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    • 2. 发明申请
    • Thin film magnetic memory device provided with program element
    • 提供程序元件的薄膜磁存储器件
    • US20040184315A1
    • 2004-09-23
    • US10623565
    • 2003-07-22
    • RENESAS TECHNOLOGY CORP.
    • Hideto Hidaka
    • G11C011/14
    • G11C11/16G11C11/15G11C29/44G11C29/785
    • A program element has a magnetic layer electrically connected between first and second nodes. At least a portion of the magnetic layer forms a link portion designed to be blown with external laser irradiation. The magnetic layer is provided in the same layer as and with the same structure as a tunneling magneto-resistance element in an MTJ memory cell. An electrical contact between the magnetic layer and respective one of the first and second nodes has the same structure as the electrical contact between the tunneling magneto-resistance element and an interconnection provided in the same metal interconnection layer as respective one of the first and second nodes in the MTJ memory cell.
    • 程序元件具有电连接在第一和第二节点之间的磁性层。 磁性层的至少一部分形成设计成被外部激光照射吹制的连接部分。 磁性层设置在与MTJ存储单元中的隧道磁阻元件相同的层中,具有相同的结构。 磁性层与第一和第二节点中的相应一个之间的电接触具有与隧道磁阻元件与设置在与第一和第二节点中的相应金属互连层相同的金属互连层中的互连之间的电接触相同的结构 在MTJ存储单元中。
    • 5. 发明申请
    • Magnetic random access memory and data read method thereof
    • 磁性随机存取存储器及其数据读取方法
    • US20040125648A1
    • 2004-07-01
    • US10431369
    • 2003-05-08
    • Yoshihisa Iwata
    • G11C011/14G11C008/00
    • G11C11/15
    • A magnetic random access memory having a memory cell array in which one block is formed from a plurality of magnetoresistive elements using a magnetoresistive effect, and a plurality of blocks are arranged in row and column directions, includes a plurality of first magnetoresistive elements arranged in a first block, a plurality of first word lines each of which is independently connected to one terminal of a corresponding one of the first magnetoresistive elements and runs in the row direction, a first read sub bit line commonly connected to the other terminal of each of the first magnetoresistive elements, a first block select switch whose first current path has one end connected to one end of the first read sub bit line, and a first read main bit line which is connected to the other end of the first current path and runs in the column direction.
    • 一种具有存储单元阵列的磁性随机存取存储器,其中使用磁阻效应从多个磁阻元件形成一个块,并且多个块被排列成行和列方向,包括多个第一磁阻元件,其布置在 第一块,多个第一字线,每个第一字线独立地连接到相应的一个第一磁阻元件的一个端子并在行方向上延伸;第一读取子位线,共同连接到每个的另一个端子 第一磁阻元件,第一块选择开关,其第一电流路径的一端连接到第一读取子位线的一端,第一读取主位线连接到第一电流路径的另一端并在其中运行 列方向。
    • 7. 发明申请
    • Highly nonlinear magnetic tunnel junctions for dense magnetic random access memories
    • 用于密集磁随机存取存储器的高度非线性磁隧道结
    • US20040109347A1
    • 2004-06-10
    • US10316141
    • 2002-12-10
    • International Business Machines Corporation
    • John Kenneth DeBrosseYu LuStuart Stephen Papworth Parkin
    • G11C011/14H01L021/00
    • H01L27/222G11C11/16
    • MRAMs are provided with cells offering low current leakage for partially selected cells. MRAM cells are made with magnetic tunnel junctions having barriers that meet predetermined low barrier heights and predetermined thicknesses. The barrier heights are preferably about 1.5 eV or less. The predetermined thicknesses are calculated to meet power and speed requirements. The predetermined low barrier heights and predetermined thicknesses modify a nonlinear term relating current through to voltage across the magnetic tunnel junction. The modification of the nonlinear term also modifies the amount of current that flows through a magnetic tunnel junction at various voltages. At low voltages, current through the magnetic tunnel junction will be disproportionately lower than current through a conventional magnetic tunnel junction. This decreases leakage current through partially selected MRAM cells and power. At higher voltages, current through the magnetic tunnel junction is adequate for a wide variety of power and speed applications.
    • MRAM提供有对部分选择的单元提供低电流泄漏的单元。 MRAM单元由具有满足预定的低屏障高度和预定厚度的屏障的磁性隧道结制成。 阻挡高度优选为约1.5eV以下。 计算预定厚度以满足功率和速度要求。 预定的低阻挡高度和预定厚度修改了跨越磁性隧道结的电流跨越电压的非线性项。 非线性项的修改还修改了在各种电压下流过磁性隧道结的电流量。 在低电压下,通过磁性隧道结的电流将比通过常规磁性隧道结的电流不成比例地低。 这通过部分选择的MRAM单元和功率降低漏电流。 在较高的电压下,通过磁性隧道结的电流适用于各种功率和速度应用。