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    • 67. 发明公开
    • Semiconductor memory
    • 半导体内存
    • EP2381450A1
    • 2011-10-26
    • EP11153164.6
    • 2011-02-03
    • Fujitsu Semiconductor Limited
    • Mori, KaoruUchida, Toshiya
    • G11C16/26G11C16/32
    • G11C16/26G11C7/18G11C7/227G11C16/24G11C16/32
    • A semiconductor memory includes a sense amplifier (SA) which operates in response to activation of a sense amplifier enable signal (SAE) and determines logic held in a nonvolatile memory cell (MC) according to a voltage of a bit line (BL), the voltage varying with a cell current flowing through a real cell transistor (MC), a replica cell transistor (RCT) coupled in series between a first node (N01) and a ground line, and a timing generation unit (TGEN). The timing generation unit (TGEN) activates the sense amplifier enable signal (SAE) when the first node (N01) coupled to the ground line via the replica cell transistor (RCT) changes from a high level to a low level. The replica cell transistor (RCT) includes a control gate receiving a constant voltage (VSA) and a floating gate coupled to the control gate. Thus, the activation timing of the sense amplifier (SA) can be optimally set in accordance with the electric characteristic of the memory cell (MC).
    • 半导体存储器包括响应于读出放大器使能信号(SAE)的激活而操作的读出放大器(SA),并且根据位线(BL)的电压确定保持在非易失性存储器单元(MC)中的逻辑, 电压随着流经实际单元晶体管(MC)的单元电流,在第一节点(N01)和地线之间串联耦合的复制单元晶体管(RCT)以及时序发生单元(TGEN)而变化。 当经由复制单元晶体管(RCT)耦合到地线的第一节点(N01)从高电平变为低电平时,定时生成单元(TGEN)激活读出放大器使能信号(SAE)。 复制单元晶体管(RCT)包括接收恒定电压(VSA)的控制栅极和耦合到控制栅极的浮动栅极。 因此,读出放大器(SA)的激活时间可以根据存储单元(MC)的电特性最佳地设定。