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91. 发明公开

EP1711847A2 AN X-RAY DIFFRACTION (XRD) MEANS FOR IDENTIFYING THE CONTENT IN A VOLUME OF INTEREST AND A METHOD THEREOF 审中-公开
标题翻译： X射线衍射（XRD）装置用于识别所述内容的兴趣体积及其方法
公开(公告)号：EP1711847A2
公开(公告)日：2006-10-18
申请号：EP05703080.1
申请日：2005-01-11
申请人： Homeland Secur-E.T.
发明人： HAREL, Ze'ev , ZUK, Asaf , BURSHTEIN, Zeev
IPC分类号： G01T1/36 , G01T7/12 , G01N23/20
CPC分类号： G01N23/207
摘要： The present invention discloses an XRD means for identifying the content of a volume of interest (VOI) and a method thereof. A remote XRD means is comprised of a plurality of X-ray sources (41A-41C) targeted towards said VOI (44) ; a plurality of X-ray detectors (46) adapted to receive diffracted X-rays (47A-47C) ; a processor adapted to measure said patterns; a database comprising records of pattern parameters; and an alerting means adapted for identifying a material in the VOI as one of a predetermined group. This invention also discloses a method of acquiring XRD images of a material in a VOI (44), comprised of receiving VOI coordinates; irradiating the material in the VOI; acquiring, extracting and converting of XRD patterns (47A-47C) of said VOI to standard powder X-ray diffraction spectrum; matching records in a database for material identification; and alerting when said material is in matches a predetermined record.

92. 发明公开

EP1681561A1 Positioning Apparatus 审中-公开
标题翻译：定位仪器
公开(公告)号：EP1681561A1
公开(公告)日：2006-07-19
申请号：EP05270089.5
申请日：2005-12-08
申请人： Bede Scientific Instruments Limited
发明人： Bowen, David Keith , Feichtinger, Petra , Wormington, Matthew , Spence, John , Matney, Kevin
IPC分类号： G01N23/207
CPC分类号： G01N23/207
摘要： An X-ray source (24), a detector (26) and a specimen (20) are mutually positioned by an apparatus which includes two spaced, parallel linear actuators (32,36) each movable along a gantry (34). The source (24) and detector (26) can be moved vertically by the actuators (32,36) and rotationally by rotary actuators (28,30). Equivalent arrangements are also described.
摘要翻译： X射线源（24），检测器（26）和试样（20）通过包括两个间隔的平行线性致动器（32,36）的装置相互定位，所述线性致动器均可沿机架（34）移动。源（24）和检测器（26）可以通过致动器（32,36）垂直移动并且通过旋转致动器（28,30）旋转移动。也描述了等效的安排。

93. 发明公开

EP1672361A1 X-RAY DIFFRACTION MICROSCOPE AND X-RAY DIFFRACTION MEASUREMENT METHOD USING X-RAY DIFFRACTION MICROSCOPE 有权
标题翻译：自行车
公开(公告)号：EP1672361A1
公开(公告)日：2006-06-21
申请号：EP04773156.7
申请日：2004-09-09
申请人： National Institute for Materials Science
发明人： SAKURAI, Kenji , MIZUSAWA, Tazuko
IPC分类号： G01N23/207 , G21K7/00
CPC分类号： G01N23/207 , G01N23/20 , G21K7/00
摘要： An X-ray diffraction microscope apparatus (1) has an X-ray generating apparatus (2), a sample stage (3), a collimator (4) serving to suppress angle divergence, a two-dimensional X-ray detector (5) having an energy resolving power, an image processing apparatus, and an image recording and displaying apparatus (6). An angle divergence of diffracted X-rays is suppressed by moving a sample (7) and the two-dimensional X-ray detector (5) as close as possible via the collimator (4). The diffracted X-rays are measured and imaged in a state in which the two-dimensional X-ray detector (5) and the sample stage (3) are at a standstill without being moved. Accordingly, it is possible to provide an X-ray diffraction microscope apparatus which can acquire an image in an extremely short time, and can image a difference of an inhomogeneous sample, a material in which different crystal structures exist in one sample or a sample in which textures having different directions are contained and an X-ray diffraction measuring method using the X-ray diffraction microscope apparatus.
摘要翻译： X射线衍射显微镜装置（1）具有X射线产生装置（2），样品台（3），用于抑制角度发散的准直器（4），二维X射线检测器（5）具有能量分辨能力，图像处理装置和图像记录和显示装置（6）。通过准直器（4）将样品（7）和二维X射线检测器（5）尽可能靠近移动来抑制衍射X射线的角度发散。在二维X射线检测器（5）和样品台（3）处于静止状态而不被移动的状态下，测量并成像衍射的X射线。因此，可以提供能够在极短时间内获取图像的X射线衍射显微镜装置，并且可以对不均匀样品，在一个样品或样品中存在不同晶体结构的材料进行成像包含具有不同方向的纹理和使用X射线衍射显微镜装置的X射线衍射测量方法。

94. 发明公开

EP1598663A2 Vorrichtung und Verfahren zur Röntgenanalyse mit zweidimensionalem Array-Detektor 有权
标题翻译： Vorrichtung und Verfahren zurRöntgenanalysemit zweidimensionalem Array-Detektor
公开(公告)号：EP1598663A2
公开(公告)日：2005-11-23
申请号：EP05009958.9
申请日：2005-05-06
申请人： Bruker AXS GmbH
发明人： Gerndt, Ekkehard, Dr. , Jacob, Michael
IPC分类号： G01N23/207
CPC分类号： G01N23/207
摘要： Ein Verfahren zum Betrieb eines Röntgenanalysegerätes mit einer Quelle (17) für Röntgenstrahlung, einem zu untersuchenden Objekt (19), das mit der Röntgenstrahlung beleuchtet wird, und einem flächigen zweidimensionalen Array-Detektor mit Pixel-Elementen (7) zum ortsaufgelösten Nachweis der von dem Objekt (19) ausgehenden Röntgenstrahlung, wodurch ein Datensatz, insbesondere in Form eines digitalisierten Diffraktogramms und/oder Spektrums erhalten wird, ist durch folgende Schritte gekennzeichnet:

(a) Aufnahme eines ersten Datensatzes (11) in einer ersten relativen räumlichen Position (P1) von Quelle (17), Objekt (19) und Detektor;
(b) Verschieben und/oder Drehen des Detektors in der Detektorfläche relativ zu Quelle (17) und Objekt (19), wobei die relative Position von Quelle (17) und Objekt (19) nicht verändert wird;
(c) Aufnahme eines zweiten Datensatzes (11) in der nach Schritt (b) verschobenen Position (P2);
(d) Überlagern der aufgenommenen Datensätze (11) zu einem Gesamtdatensatz (13), wobei die Pixel der aufgenommenen Datensätze entsprechend ihrer tatsächlichen relativen Position zu Quelle (17) und Objekt (19) kombiniert werden.

Das erfindungsgemäßen Verfahren beziehungsweise das erfindungsgemäße Röntgenanalysegerät mit Mitteln zum Durchführen dieses Verfahrens ermöglicht auf einfache Weise eine Verringerung der aufgrund von schadhaften oder mit 0 gewichteten Pixel-Elementen entstehenden toten Pixel im Datensatz. Ebenso können bei der Verwendung von aus mehreren Sensorchips zusammengesetzten Einzeletektoren störende Einflüsse der Randbereiche bei der Erstellung von Datensätzen vermieden werden. Darüber hinaus ergibt sich ein vergrößerter Aufnahmebereich und bei geeigneter Wahl der Verschiebung der Sensorchips eine verbesserte Ortsauflösung der Messung.
摘要翻译：用于使用具有X射线源（17）和具有像素元件（7）的平坦二维阵列检测器来操作X射线分析机的过程包括获得第一数据集，其中被检查物体在相对于物体和检测器。然后检测器相对于源移动，并且获得第二数据集。然后使用两个数据集来获得公共数据集并且组合像素。

95. 发明公开

EP1509762A1 ANALYSIS OF POWDER DIFFRACTION CRYSTALLOGRAPHY DATA 审中-公开
标题翻译：分析KRISTALLOGRAPHISCHER PULVERDIFFRAKTIONSDATEN
公开(公告)号：EP1509762A1
公开(公告)日：2005-03-02
申请号：EP03731359.0
申请日：2003-05-22
申请人： Accelrys Software Inc.
发明人： NEUMANN, Marcus, A.
IPC分类号： G01N23/207
CPC分类号： G01N23/207
摘要： A method and system for indexing powder diffraction data (200) are disclosed comprising choosing a maximum impurity peak tolerance level (204) for a crystallography data search, choosing a range of number of calculated peaks for possible indexing solutions having a minimum number of peaks and a maximum number of peaks (206, 208), selecting a crystal system to search (210), selecting powder extinction classes (214) to search for indexing solutions, performing an exhaustive unit cell search of each of the selected powder extinction classes (214) using a successive dichotomy approach (218) to determine a set of indexing results, and ranking the obtained solutions according to likelihood.

96. 发明公开

EP1365230A3 Method for estimating preferred orientation of polycrystalline material 审中-公开
标题翻译：材料polykrystallinem的优选取向的评估方法
公开(公告)号：EP1365230A3
公开(公告)日：2004-12-01
申请号：EP03011139.7
申请日：2003-05-23
申请人： Rigaku Corporation
发明人： Toraya, Hideo , Omote, Kazuhiko
IPC分类号： G01N23/20 , G01N23/207
CPC分类号： G01N23/207
摘要： The method estimates quantitatively the preferred orientation of a polycrystalline material using one diffraction peak. An orientation density distribution function ρ is assumed to be axisymmetric around on the normal direction of the surface of a sample (12) made of a polycrystalline material. The function ρ may be a Gaussian function or a March-Dollase function. An X-ray (10) is incident upon the surface of the sample (12) at an incident angle α and the intensity of a diffraction X-ray (14) is measured. The change of the intensity of the diffraction X-ray (14) is measured with the incident angle α being changed to attain a measurement rocking curve. On the other hand, a theoretical diffraction X-ray intensity is calculated based on the orientation density distribution function ρ. Then the characteristic parameter (H) of the function ρ is determined so that the theoretical rocking curve approaches the measurement rocking curve as closely as possible, whereby the orientation density distribution function ρ can be determined. The degree of preferred orientation can be quantitatively estimated.

97. 发明公开

EP1470413A1 DIFFRACTOMETER AND METHOD FOR DIFFRACTION ANALYSIS 有权
标题翻译：衍射和方法衍射
公开(公告)号：EP1470413A1
公开(公告)日：2004-10-27
申请号：EP03702480.9
申请日：2003-01-21
申请人： XRD-Tools S.R.L.
发明人： BERTI, GIOVANNI
IPC分类号： G01N23/20 , G01N23/207
CPC分类号： G01N23/207 , G01N23/20
摘要： Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a collimation axis, and a radiation beam detector, having a reception axis, said collimation and reception axis, conveying in a centre of the diffractometer which is fixed with respect to the primary Euler cradle. The source and detector are adapted to move along the primary Euler cradle. The secondary Euler cradle supports the primary Euler cradle and is arranged to rotate the latter.

98. 发明授权

EP0955539B1 Kompaktes Röntgenspektrometer 有权
标题翻译：紧凑型X射线光谱仪
公开(公告)号：EP0955539B1
公开(公告)日：2004-06-30
申请号：EP99107212.5
申请日：1999-04-14
申请人： Bruker AXS GmbH
发明人： Golenhofen, Rainer
IPC分类号： G01N23/207 , G01N23/223
CPC分类号： G01N23/223 , G01N23/207 , G01N2223/076

99. 发明公开

EP1073092A3 Analyser system having sample exchanger 审中-公开
标题翻译：分析仪自动进样器
公开(公告)号：EP1073092A3
公开(公告)日：2004-04-07
申请号：EP00114140.7
申请日：2000-07-11
申请人： Rigaku Industrial Corporation
发明人： Sumii, Koushi , Kasai, Kiyotaka
IPC分类号： G01N35/00
CPC分类号： G01N23/207
摘要： In an analyzer system having a sample exchanger, being easy in handling of samples, comprising an analyzer apparatus (51) for analyzing a sample (S); a sample table (2) for holding a plurality of the samples thereon; and a transfer means (3) for taking out the sample (S) from the sample table (2) into the analyzer apparatus (51), wherein the sample table (2) comprises: a base (21), and a tray (24) for holding the sampels thereon, being supported so that it can be pulled out in a front direction (F) of the base (21). With this, it is possible for an operator to handle the sample (S) easily, in particular the samples (S) which are located in deep on the sample table (2) so that there is difficulty to handle them, by pulling out the tray (24) in the front direction (F) from the base (21), without necessity of standing up, for example, while sitting on a chair. Also, it is possible to separate the tray (24) from the base (21) so as to carry it in a front of a computer (53) as the controller of the analyzer apparatus (51), thereby enabling to input ID data relating to the samples (S) while mounting or installing the samples (S) onto the tray (24), so as to prevent from erroneous inputting thereof.

100. 发明公开

EP1394533A2 Stress measurement method using x-ray diffraction analysis 有权
$Stress measurement method using x-ray diffraction analysis$
标题翻译： Verfahren zur Messung机械师Spannungen手套Röntgenbeugungsanalyse
公开(公告)号：EP1394533A2
公开(公告)日：2004-03-03
申请号：EP03019383.3
申请日：2003-08-27
申请人： Rigaku Corporation
发明人： Yokoyama, Ryouichi , Endo, Kamihisa
IPC分类号： G01N23/20 , G01L1/25 , G01B15/06
CPC分类号： G01N23/207 , H01L21/31691
摘要： A stress of a c-axis-oriented specimen (10) of a tetragonal polycrystal is measured using X-ray diffraction under the assumption of a plane stress state. An X-ray optical system is set in the location of φ = 0°, 45° or 90°. An X-ray (16) diffracted at a crystal plane (the direction of the normal thereto is the direction of an angle of ψ) with the Miller indices (hk1) is detected. A diffraction angle θ in a strain state is measured in the vicinity of a Bragg's angle θ 0 in a non-strain state. Strains s with respect to a plurality of ψ are calculated from the difference between the measurement values θ and the Bragg's angle θ 0 . Specific stress calculation formulae are determined with respect to the tetragonal system having the Laue symmetry 4/mmm. The stress is calculated from the slope of the linear line of plotted measurement results.
摘要翻译：在假设平面应力状态下，使用X射线衍射测量四方晶体的c轴取向试样（10）的应力。 X射线光学系统设置在phi = 0°，45°或90°的位置。检测在米勒指数（hk1）处在晶面（法线方向为角度方向）的衍射的X射线（16）。衍射角＆thetas; 在非应变状态下在布拉格角度θ附近测量应变状态。相对于多个psi的菌株根据测量值和差异之间的差计算; 和布拉格的角度和角度; 0。相对于具有Laue对称性4 / mmm的四方系统确定比应力计算公式。应力由绘制的测量结果的线性斜率计算。

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