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    • 20. 发明公开
    • Particle analyzing apparatus and particle imaging method
    • Partikelanalysevorrichtung und Partikelabbildungsverfahren
    • EP2327977A2
    • 2011-06-01
    • EP10193092.3
    • 2010-11-30
    • Sysmex Corporation
    • Ozasa, MasatsuguKobayashi, Hiroyuki
    • G01N15/14G01N21/64
    • G01N15/1475G01N1/31G01N15/147G01N2015/0092G01N2015/1438
    • A particle Analyzing apparatus, comprising: a flow cell which forms a specimen flow including particles; first and second light sources; an irradiation optical system which applies lights emitted from the first and second light sources so that the lights are applied to the specimen flow; a detector which detects forward scattered light, the forward scattered light being emitted from the first light and scattered by the particle in the specimen flow, and generates a signal according to the detected scattered light; a light blocking member disposed between the flow cell and the detector; a controller which obtains characteristic parameters of the particle based on the signal from the detector; and an imaging device which captures an image of the particle in the specimen flow using the light from the second light source is disclosed. Particle imaging method is also disclosed.
    • 一种颗粒分析装置,包括:形成包含颗粒的样品流的流动池; 第一和第二光源; 照射光学系统,其施加从第一和第二光源发射的光,使得光被施加到样本流; 检测器,其检测前向散射光,前向散射光从第一光发射并由样品流中的粒子散射,并根据检测到的散射光产生信号; 设置在所述流动池和所述检测器之间的遮光构件; 控制器,其基于来自检测器的信号获得粒子的特征参数; 并且公开了使用来自第二光源的光来捕获样品流中的颗粒的图像的成像装置。 还公开了粒子成像方法。