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1. 发明授权

US07425702B2 Charged particle beam apparatus 有权
公开(公告)号：US07425702B2
公开(公告)日：2008-09-16
申请号：US10838342
申请日：2004-05-05
申请人： Yuko Sasaki , Mitsugu Sato
发明人： Yuko Sasaki , Mitsugu Sato
IPC分类号： H01J37/244
CPC分类号： H01J37/265 , G01N23/2251 , H01J2237/043 , H01J2237/049 , H01J2237/28
摘要： When conditions for an electron gun mainly represented by extraction voltage V1 and accelerating voltage V0 are changed, a charged particle beam is once focused on a fixed position by means of a condenser lens and a virtual cathode position is calculated from a lens excitation of the condenser lens at that time and the mechanical positional relation of the electron gun to set an optical condition. For more accurate setting of the optical condition, a deflecting electrode device is provided at a crossover position of the condenser lens and a voltage is applied to the deflecting electrode device at a constant period so as to control the lens excitation of the condenser lens such that the amount of movement of an image is minimized on an image display unit such as CRT.

2. 发明申请

US20080272300A1 Charged particle beam apparatus 有权
标题翻译：带电粒子束装置
公开(公告)号：US20080272300A1
公开(公告)日：2008-11-06
申请号：US12155347
申请日：2008-06-03
申请人： Yuko Sasaki , Mitsugu Sato
发明人： Yuko Sasaki , Mitsugu Sato
IPC分类号： G01N23/00
CPC分类号： H01J37/265 , G01N23/2251 , H01J2237/043 , H01J2237/049 , H01J2237/28
摘要： When conditions for an electron gun mainly represented by extraction voltage V1 and accelerating voltage V0 are changed, a charged particle beam is once focused on a fixed position by means of a condenser lens and a virtual cathode position is calculated from a lens excitation of the condenser lens at that time and the mechanical positional relation of the electron gun to set an optical condition. For more accurate setting of the optical condition, a deflecting electrode device is provided at a crossover position of the condenser lens and a voltage is applied to the deflecting electrode device at a constant period so as to control the lens excitation of the condenser lens such that the amount of movement of an image is minimized on an image display unit such as CRT.
摘要翻译：当主要由提取电压V 1和加速电压V 0表示的电子枪的条件改变时，通过聚光透镜将带电粒子束一次聚焦在固定位置，并且从透镜激发计算虚拟阴极位置此时的聚光透镜和电子枪的机械位置关系来设定光学条件。为了更精确地设置光学条件，在聚光透镜的交叉位置处设置偏转电极装置，并且将电压以恒定周期施加到偏转电极装置，以便控制聚光透镜的透镜激发，使得在诸如CRT的图像显示单元上图像的移动量最小化。

3. 发明授权

US07714289B2 Charged particle beam apparatus 有权
标题翻译：带电粒子束装置
公开(公告)号：US07714289B2
公开(公告)日：2010-05-11
申请号：US12155347
申请日：2008-06-03
申请人： Yuko Sasaki , Mitsugu Sato
发明人： Yuko Sasaki , Mitsugu Sato
IPC分类号： G01N23/00
CPC分类号： H01J37/265 , G01N23/2251 , H01J2237/043 , H01J2237/049 , H01J2237/28
摘要： When conditions for an electron gun mainly represented by extraction voltage V1 and accelerating voltage V0 are changed, a charged particle beam is once focused on a fixed position by means of a condenser lens and a virtual cathode position is calculated from a lens excitation of the condenser lens at that time and the mechanical positional relation of the electron gun to set an optical condition. For more accurate setting of the optical condition, a deflecting electrode device is provided at a crossover position of the condenser lens and a voltage is applied to the deflecting electrode device at a constant period so as to control the lens excitation of the condenser lens such that the amount of movement of an image is minimized on an image display unit such as CRT.
摘要翻译：当主要由提取电压V1和加速电压V0表示的电子枪的条件改变时，通过聚光透镜将带电粒子束一次聚焦在固定位置，并且从冷凝器的透镜激发计算虚拟阴极位置透镜和电子枪的机械位置关系来设定光学条件。为了更精确地设置光学条件，在聚光透镜的交叉位置处设置偏转电极装置，并且将电压以恒定周期施加到偏转电极装置，以便控制聚光透镜的透镜激发，使得在诸如CRT的图像显示单元上图像的移动量最小化。

4. 发明授权

US08629395B2 Charged particle beam apparatus 失效
标题翻译：带电粒子束装置
公开(公告)号：US08629395B2
公开(公告)日：2014-01-14
申请号：US13521273
申请日：2011-01-12
申请人： Hideo Morishita , Michio Hatano , Takashi Ohshima , Mitsugu Sato , Tetsuya Sawahata , Sukehiro Ito , Yasuko Aoki
发明人： Hideo Morishita , Michio Hatano , Takashi Ohshima , Mitsugu Sato , Tetsuya Sawahata , Sukehiro Ito , Yasuko Aoki
IPC分类号： H01J37/28 , H01J37/244 , G01N23/22
CPC分类号： H01J49/067 , H01J37/244 , H01J2237/2441 , H01J2237/24465 , H01J2237/2448 , H01J2237/28
摘要： In order to provide a charged particle beam apparatus that can detect charged particle beam signals in discrimination into a plurality of energy bands, and obtain high-resolution images for each of the energy bands using the signals, the charged particle beam apparatus has a charged particle source (12-1); an aperture (16) that limits the diameter of the charged particle beam (4); optics (14, 17, 19) for the charged particle beam; a specimen holder (21); a charged particle detector (40) that detects secondary charged particles and reflected charged particles from a specimen; and signal calculation unit that processes the output signal from the charged particle detector. The charged particle detector (40) is provided with a first small detector (51) having a first detection sensitivity and a second small detector (52) having a second detection sensitivity, and makes the detection solid angle viewed from a position on the specimen, to which the charged particle beam (4) is to be radiated, to be the same for the first small detector (51) and the second small detector (52).
摘要翻译：为了提供一种带电粒子束装置，其能够将鉴别中的带电粒子束信号检测为多个能带，并且使用该信号获得每个能带的高分辨率图像，带电粒子束装置具有带电粒子来源（12-1）; 限制带电粒子束（4）的直径的孔（16）; 用于带电粒子束的光学器件（14,17,19）样品架（21）; 检测来自试样的二次带电粒子和反射带电粒子的带电粒子检测器（40）以及处理来自带电粒子检测器的输出信号的信号计算单元。带电粒子检测器（40）具有第一检测灵敏度的第一小检测器（51）和具有第二检测灵敏度的第二小检测器（52），并从检体上的位置观察检测立体角，对于第一小型检测器（51）和第二小型检测器（52），带电粒子束（4）将被照射到其上。

5. 发明授权

US08431893B2 Electron beam apparatus and electron beam inspection method 有权
标题翻译：电子束装置和电子束检查方法
公开(公告)号：US08431893B2
公开(公告)日：2013-04-30
申请号：US13530797
申请日：2012-06-22
申请人： Muneyuki Fukuda , Tomoyasu Shojo , Mitsugu Sato , Atsuko Fukada , Naomasa Suzuki , Ichiro Tachibana
发明人： Muneyuki Fukuda , Tomoyasu Shojo , Mitsugu Sato , Atsuko Fukada , Naomasa Suzuki , Ichiro Tachibana
IPC分类号： H01J37/28
CPC分类号： H01J37/28 , H01J37/244 , H01J2237/221 , H01J2237/2444 , H01J2237/2448 , H01J2237/24485 , H01J2237/2449 , H01J2237/24495
摘要： An electron beam apparatus which includes a sample stage on which a sample is placed, and an electron optical system. The electron optical system includes an electron gun that generates a primary electron beam, an immersion objective lens that converges the primary electron beam on the sample, an E×B deflector that separates a secondary particle, which is generated from irradiation of the primary beam to the sample, from an optical axis of the primary beam, a reflecting member to which the secondary particle collides, an assist electrode which is located under the reflecting member, a plurality of incidental particle detectors that selectively detect a velocity component and an azimuth component of a ternary particle which is generated by the secondary particle colliding to the reflecting member, and a center detector that is located above the reflecting member.
摘要翻译：一种电子束装置，包括放置样品的样品台和电子光学系统。电子光学系统包括：电子枪，其产生一次电子束，将一次电子束收敛在样品上的浸没物镜;将主光束照射产生的二次粒子分离的E×B偏转器; 来自主光束的光轴的样品，二次粒子碰撞的反射部件，位于反射部件下方的辅助电极，多个附带的粒子检测器，其选择性地检测速度分量和方位分量由二次粒子与反射部件碰撞产生的三元粒子，以及位于反射部件上方的中心检测器。

6. 发明授权

US08304722B2 Charged particle beam equipment and charged particle microscopy 有权
标题翻译：带电粒子束设备和带电粒子显微镜
公开(公告)号：US08304722B2
公开(公告)日：2012-11-06
申请号：US12234096
申请日：2008-09-19
申请人： Hiromi Inada , Mitsugu Sato , Atsushi Takane
发明人： Hiromi Inada , Mitsugu Sato , Atsushi Takane
IPC分类号： G01N23/00
CPC分类号： H01J37/28 , H01J37/222 , H01J37/265 , H01J2237/223 , H01J2237/2826 , H01J2237/3045
摘要： On the basis of a displacement of the field of view before and after a deflection of a charged particle beam, extracted from a first specimen image, including a displacement of the field of view recorded by causing a charged particle beam to deflect by a predetermined amount by a beam deflector in an image in which a specimen image is captured at a first magnification calibrated by using a specimen enlarged image of a specimen as a magnification standard, and also a displacement of the field of view before and after a deflection of the charged particle beam, extracted from a second specimen image, including a displacement of the field of view recorded by causing a charged particle beam to deflect by the predetermined amount by the beam deflector in an image in which a specimen image is captured at a second magnification, the second magnification is calibrated.
摘要翻译：基于从包括通过使带电粒子束偏转预定量而记录的视野的位移的第一标本图像提取的带电粒子束的偏转之前和之后的视场位移的基础上，通过在通过使用样本的样本放大图像作为放大标准校准的第一倍率捕获样本图像的图像中的光束偏转器，以及在充电的偏转之前和之后的视场位移从第二标本图像中提取出的粒子束，包括通过使带电粒子束在第二放大倍数下拍摄样本图像的图像中的光束偏转器偏转预定量而记录的视野的位移，校准第二放大倍数。

7. 发明授权

US08299760B2 Battery charger 失效
标题翻译：充电器
公开(公告)号：US08299760B2
公开(公告)日：2012-10-30
申请号：US12709915
申请日：2010-02-22
申请人： Mitsugu Sato
发明人： Mitsugu Sato
IPC分类号： H02J7/04
CPC分类号： H02J7/0045 , H01M10/46 , H02J7/047
摘要： A battery charger includes: a circuit board including terminal portions provided to be exposed to the outside from an insertion portion, in which a secondary battery is inserted, and electrically connected to the secondary battery; a power circuit portion obtaining a voltage from an external power source and supplying a charging current to the secondary battery; a temperature detection unit detecting a battery temperature of the secondary battery; a charging control switch turning on/off the charging current; and a controller controlling the power circuit portion or the charging control switch based on a voltage and a current of the power circuit portion and the battery temperature, wherein the temperature detection unit is provided in a part of the circuit board opposed to the insertion portion at a distance from electronic components constituting the power circuit portion and the controller based on a heat generation temperature of the electronic components.
摘要翻译：电池充电器包括：电路板，包括从插入二次电池的插入部分暴露于外部并与二次电池电连接的端子部分; 电源电路部分，从外部电源获得电压并向二次电池提供充电电流; 温度检测单元，检测二次电池的电池温度; 充电控制开关打开/关闭充电电流; 以及控制器，其基于所述电源电路部分的电压和电流以及所述电池温度来控制所述电源电路部分或所述充电控制开关，其中所述温度检测单元设置在所述电路板的与所述插入部分相对的部分中基于电子部件的发热温度与构成电源电路部的电子部件和控制器的距离。

8. 发明授权

US08153969B2 Inspection method and inspection system using charged particle beam 有权
标题翻译：使用带电粒子束的检查方法和检查系统
公开(公告)号：US08153969B2
公开(公告)日：2012-04-10
申请号：US12323167
申请日：2008-11-25
申请人： Atsuko Fukada , Mitsugu Sato , Naomasa Suzuki , Hidetoshi Nishiyama , Muneyuki Fukuda , Noritsugu Takahashi
发明人： Atsuko Fukada , Mitsugu Sato , Naomasa Suzuki , Hidetoshi Nishiyama , Muneyuki Fukuda , Noritsugu Takahashi
IPC分类号： G01N23/00
CPC分类号： G01N23/2251 , H01J37/147 , H01J37/244 , H01J37/28 , H01J2237/1501 , H01J2237/1508 , H01J2237/2449 , H01J2237/24507
摘要： In an electric immersion lens having high resolution capability, secondary electrons generated from a specimen are accelerated to suppress the dependency of rotational action of the secondary electrons applied thereto by an objective lens upon energy levels of the secondary electrons and when selectively detecting low and high angle components of elevation and azimuth as viewed from a secondary electron generation site by means of an annular detector interposed between an electron source and the objective lens, the secondary electrons are adjusted and deflected by means of an E×B deflector such that the center axis of secondary electrons converged finely under acceleration is made to be coincident with the center axis of a low elevation signal detection system and the secondary electrons are deviated from an aperture of a high elevation signal detection system.
摘要翻译：在具有高分辨能力的电浸透镜中，加速从样本产生的二次电子，以抑制由物镜施加到其上的二次电子的旋转作用对二次电子的能级的依赖性，并且当选择性地检测低角度和高角度时通过设置在电子源和物镜之间的环形检测器从二次电子产生位置观察的仰角和方位的分量，二次电子通过E×B偏转器被调节和偏转，使得中心轴线在加速度下精细收敛的二次电子与低仰角信号检测系统的中心轴一致，二次电子偏离高仰角信号检测系统的孔径。

9. 发明授权

US07956324B2 Charged particle beam apparatus for forming a specimen image 有权
标题翻译：用于形成标本图像的带电粒子束装置
公开(公告)号：US07956324B2
公开(公告)日：2011-06-07
申请号：US12155038
申请日：2008-05-29
申请人： Noritsugu Takahashi , Muneyuki Fukuda , Hideo Todokoro , Mitsugu Sato
发明人： Noritsugu Takahashi , Muneyuki Fukuda , Hideo Todokoro , Mitsugu Sato
IPC分类号： H01J37/26
CPC分类号： G01N23/225 , H01J37/265 , H01J37/28 , H01J2237/221
摘要： The invention provides a charged particle beam apparatus capable of preventing image errors in a display image and capturing a clear display image. A display image displayed on a display unit has a rectangular shape having sides that are substantially parallel to coordinate axes of a rectangular coordinate system determined by wafer alignment. A charged particle beam is radiated onto an area including a display image in a direction that is not parallel to the coordinate axes of the reference rectangular coordinate system to scan the area. Then, among image information obtained by scanning, only information of a position within the display image is displayed on the image display unit. In this way, a clear display image without brightness variation is obtained.
摘要翻译：本发明提供一种能够防止显示图像中的图像错误并捕获清晰显示图像的带电粒子束装置。在显示单元上显示的显示图像具有与由晶片对准确定的直角坐标系的坐标轴基本平行的侧面的矩形。带电粒子束在与平行于参考直角坐标系的坐标轴不平行的方向上辐射到包括显示图像的区域上以扫描该区域。然后，在通过扫描获得的图像信息中，只有显示图像中的位置的信息被显示在图像显示单元上。以这种方式，可以获得没有亮度变化的清晰显示图像。

10. 发明授权

US07805023B2 Image evaluation method and microscope 失效
标题翻译：图像评估方法和显微镜
公开(公告)号：US07805023B2
公开(公告)日：2010-09-28
申请号：US11802262
申请日：2007-05-21
申请人： Tohru Ishitani , Mitsugu Sato , Hideo Todokoro , Tadashi Otaka , Takashi Iizumi , Atsushi Takane
发明人： Tohru Ishitani , Mitsugu Sato , Hideo Todokoro , Tadashi Otaka , Takashi Iizumi , Atsushi Takane
IPC分类号： G06K9/32 , G21K7/00
CPC分类号： H01J37/28 , H01J37/222 , H01J37/263 , H01J2237/2823
摘要： Image evaluation method capable of objectively evaluating the image resolution of a microscope image. An image resolution method is characterized in that resolution in partial regions of an image is obtained over an entire area of the image or a portion of the image, averaging is performed over the entire area of the image or the portion of the image, and the averaged value is established as the resolution evaluation value of the entire area of the image or the portion of the image. This method eliminates the subjective impressions of the evaluator from evaluation of microscope image resolution, so image resolution evaluation values of high accuracy and good repeatability can be obtained.
摘要翻译：能够客观评价显微镜图像的图像分辨率的图像评价方法。图像分辨方法的特征在于，在图像的整个区域或图像的一部分上获得图像的部分区域中的分辨率，在图像的整个区域或图像的整个区域上进行平均化，建立平均值作为图像的整个区域或图像的部分的分辨率评估值。该方法消除了评估者对显微镜图像分辨率评估的主观印象，因此可以获得高精度和良好重复性的图像分辨率评估值。

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