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    • 3. 发明授权
    • Back-illuminated type imaging device and fabrication method thereof
    • 背照式成像装置及其制造方法
    • US08216873B2
    • 2012-07-10
    • US13100475
    • 2011-05-04
    • Shinji Uya
    • Shinji Uya
    • H01L21/28
    • H01L27/14603H01L27/14636H01L27/1464
    • Light is illuminated from a back-surface side of a silicon substrate 4. A back-illuminated type imaging device 100 reads out, from a front-surface side of the silicon substrate 4, charges that are generated in the silicon substrate 4 in response to the illuminated light, so as to perform imaging. The back-illuminated type imaging device 100 includes pad portions 17 formed on the back surface of the semiconductor substrate 4, and a plurality of pillars 9 that are formed in the semiconductor substrate 4, are made of a conductive material and electrically connect wiring portions 12 formed on the front surface of the semiconductor substrate 4 and the pad portions 17 to each other.
    • 从硅衬底4的背表面照射光。背照式成像装置100从硅衬底4的表面侧读出响应于硅衬底4中产生的电荷 照明的光,以便进行成像。 背照式成像装置100包括形成在半导体基板4的背面上的焊盘部17和形成在半导体基板4中的多个支柱9,由导电材料制成,并将布线部12电连接 形成在半导体基板4的前表面和焊盘部17上。
    • 5. 发明授权
    • Manufacturing method of solid-state imaging device and solid-state imaging device
    • 固态成像装置和固态成像装置的制造方法
    • US07736937B2
    • 2010-06-15
    • US11504648
    • 2006-08-16
    • Yuko NomuraShinji Uya
    • Yuko NomuraShinji Uya
    • H01L21/00
    • H01L27/14887H01L27/14689
    • A manufacturing method of a solid-state imaging device, the device comprising: a semiconductor substrate; photodiodes each comprising a surface-side first conductivity type region formed adjacent to a surface of the semiconductor substrate and a second conductivity type region provided directly under the surface-side first conductivity type region; a second conductivity type vertical transfer region provided in the vicinity of the surface-side first conductivity type region; at least one first conductivity type inter-pixel isolation region provided under the vertical transfer region; and at least one first conductivity type overflow barrier region provided below the first conductivity type inter-pixel isolation region, the method comprising: a first step of forming the first conductivity type overflow barrier region in a semiconductor substrate; and a second step of ion-implanting first conductivity type impurity ions from a direction in which channeling tends to occur, to form at least one of the first conductivity type inter-pixel isolation region.
    • 一种固态成像装置的制造方法,所述装置包括:半导体衬底; 每个光电二极管包括与半导体衬底的表面相邻形成的表面侧第一导电类型区域和直接位于表面侧第一导电类型区域下方的第二导电类型区域; 设置在表面侧第一导电类型区域附近的第二导电型垂直传输区域; 设置在垂直传送区域下方的至少一个第一导电类型的像素间隔离区域; 以及设置在所述第一导电型像素间隔离区域的下方的至少一个第一导电型溢出阻挡区域,所述方法包括:在半导体衬底中形成所述第一导电型溢出阻挡区域的第一步骤; 以及从倾向于发生沟道的方向离子注入第一导电型杂质离子的第二步骤,以形成第一导电类型像素间隔离区域中的至少一个。
    • 10. 发明授权
    • Backside-illuminated imaging device and manufacturing method of the same
    • 背面照明成像装置及其制造方法
    • US08158452B2
    • 2012-04-17
    • US13007482
    • 2011-01-14
    • Shinji Uya
    • Shinji Uya
    • H01L21/00
    • H01L27/14643H01L27/14618H01L27/1464H01L2924/0002H01L2924/00
    • A backside-illuminated imaging device, which performs imaging by illuminating light from a back side of a semiconductor substrate to generate electric charges in the semiconductor substrate based on the light and reading out the electric charges from a front side of the semiconductor substrate, is provided and includes: a back-side layer including an back-side element on the back side of the semiconductor substrate; a front-side layer including an front-side element on the front side of the semiconductor substrate; a support substrate above the front-side layer; a spacer, one end of which comes in contact with the front-side layer and the other end of which comes in contact with the support substrate, to form a space having a uniform distance between the semiconductor substrate and the support substrate; and an adhesive filled in at least a part of the space between the surface-side element formation layer and the support substrate.
    • 背面照明成像装置,其通过照射来自半导体基板的背面的光进行成像,从而基于所述光在半导体基板中产生电荷并从半导体基板的前侧读出电荷。 并且包括:在所述半导体衬底的背侧上包括背面元件的背面层; 包括在所述半导体衬底的前侧上的前侧元件的前侧层; 在前侧层上方的支撑基板; 间隔件,其一端与前侧层接触,另一端与支撑基板接触,形成半导体基板与支撑基板之间具有均匀距离的空间; 以及填充在表面侧元件形成层和支撑基板之间的空间的至少一部分的粘合剂。