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    • 2. 发明授权
    • Adder circuit and associated layout structure
    • 加法器电路和相关布局结构
    • US06480875B1
    • 2002-11-12
    • US08957159
    • 1997-10-24
    • Akira MiyoshiHiroaki YamamotoYoshito Nishimichi
    • Akira MiyoshiHiroaki YamamotoYoshito Nishimichi
    • G06F750
    • G06F7/508H01L27/0207H01L27/092
    • In an adder circuit, a block carry generation logic over three consecutive digits is produced from the following equations. G0=g2+p2·g1+p2·p1·g0 /g0=/p2+/g2·/p1+/g2·/g1·/g0 In other words, the block carry generation logic /G0 is produced by a single PMOS transistor, a series circuit formed of two PMOS transistors connected in series, and a series circuit formed of three PMOS transistors connected in series. The block carry generation logic G0 is produced by a single NMOS transistor, a series circuit formed of two NMOS transistors connected in series, and a series circuit formed of three NMOS transistors connected in series. Block carry generation logics can be formed in such a way as to achieve not only a reduction of the layout area but also a higher operation rate.
    • 在加法器电路中,从以下等式产生三位连续位数的块载入生成逻辑。换句话说,块载入生成逻辑/ G0由单个PMOS晶体管产生,串联电路由两个PMOS晶体管形成, 串联电路以及串联连接的3个PMOS晶体管构成的串联电路。 块载入生成逻辑G0由单个NMOS晶体管,串联连接的两个NMOS晶体管构成的串联电路和由串联连接的三个NMOS晶体管构成的串联电路产生。 块携带生成逻辑可以形成为不仅实现布局区域的减少,而且实现更高的操作速率。
    • 5. 发明申请
    • Wideband antenna unit
    • 宽带天线单元
    • US20090058732A1
    • 2009-03-05
    • US11988581
    • 2006-03-02
    • Hisamatsu NakanoAkira MiyoshiTakaaki KondoSatoshi HattoriTakaaki KondoJunji Yamauchi
    • Hisamatsu NakanoAkira MiyoshiTakaaki KondoSatoshi HattoriTakaaki KondoJunji Yamauchi
    • H01Q9/04
    • H01Q9/40H01Q1/48H01Q9/30
    • To provide a thin wideband antenna unit capable of shrinking the size of a radiation element in a case where a dielectric is not used.In a wideband antenna unit 10 having a ground plate 12 and a flat shaped radiation element 14 disposed on a plane (x, y) flush with a plane where the ground plate extends, the radiation element 14 has an elliptically shape. The radiation element 14 and the ground plate 12 are apart from each other by a predetermined feeding distance ΔFD. A ratio between an outside diameter 2aout in an ellipse's x-direction and an outside diameter 2bout in an ellipse's y-direction is 8:5. The elliptically shaped radiation element 14 has an elliptically shaped opening 14a which is concentric O with the elliptically shape. An inside diameter 2bin in the ellipse's y-direction is half of an outside diameter 2bout in the ellipse's y-direction. It is desirable that an inside diameter 2ain of the elliptically shaped opening 14a in the ellipse's x-direction is not more than half of the outside diameter 2aout in the ellipse's x-direction.
    • 为了提供在不使用电介质的情况下能够收缩辐射元件的尺寸的薄宽带天线单元。 在具有接地板12和设置在与接地板延伸的平面齐平的平面(x,y)上的平坦形状的辐射元件14的宽带天线单元10中,辐射元件14具有椭圆形。 辐射元件14和接地板12彼此隔开预定的馈送距离ΔFD。 椭圆x方向的外径2aout与椭圆y方向的外径2bo之间的比例为8:5。 椭圆形辐射元件14具有椭圆形的开口14a,其与椭圆形状同心O。 椭圆y方向的内径2bin是椭圆y方向的外径2bo的一半。 希望椭圆形x方向上的椭圆形开口14a的内径2ain不大于椭圆x方向上的外径2aout的一半。
    • 8. 发明申请
    • Scan path circuit and semiconductor integrated circuit comprising the scan path circuit
    • 扫描路径电路和包括扫描路径电路的半导体集成电路
    • US20070168806A1
    • 2007-07-19
    • US11506781
    • 2006-08-21
    • Masaya SumitaAkira Miyoshi
    • Masaya SumitaAkira Miyoshi
    • G01R31/28
    • G11C29/32G11C2029/3202
    • Each of D flip-flops (FFs) 13a to 13f constituting a scan path circuit has a normal operation input circuit to be selected in a normal operation and a test operation input circuit to be selected in a test operation, and a control signal having an intermediate voltage between a supply voltage and a ground voltage is sent from a voltage generating circuit 17 to the test operation input circuit of each FF in the test operation. In this case, the amount of an output change in data in each FF is smoother than that in the case in which the supply voltage is applied. Consequently, the delay time of the data is increased. The intermediate voltage to be applied to each FF in the test operation is determined based on a feedback signal sent from a test circuit 15 for checking whether scanned-out data have an error or not.
    • 构成扫描路径电路的D触发器(FF)13a至13f中的每一个具有在正常操作中选择的正常操作输入电路和在测试操作中选择的测试操作输入电路,以及控制信号 在电源电压和接地电压之间具有中间电压的电压从电压产生电路17发送到测试操作中的每个FF的测试操作输入电路。 在这种情况下,每个FF中的数据的输出变化量比施加电源电压的情况更平滑。 因此,数据的延迟时间增加。 基于从测试电路15发送的用于检查扫描数据是否具有错误的反馈信号来确定在测试操作中施加到每个FF的中间电压。
    • 9. 发明授权
    • Scan path circuit and semiconductor integrated circuit comprising the scan path circuit
    • 扫描路径电路和包括扫描路径电路的半导体集成电路
    • US07124339B2
    • 2006-10-17
    • US10417208
    • 2003-04-17
    • Masaya SumitaAkira Miyoshi
    • Masaya SumitaAkira Miyoshi
    • G01R31/028H03K3/289
    • G11C29/32G11C2029/3202
    • Each of D flip-flops (FFs) 13a to 13f constituting a scan path circuit has a normal operation input circuit to be selected in a normal operation and a test operation input circuit to be selected in a test operation, and a control signal having an intermediate voltage between a supply voltage and a ground voltage is sent from a voltage generating circuit 17 to the test operation input circuit of each FF in the test operation. In this case, the amount of an output change in data in each FF is smoother than that in the case in which the supply voltage is applied. Consequently, the delay time of the data is increased. The intermediate voltage to be applied to each FF in the test operation is determined based on a feedback signal sent from a test circuit 15 for checking whether scanned-out data have an error or not.
    • 构成扫描路径电路的D触发器(FF)13a至13f中的每一个具有在正常操作中选择的正常操作输入电路和在测试操作中选择的测试操作输入电路,以及控制信号 在电源电压和接地电压之间具有中间电压的电压从电压产生电路17发送到测试操作中的每个FF的测试操作输入电路。 在这种情况下,每个FF中的数据的输出变化量比施加电源电压的情况更平滑。 因此,数据的延迟时间增加。 基于从测试电路15发送的用于检查扫描数据是否具有错误的反馈信号来确定在测试操作中施加到每个FF的中间电压。