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    • 37. 发明授权
    • Self-referenced MRAM cell and magnetic field sensor comprising the self-referenced MRAM cell
    • 自参考MRAM单元和包括自参考MRAM单元的磁场传感器
    • EP3002758B1
    • 2017-06-21
    • EP14290298.0
    • 2014-10-03
    • Crocus Technology S.A.
    • Stainer, Quentin
    • G11C11/16G01R33/09
    • G11C11/1675G01R33/098G11C11/161G11C11/1673
    • The present disclosure concerns a self-referenced MRAM cell (1) comprising a reference layer (23) having a fixed reference magnetization (230), a sense layer (21) having a free sense magnetization (210), a tunnel barrier (22), a biasing layer (25) having bias magnetization (250) and a biasing antiferromagnetic layer (27) pinning the bias magnetization (250) in a bias direction when MRAM cell (1) is at temperature equal or below a bias threshold temperature (T B ); the bias magnetization (250) being arranged for inducing a bias field (251) adapted for biasing the sense magnetization (210) in a direction opposed to the bias direction, such that the biased sense magnetization .(210) varies linearly in the presence of the external magnetic field, when the external magnetic field is oriented in a direction substantially perpendicular to the one of the reference magnetization (230). The present disclosure further concerns a magnetic field sensor (100) comprising a plurality of the self-referenced MRAM cell (1) and a a method for programming the magnetic field sensor.
    • 本公开涉及包括具有固定参考磁化(230)的参考层(23),具有自由感应磁化强度(210)的感测层(21),隧道势垒(22)的自参考MRAM单元(1) ,当MRAM单元(1)处于等于或低于偏置阈值温度(TB)的温度时,具有偏置磁化(250)的偏置层(25)和偏置方向上的偏置反铁磁层(27) ); 所述偏置磁化(250)被布置用于引起适于在与所述偏置方向相反的方向上偏置所述感测磁化(210)的偏置场(251),使得所述偏置的感测磁化(210) 当外部磁场在基本上垂直于参考磁化(230)中的一个的方向上取向时,该外部磁场被施加到外部磁场。 本公开还涉及包括多个自参考MRAM单元(1)的磁场传感器(100)以及用于编程磁场传感器的方法。
    • 39. 发明公开
    • METHOD FOR CONTROLLING MAGNETIC DOMAIN WALL OF MAGNETIC STRUCTURE AND MAGNETIC MEMORY DEVICE USING SAME
    • 用于控制磁结构和磁存储设备THEREFOR的磁畴壁
    • EP3171364A1
    • 2017-05-24
    • EP15822296.8
    • 2015-01-16
    • Korea Research Institute Of Standards And Science
    • MOON, KyoungwoongHWANG, Chanyong
    • G11B5/02H01L27/105G11C11/15
    • G11C19/0808G11B5/02G11C11/161G11C11/1675G11C19/0816G11C19/085H01L27/105
    • The present invention provides a method for controlling a magnetic domain wall of a magnetic structure and a magnetic memory device using same. The method includes: a first step of applying a first magnetic field in a first direction to a magnetic structure having a plurality of magnetic domains and a magnetic domain wall between the magnetic domains, and applying a second magnetic field in a second direction to the magnetic structure, the first direction being parallel to the magnetization direction of the magnetic domain wall and the second direction being parallel to the magnetization direction of the magnetic domain wall; and a second step of applying a third magnetic field in a direction opposite to the first direction to the magnetic structure and applying a fourth magnetic field in a direction opposite to the second direction to the magnetic structure, wherein the magnetic domain wall can be moved uniformly in a direction parallel to the magnetization direction of the magnetic domain wall or the magnetization direction of the magnetic domains.
    • 本发明提供了一种用于控制磁结构的磁畴壁,并使用相同的磁存储器件的方法。 该方法包括:对磁结构的磁施加第一磁场在第一方向上具有磁畴的磁畴之间的多个和磁畴壁,且施加第二磁场的第二方向的第一步骤 结构中,第一方向平行于磁畴壁的磁化方向与所述第二方向平行于所述磁畴壁的磁化方向; 并且在相反的方向上与所述第一方向施加第三磁场到磁结构和在一个方向相反的第二方向上的磁结构施加第四磁场,worin磁畴壁的第二步骤可以均匀地移动 在一个方向上平行于磁畴壁的磁化方向或磁畴的磁化方向。