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    • 8. 发明授权
    • Method of manufacturing photoelectric conversion device
    • 制造光电转换装置的方法
    • US08293559B2
    • 2012-10-23
    • US13161959
    • 2011-06-16
    • Takehito OkabeHiroaki NaruseRyuichi MishimaKouhei Hashimoto
    • Takehito OkabeHiroaki NaruseRyuichi MishimaKouhei Hashimoto
    • H01L21/00
    • H01L27/14687H01L21/28518H01L27/14632
    • In a method of manufacturing a photoelectric conversion device having a pixel region and a peripheral circuit region, a semiconductor compound layer is formed by causing a surface of a diffusion layer or gate electrode of a MOS transistor in the peripheral circuit region to react with a high melting point metal, then an insulating layer is formed in the pixel region and the peripheral circuit region after the step of forming a semiconductor compound layer. A contact hole is formed in the insulating layer to expose a diffusion layer in the pixel region, and a contact hole is formed in the insulating layer to expose the semiconductor compound layer formed in the peripheral circuit region. These holes are formed at different timings. Prior to forming the hole which is formed later, a contact plug is formed in the contact hole which is formed earlier.
    • 在制造具有像素区域和外围电路区域的光电转换装置的方法中,通过使外围电路区域中的MOS晶体管的扩散层或栅电极的表面与高电位反应来形成半导体化合物层 熔点金属,则在形成半导体化合物层的步骤之后,在像素区域和外围电路区域中形成绝缘层。 在绝缘层中形成接触孔,以露出像素区域中的扩散层,并且在绝缘层中形成接触孔以暴露形成在外围电路区域中的半导体化合物层。 这些孔在不同的时刻形成。 在形成稍后形成的孔之前,在较早形成的接触孔中形成接触塞。
    • 9. 发明授权
    • Method for manufacturing semiconductor device
    • 制造半导体器件的方法
    • US08551873B2
    • 2013-10-08
    • US13610142
    • 2012-09-11
    • Yusuke OnukiTakehito OkabeHideaki Ishino
    • Yusuke OnukiTakehito OkabeHideaki Ishino
    • H01L21/28
    • H01L21/28247H01L27/14649H01L27/14689H01L29/6656H01L29/7833
    • A method for manufacturing a semiconductor device having a MOS transistor, includes forming a gate electrode material layer on a first insulating film formed on a semiconductor substrate, forming an etching mask on the gate electrode material layer, forming a gate electrode by patterning the gate electrode material layer such that a protective film that protects at least a lower portion of a side face of the gate electrode and a portion of the first insulating film, which is adjacent to the side face, is formed while the gate electrode material layer is patterned, forming a second insulating film on the semiconductor substrate on which the gate electrode is formed, and forming an interlayer insulation film on the second insulating film.
    • 一种制造具有MOS晶体管的半导体器件的方法,包括在形成在半导体衬底上的第一绝缘膜上形成栅电极材料层,在栅电极材料层上形成蚀刻掩模,通过图案化栅电极形成栅电极 材料层,使得在对栅电极材料层进行图案化的同时形成保护栅电极的侧面的至少下部和与侧面相邻的第一绝缘膜的一部分的保护膜, 在其上形成有栅电极的半导体衬底上形成第二绝缘膜,并在第二绝缘膜上形成层间绝缘膜。