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1. 发明授权

US06759694B1 Semiconductor phototransistor 失效
标题翻译：半导体光电晶体管
公开(公告)号：US06759694B1
公开(公告)日：2004-07-06
申请号：US10718621
申请日：2003-11-24
申请人： Yu-Min Hsu , Jin-Wei Shi , Zing-Way Pei , Fon Yuan , Chee-Wee Liu
发明人： Yu-Min Hsu , Jin-Wei Shi , Zing-Way Pei , Fon Yuan , Chee-Wee Liu
IPC分类号： H01L3111
CPC分类号： H01L31/1105 , H01L31/0352
摘要： A phototransistor structure is disclosed. A sidewall is grown on the collector side and under the base. The surface of the sidewall is formed with a sidewall contact. When the contact is connected to an external voltage, the holes accumulated at the junction of the base and emitter can be quickly removed. This solves the problem in the prior art that using a bias between the base and the emitter to remove holes usually results in a large dark current (bias current), power consumption, and diminishing optoelectronic conversion gain.
摘要翻译：公开了一种光电晶体管结构。侧壁在集电器侧和底部下生长。侧壁的表面形成有侧壁接触。当触点连接到外部电压时，可以快速去除在基极和发射极的结点处积累的空穴。这解决了现有技术中使用基极和发射极之间的偏置来去除空穴的问题通常导致大的暗电流（偏置电流），功耗和光电转换增益的减小。

2. 发明授权

US07371628B2 Method for fabricating semiconductor device 有权
标题翻译：制造半导体器件的方法
公开(公告)号：US07371628B2
公开(公告)日：2008-05-13
申请号：US11228340
申请日：2005-09-19
申请人： Cha-Hsin Lin , Zing-Way Pei , Chee-Wee Liu
发明人： Cha-Hsin Lin , Zing-Way Pei , Chee-Wee Liu
IPC分类号： H01L21/336
CPC分类号： H01L21/823828 , H01L21/823807
摘要： A method for fabricating a semiconductor device is provided. The method mainly involves steps of forming at least one first patterned high stress layer below a silicon substrate, then forming a semiconductor device onto the substrate, and forming at least one second patterned high stress layer on the semiconductor device. According to the method, the characteristics of the PMOS and the NMOS transistors formed on the same wafer may be improved simultaneously, by utilizing the stress of the patterned layers of high stress material. Further, the mobility of the carriers is enhanced, so that the output characteristic of the transistors can be improved.
摘要翻译：提供一种制造半导体器件的方法。该方法主要包括以下步骤：在硅衬底下方形成至少一个第一图案化的高应力层，然后在衬底上形成半导体器件，并在半导体器件上形成至少一个第二图案化的高应力层。根据该方法，通过利用高应力材料的图案化层的应力，可以同时改善形成在同一晶片上的PMOS和NMOS晶体管的特性。此外，载流子的迁移率增强，从而可以提高晶体管的输出特性。

3. 发明申请

US20060263959A1 Method for fabricating semiconductor device 有权
标题翻译：制造半导体器件的方法
公开(公告)号：US20060263959A1
公开(公告)日：2006-11-23
申请号：US11228340
申请日：2005-09-19
申请人： Cha-Hsin Lin , Zing-Way Pei , Chee-Wee Liu
发明人： Cha-Hsin Lin , Zing-Way Pei , Chee-Wee Liu
IPC分类号： H01L21/8234
CPC分类号： H01L21/823828 , H01L21/823807
摘要： A method for fabricating a semiconductor device is provided. The method mainly involves steps of forming at least one first patterned high stress layer below a silicon substrate, then forming a semiconductor device onto the substrate, and forming at least one second patterned high stress layer on the semiconductor device. According to the method, the characteristics of the PMOS and the NMOS transistors formed on the same wafer may be improved simultaneously, by utilizing the stress of the patterned layers of high stress material. Further, the mobility of the carriers is enhanced, so that the output characteristic of the transistors can be improved.
摘要翻译：提供一种制造半导体器件的方法。该方法主要包括以下步骤：在硅衬底下方形成至少一个第一图案化的高应力层，然后在衬底上形成半导体器件，并在半导体器件上形成至少一个第二图案化的高应力层。根据该方法，通过利用高应力材料的图案化层的应力，可以同时改善形成在同一晶片上的PMOS和NMOS晶体管的特性。此外，载流子的迁移率增强，从而可以提高晶体管的输出特性。

4. 发明授权

US06963089B2 Avalanche photo-detector with high saturation power and high gain-bandwidth product 失效
标题翻译：具有高饱和功率和高增益带宽产品的雪崩光电检测器
公开(公告)号：US06963089B2
公开(公告)日：2005-11-08
申请号：US10720117
申请日：2003-11-25
申请人： Jin-Wei Shi , Chee-Wee Liu
发明人： Jin-Wei Shi , Chee-Wee Liu
IPC分类号： H01L31/08 , H01L31/107
CPC分类号： B82Y10/00 , H01L31/107
摘要： An avalanche photo-detector (APD) is disclosed, which can reduce device capacitance, operating voltage, carrier transport time and dark current as well as increasing response speed and output power. Thus, an avalanche photo-detector (APD) with high saturation power, high gain-bandwidth product, low noise, fast response, low dark current is achieved. The APD includes an absorption layer with graded doping for converting an incident light into carriers, an undoped multiplication layer for multiplying current by means of receiving carriers, a doped field buffer layer sandwiched between the absorption layer and the multiplication layer for concentrating an electric field in the multiplication layer when a bias voltage is applied, and an undoped drift layer sandwiched between the absorption layer and the field buffer layer for capacitance reduction.
摘要翻译：公开了一种雪崩光电检测器（APD），可以降低器件电容，工作电压，载流子传输时间和暗电流以及响应速度和输出功率。因此，实现了具有高饱和功率，高增益带宽乘积，低噪声，快速响应，低暗电流的雪崩光电检测器（APD）。 APD包括具有用于将入射光转换成载流子的渐变掺杂的吸收层，用于通过接收载流子来乘以电流的未掺杂乘法层，夹在吸收层和乘法层之间的掺杂场缓冲层，用于将电场集中施加偏置电压时的倍增层和夹在吸收层和场缓冲层之间的未掺杂漂移层用于电容降低。

5. 发明申请

US20050051861A1 Avalanche photo-detector with high saturation power and high gain-bandwidth product 失效
公开(公告)号：US20050051861A1
公开(公告)日：2005-03-10
申请号：US10720117
申请日：2003-11-25
申请人： Jin-Wei Shi , Chee-Wee Liu
发明人： Jin-Wei Shi , Chee-Wee Liu
IPC分类号： H01L31/08 , H01L31/107
CPC分类号： B82Y10/00 , H01L31/107
摘要： An avalanche photo-detector (APD) is disclosed, which can reduce device capacitance, operating voltage, carrier transport time and dark current as well as increasing response speed and output power. Thus, an avalanche photo-detector (APD) with high saturation power, high gain-bandwidth product, low noise, fast response, low dark current is achieved. The APD includes an absorption layer with graded doping for converting an incident light into carriers, an undoped multiplication layer for multiplying current by means of receiving carriers, a doped field buffer layer sandwiched between the absorption layer and the multiplication layer for concentrating an electric field in the multiplication layer when a bias voltage is applied, and an undoped drift layer sandwiched between the absorption layer and the field buffer layer for capacitance reduction.

6. 发明授权

US06794309B2 Method for utilizing rough insulator to enhance metal-insulator-semiconductor reliability 有权
标题翻译：利用粗糙绝缘子提高金属绝缘体半导体可靠性的方法
公开(公告)号：US06794309B2
公开(公告)日：2004-09-21
申请号：US10122572
申请日：2002-04-15
申请人： Chee-Wee Liu , Fon Yuan , Chung-Hsun Lin
发明人： Chee-Wee Liu , Fon Yuan , Chung-Hsun Lin
IPC分类号： H01L2131
CPC分类号： H01L21/02299 , H01L21/0214 , H01L21/02164 , H01L21/0217 , H01L21/02236 , H01L21/02238 , H01L21/02241 , H01L21/02258 , H01L21/02271 , H01L21/28185 , H01L21/30604 , H01L21/3144 , H01L21/316 , H01L21/3185 , H01L29/42364 , H01L29/495 , H01L29/518
摘要： A method for utilizing a rough insulator to enhance metal-insulator-semiconductor reliability is provided. The method includes steps of: (a) providing a semiconductor substrate; (b) prebaking the semiconductor substrate under a relatively high vacuum to form a rough surface on the semiconductor substrate; and (c) growing an insulator on the semiconductor substrate to form a rough insulator and increase the metal-insulator-semiconductor reliability when the insulator is applied.
摘要翻译：提供了一种利用粗糙绝缘体来增强金属 - 绝缘体 - 半导体可靠性的方法。该方法包括以下步骤：（a）提供半导体衬底; （b）在相对高的真空下预烘烤半导体衬底以在半导体衬底上形成粗糙表面; 和（c）在半导体衬底上生长绝缘体以形成粗糙的绝缘体，并且当施加绝缘体时增加金属 - 绝缘体 - 半导体的可靠性。

7. 发明申请

US20130087191A1 POINT-CONTACT SOLAR CELL STRUCTURE 审中-公开
标题翻译：点接触太阳能电池结构
公开(公告)号：US20130087191A1
公开(公告)日：2013-04-11
申请号：US13341526
申请日：2011-12-30
申请人： Seow-Wei TAN , Yen-Yu Chen , Wei-Shuo Ho , Yu-Hung Huang , Chee-Wee Liu
发明人： Seow-Wei TAN , Yen-Yu Chen , Wei-Shuo Ho , Yu-Hung Huang , Chee-Wee Liu
IPC分类号： H01L31/0224 , H01L31/0216
CPC分类号： H01L31/022425 , H01L31/1804 , Y02E10/547 , Y02P70/521
摘要： A point-contact solar cell structure includes a semiconductor substrate, a front electrode, a first passivation layer, a second passivation layer, and a rear electrode. The semiconductor substrate includes an upper surface, a lower surface, and an emitter layer, a base layer, and a plurality of locally doped regions located between the upper surface and the lower surface. The plurality of locally doped regions is located on the lower surface at intervals. The second passivation layer is located on the lower surface, and has a plurality of openings disposed respectively corresponding to the locally doped regions. The rear electrode is located on one side of the second passivation layer opposite to the semiconductor substrate, and passes through the second passivation layer via the openings to contact the locally doped regions. The width of at least one opening corresponding to the front electrode is greater than that of the remaining openings.
摘要翻译：点接触太阳能电池结构包括半导体衬底，前电极，第一钝化层，第二钝化层和后电极。半导体衬底包括位于上表面和下表面之间的上表面，下表面和发射极层，基底层和多个局部掺杂区域。多个局部掺杂区域间隔地位于下表面上。第二钝化层位于下表面，并且具有分别对应于局部掺杂区域设置的多个开口。后电极位于与半导体衬底相对的第二钝化层的一侧上，并且经由开口穿过第二钝化层以接触局部掺杂区域。对应于前电极的至少一个开口的宽度大于其余开口的宽度。

8. 发明申请

US20070045610A1 Transistor device with strained germanium (Ge) layer by selectively growth and fabricating method thereof 审中-公开
标题翻译：具有应变锗（Ge）层的晶体管器件通过选择性生长及其制造方法
公开(公告)号：US20070045610A1
公开(公告)日：2007-03-01
申请号：US11293275
申请日：2005-12-05
申请人： Min-Hung Lee , Cheng-Yeh Yu , Chee-Wee Liu
发明人： Min-Hung Lee , Cheng-Yeh Yu , Chee-Wee Liu
IPC分类号： H01L31/109
CPC分类号： H01L29/1054 , H01L21/02381 , H01L21/0245 , H01L21/02532 , H01L21/0262 , H01L21/02636 , H01L29/66583 , H01L29/78
摘要： A transistor device with strained Ge layer by selectively growth and a fabricating method thereof are provided. A strained Ge layer is selectively grown on a substrate, so that the material of source/drain region is still the same as that of the substrate, and the strained Ge layer serves as a carry transport channel. Therefore, the performance of the device characteristics can be improved and the leakage current of the transistor may be approximately commensurate with that of a Si substrate field effect transistor (FET).
摘要翻译：提供了通过选择性生长具有应变Ge层的晶体管器件及其制造方法。应变Ge层选择性地生长在衬底上，使得源极/漏极区的材料与衬底的材料仍然相同，并且应变Ge层用作携带传输沟道。因此，可以提高器件特性的性能，并且晶体管的漏电流可以与Si衬底场效应晶体管（FET）的漏电流近似相当。

9. 发明授权

US11587846B2 Semiconductor device and method of forming the same 有权
公开(公告)号：US11587846B2
公开(公告)日：2023-02-21
申请号：US17133896
申请日：2020-12-24
申请人： MEDIATEK INC. , Chee-Wee Liu
发明人： Ming-Tzong Yang , Hsien-Hsin Lin , Wen-Kai Wan , Chia-Che Chung , Chee-Wee Liu
IPC分类号： H01L23/373 , H01L21/768 , H01L29/78 , H01L29/66
摘要： A semiconductor device includes a heat dissipation substrate and a device layer. The thermal conductivity of the heat dissipation substrate is greater than 200 Wm−1K−1 and the device layer is disposed on the heat dissipation substrate. The device layer includes a transistor. A method of forming a semiconductor device includes providing a base substrate, forming a heat dissipation substrate on the base substrate, wherein a thermal conductivity of the heat dissipation substrate is greater than 200 Wm−1K−1. The method further includes forming a device layer on the heat dissipation substrate, wherein the device layer comprises a transistor. The method further includes removing the base substrate.

10. 发明申请

US20120097246A1 SOLAR CELL AND METHOD OF MAKING THE SAME 审中-公开
标题翻译：太阳能电池及其制造方法
公开(公告)号：US20120097246A1
公开(公告)日：2012-04-26
申请号：US13074015
申请日：2011-03-29
申请人： Chee-Wee Liu , Wei-Shuo Ho , Yen-Yu Chen , Chun-Yuan Ku , Zhen-Cheng Wu , Shuo-Wei Liang , Jen-Chieh Chen , Chung-Wei Lai , Tsung-Pao Chen
发明人： Chee-Wee Liu , Wei-Shuo Ho , Yen-Yu Chen , Chun-Yuan Ku , Zhen-Cheng Wu , Shuo-Wei Liang , Jen-Chieh Chen , Chung-Wei Lai , Tsung-Pao Chen
IPC分类号： H01L31/036 , H01L31/20
CPC分类号： H01L31/1804 , H01L31/068 , Y02E10/547 , Y02P70/521
摘要： A solar cell includes a crystalline semiconductor substrate; a first crystalline semiconductor layer; an amorphous semiconductor layer; a first metal electrode layer and a second metal electrode layer. The crystalline semiconductor substrate has a first surface and a second surface, and the crystalline semiconductor substrate has a first doped type. The first crystalline semiconductor layer is disposed on the first surface of the crystalline semiconductor substrate, where the first crystalline semiconductor layer has a second doped type contrary to the first doped type. The amorphous semiconductor layer is disposed on the first crystalline semiconductor layer, and the amorphous semiconductor layer has the second doped type. The first metal electrode layer is disposed on the amorphous semiconductor layer. The second metal electrode layer is disposed on the second surface of the crystalline semiconductor substrate.
摘要翻译：太阳能电池包括晶体半导体衬底; 第一晶体半导体层; 非晶半导体层; 第一金属电极层和第二金属电极层。晶体半导体衬底具有第一表面和第二表面，并且晶体半导体衬底具有第一掺杂型。第一晶体半导体层设置在晶体半导体衬底的第一表面上，其中第一晶体半导体层具有与第一掺杂类型相反的第二掺杂型。非晶半导体层设置在第一结晶半导体层上，非晶半导体层具有第二掺杂型。第一金属电极层设置在非晶半导体层上。第二金属电极层设置在晶体半导体衬底的第二表面上。

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