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    • 43. 发明公开
    • Positive to negative voltage translator circuit and method of operation
    • Positiv-nach-negativ-Spannungsumsetzerschaltung und Betriebsverfahren。
    • EP0449567A2
    • 1991-10-02
    • EP91302605.0
    • 1991-03-26
    • TEXAS INSTRUMENTS INCORPORATED
    • Ten Eyck, Timothy A.
    • G05F1/46G05F3/30
    • H03K19/00369G05F1/462G05F3/30H03K19/017518
    • There is disclosed a circuit 10 and method for converting on/off logic signals from one medium to on/off signals useful in a different medium. The circuit 10 is particularly adapted to translate from positive voltage levels to negative voltage levels. The circuit 10 includes voltage control levels for precisely controlling voltage as a function of temperature, all whille only using positive voltage levels on the conversion circuit.
      There is also disclosed a circuit 20 and method for providing bias voltage levels which are precisely controlled as a function of temperature. The circuit 20 is arranged to mix a precise bandgap regulated voltage with a temperature compensated circuit to provide the required output. The temperature compensated circuit is in turn arranged to mimic the temperature sensitive components in the output circuit.
    • 公开了一种用于将来自一个介质的逻辑信号转换为在不同介质中有用的开/关信号的电路10和方法。 电路10特别适于从正电压电平转换为负电压电平。 电路10包括用于精确控制作为温度的函数的电压的电压控制电平,所有这些电平仅在转换电路上使用正电压电平。 还公开了一种用于提供作为温度的函数精确控制的偏置电压电平的电路20和方法。 电路20被布置成将精确的带隙调节电压与温度补偿电路混合以提供所需的输出。 温度补偿电路依次布置成模拟输出电路中的温度敏感元件。
    • 48. 发明公开
    • PREVENTING TIMING VIOLATIONS
    • VERHINDERUNG VONZEITÜBERSCHREITUNGEN
    • EP3053269A1
    • 2016-08-10
    • EP14780481.9
    • 2014-10-02
    • Aalto University FoundationTeknologian Tutkimuskeskus VTT
    • MÄKIPÄÄ, JaniKOSKINEN, LauriTURNQUIST, MatthewHIIENKARI, Markus
    • H03K5/19G06F1/04H03K19/003
    • H03K19/00369G06F1/04G06F1/06G06F1/08H03K5/06H03K5/19
    • An apparatus, comprising a clock adapted to provide a clock signal alternating with a cycle between a first level and a second level if a timing violation is not detected; a first latch adapted to be clocked such that it passes a first signal when the clock signal is at the first level; a second combinational logic adapted to output a second signal based on the first signal passed through the first latch; a second latch adapted to be clocked such that it passes the second signal when the clock signal is at the second level; a detecting means adapted to detect the timing violation of at least one of the first signal and of the second signal; a time stretching means adapted to stretch, if the timing violation is detected, the clock such that the clock alternates between the first level and the second level with a delay.
    • 一种装置,包括适于在未检测到定时违反时提供与第一电平和第二电平之间的周期交替的时钟信号的时钟; 适于被计时的第一锁存器,使得当所述时钟信号处于所述第一电平时,所述第一锁存器通过第一信号; 第二组合逻辑,适于基于通过所述第一锁存器的所述第一信号输出第二信号; 适于被计时的第二锁存器,使得当所述时钟信号处于所述第二电平时,所述第二锁存器通过所述第二信号; 检测装置,其适于检测所述第一信号和所述第二信号中的至少一个的定时违反; 时间延伸装置,适于在检测到定时违反的情况下拉伸时钟,使得时钟以延迟在第一电平和第二电平之间交替。
    • 49. 发明公开
    • Fault detection assembly
    • Fehlererkennungsanordnung
    • EP2919262A1
    • 2015-09-16
    • EP14159970.4
    • 2014-03-14
    • EM Microelectronic-Marin SA
    • Plavec, LubomirLukes, Zdenek
    • H01L21/66H03K19/003
    • G01R31/2621H01L22/34H01L27/0266H03K19/00315H03K19/00369
    • The present invention relates to a fault detection assembly of an integrated circuit (10) having a supply port (12), an input port (14) and a ground port (16). The fault detection assembly comprises a first diode (20) connected with one end to the supply port (12) and connected with the other end to the input port (14), a second diode (24) connected with one end to the input port (14) and connected with the other end to the ground port (16), at least a first fault detection transistor (30, 32) of MOS type. At least one of first and second diodes (20, 24) comprises a first diode-connected MOS transistor (22, 26) whose gate is connected to the gate of the first fault detection transistor (30, 32).
    • 本发明涉及具有供应端口(12),输入端口(14)和接地端口(16)的集成电路(10)的故障检测组件。 所述故障检测组件包括:第一二极管(20),其一端连接到所述供应端口(12)并与另一端连接到所述输入端口;第二二极管(24),其一端连接到所述输入端口 (14)并且与另一端连接到接地端口(16),至少是MOS型的第一故障检测晶体管(30,32)。 第一和第二二极管(20,24)中的至少一个包括其栅极连接到第一故障检测晶体管(30,32)的栅极的第一二极管连接的MOS晶体管(22,26)。