一种用于模块IC处理器的室,其包括预热器,用于在模块的测试之前适当地加热包含多个模块IC的载体,该预定温度在预设温度(可在模块IC的驱动下产生) 执行IC,以及用外部测试器进行测试的测试位置,同时通过使用推动器推动载体。 该室由以下部件组成:座件,其上形成有多个座槽,将包含模块IC的载体放置在其上; 形成有能够向上/向下伸缩并可移动的驱动件,并且其上形成有与形成在所述座件中的所述安置槽相同间隔的安置槽; 驱动件上升/下降装置,用于相对于所述驱动件的顶表面在所述就座件的顶表面上升/降下所述驱动件; 驱动件前进/后退装置,用于使驱动件前进/后退一个间距,对应于形成在座件中的座槽之间的间距; 以及传送装置,用于保持和传送位于测试场所的传送路径上的测试场所的具有根据测试条件加热的模块IC的载体。
    • 8. 发明公开
    • Virtual mounter system
    • VirtuelleBestückvorrichtung
    • EP1848262A1
    • 2007-10-24
    • EP06007962.1
    • 2006-04-18
    • Mirae Corporation
    • Jung, Yun GiKim, Young JooHwang, Heung Seon
    • H05K13/08
    • H05K13/08
    • A virtual mounter system is disclosed. The system can implement a mounter through an animation model or a simulation model before users substantially access a real mounter. The system can allow users to learn a necessary technology related to drive and maintenance of a mounter thorough animation or simulation for the mounter. The system can support driving environment of a real mounter to users as examples of setup and motions are displayed. The system can show contents (an assembly structure of a mounter, functions of each assembly, an operation sequence and an operation method) which is described in a user's manual for a mounter, in real time, through an animation model or a simulation model of the mounter.
    • 公开了一种虚拟贴片机系统。 该系统可以在用户基本访问真正的安装者之前,通过动画模型或模拟模型实现安装者。 该系统可以允许用户学习与安装器的驱动和维护彻底的动画或模拟相关的必要技术。 系统可以为用户提供真正的安装者的驾驶环境,显示设置和动作的示例。 该系统可以通过动画模型或模拟模型来实时显示用于安装者的用户手册中描述的内容(安装器的组装结构,每个组件的功能,操作顺序和操作方法) 安装者
    • 10. 发明公开
    • Pushing block and a handler with the pushing block
    • Schiebeblock und Handhabungsvorrichtung mit dem Schiebeblock
    • EP1903344A1
    • 2008-03-26
    • EP07116691.2
    • 2007-09-18
    • Mirae Corporation
    • Ahn, Jung-ugKim, Sun-hwalChoi, Wan-heeHur, Jung
    • G01R31/28
    • G01R31/2893
    • Provided is a pushing block for use in a handle and a handler equipped with the pushing block. The pushing block includes pushing pins, provided under the test tray, each pushing the latch upwards from under the test tray to enable the latch to release the packaged chip, a first plate on which the pushing pins are provided, and an assembly changing horizontal motion into vertical motion to move the first plate vertically. Positioning of the pushing block under the test tray prevents interference between the pushing block and the picker during loading and unloading and makes it convenient to take corrective action when malfunction of the picker occurs.
    • 提供了一种用于手柄的推动块和装备有推动块的操纵器。 推动块包括设置在测试托盘下方的推动销,每个推动销从测试托盘下方向上推动闩锁,以使闩锁能够释放封装的芯片,其上设置有推动销的第一板,以及改变水平运动的组件 垂直运动以垂直移动第一板。 推动块在测试托盘下的定位可以防止在装载和卸载过程中推动块和拾取器之间的干扰,并且在拾取器发生故障时便于采取纠正措施。