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    • 52. 发明公开
    • Prescaler IC testing method and test probe card
    • 预分频器IC测试方法和测试探针卡
    • EP0723164A1
    • 1996-07-24
    • EP95120670.5
    • 1995-12-28
    • NEC CORPORATION
    • Takano, Isamu
    • G01R31/3161G01R23/06G01R29/027G06F11/273
    • G01R31/31905G01R31/2831G01R31/2851
    • A probe card includes an oscillator generating an AC signal, an averaged value detecting circuit receiving a signal outputted from a prescaler IC, for generating an averaged DC signal, and a plurality of switches for changing a flow of a signal among the IC tester, the prescaler IC, the oscillator and the averaged value detecting circuit. The switches is so controlled that the AC signal is supplied to the prescaler IC, and the signal outputted from the prescaler IC is supplied to the averaged value detecting circuit and converted to the averaged DC signal, whereby a non-defective/defective of the AC function of the prescaler IC is discriminated on the basis of the obtained averaged DC signal. The switches are also so controlled that a DC test signal is supplied from the IC tester to the prescaler IC and a DC output signal outputted from the prescaler IC is supplied to the IC tester. Thus, both an AC function test and a DC function test can be carried out on the prescaler IC in the form of a wafer by transferring only DC signals between the IC tester and the probe card.
    • 探针卡包括产生AC信号的振荡器,接收从预定标器IC输出的信号的平均值检测电路,用于产生平均的DC信号,以及用于改变IC测试器之间的信号流的多个开关, 预分频器IC,振荡器和平均值检测电路。 开关被这样控制,使得AC信号被提供给预定标器IC,并且从预定标器IC输出的信号被提供给平均值检测电路并被转换成平均DC信号,由此AC的无缺陷/缺陷 基于所获得的平均DC信号来区分预分频器IC的功能。 开关也是这样控制的,以便从IC测试器向预分频器IC提供DC测试信号,并且从预分频器IC输出的DC输出信号被提供给IC测试器。 因此,通过在IC测试器和探针卡之间仅传送DC信号,可以在晶片形式的预定标器IC上执行AC功能测试和DC功能测试。