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    • 1. 发明授权
    • Infrared gas analyzer and method for operating said analyzer
    • 红外气体分析仪及其操作方法
    • US06635875B1
    • 2003-10-21
    • US09890979
    • 2001-08-06
    • Werner Grosse BleyGünter VossUlrich DöblerThomas Böhm
    • Werner Grosse BleyGünter VossUlrich DöblerThomas Böhm
    • G01N2161
    • G01M3/38G01N21/3504G01N21/61
    • The invention relates to an infrared gas analyser (1), especially for use as a gas detector for leak detection using a sampling probe. Said gas analyser comprises a vessel (test vessel 2), through which a test gas flows, and an infrared light source (4, 5, 42) which produces an infrared light that shines through the test vessel (2). The analyser further encompasses a detector (35) that facilitates measurement of the infrared light absorption in the test gas. The aim of the invention is to provide at low costs an analyser that is apt for every day use. To this end, a reference vessel (3) through which a reference gas flows is provided in addition to the test vessel (2) through which the test gas flows. A reference gas is sucked from the environment of the test gas suction area. The same or an additional light source (4, 5, 42) and the same detector (35) are allocated to said reference vessel. The analyser is provided with means (38, 41) that effect a modulation of the infrared light shining through the vessel (2, 3). Means (36) are provided which produce the measured values and which allow that the background signals obtained by the infrared absorption in the gas of the reference vessel (3) are taken into consideration for the signals obtained by measuring the infrared absorption in the test vessel.
    • 本发明涉及一种红外线气体分析仪(1),特别用于使用采样探头进行泄漏检测的气体检测器。 所述气体分析仪包括测试气体流过的容器(测试容器2)和产生通过测试容器(2)的红外光的红外光源(4,542)。 分析仪还包括有助于测量测试气体中的红外光吸收的检测器(35)。 本发明的目的是以低成本提供易于每天使用的分析仪。 为此,除了测试气体流过的测试容器(2)之外,还提供了参考气体流过的参考容器(3)。 从试验气体吸入区域的环境吸入参考气体。 将相同或附加的光源(4,5,42)和相同的检测器(35)分配给所述参考容器。 所述分析仪具有实现通过所述容器(2,3)照射的红外光的调制的装置(38,41)。 提供了产生测量值并且允许通过测量在测试容器中的红外吸收获得的信号考虑通过参考容器(3)的气体中的红外吸收而获得的背景信号的装置(36) 。
    • 4. 发明授权
    • Leak detector comprising a vacuum apparatus
    • 泄漏检测器,包括真空装置
    • US07717681B2
    • 2010-05-18
    • US10553457
    • 2004-04-08
    • Thomas BöhmUlrich DoeblerRalf HircheWerner Grosse Bley
    • Thomas BöhmUlrich DoeblerRalf HircheWerner Grosse Bley
    • F04B25/00
    • G01M3/202
    • A leak detector operating according to the counterflow principle comprises a first high vacuum pump that operates in series with a primary pump. A second high vacuum pump is branched at a connecting point and an entry side thereof is connected to a mass spectrometer. A light test gas in the form of helium flows through the second high vacuum pump in a direction opposite to a transport direction. A conduit connecting an inlet to the entry side of the first high vacuum pump is devoid of restricted flow zones and valves in such a way that the pumping capacity of the leak detector is high for helium, thereby reducing the response time thereof. A valve for blocking the conduit leading via the first high vacuum pump is arranged between the exit side thereof and the entry side of the primary pump.
    • 根据逆流原理操作的泄漏检测器包括与初级泵串联操作的第一高真空泵。 第二高真空泵在连接点处分支,其入口侧连接到质谱仪。 氦形式的轻质试验气体沿着与输送方向相反的方向流过第二高真空泵。 将入口连接到第一高真空泵的进入侧的导管没有限制的流动区域和阀,使得泄漏检测器的泵送能力对于氦是高的,从而减少其响应时间。 用于阻塞通过第一高真空泵引导的导管的阀布置在其出口侧和主泵的入口侧之间。
    • 9. 发明授权
    • Memory cell configuration and corresponding fabrication method
    • 存储单元配置及相应的制造方法
    • US06258658B1
    • 2001-07-10
    • US09250362
    • 1999-02-12
    • Thomas BöhmVolker WeinrichManfred HainArmin KohlhaseYoichi OtaniAndreas RuschTill Schlösser
    • Thomas BöhmVolker WeinrichManfred HainArmin KohlhaseYoichi OtaniAndreas RuschTill Schlösser
    • H01L218242
    • H01L27/10823H01L27/10808
    • The memory cell configuration has a multiplicity of preferably ferroelectric memory cells in a semiconductor substrate. Mutually parallel bit line trenches run in the longitudinal direction in the main surface of the semiconductor substrate. Bit lines are disposed in the bottoms of the trenches. Source/drain regions are formed in the crowns of the trenches. Channel regions are provided in the walls of the trenches. The channel region on a wall in each case is configured such that a drivable selection transistor of the relevant memory cell is formed there, while the channel region on the other wall is configured such that the transistor located there is closed. Insulated word lines for driving the selection transistors run in the transverse direction along the main surface of the semiconductor substrate through the bit line trenches. Insulation trenches for insulating the source/drain regions in the longitudinal direction of neighboring memory cells run in the transverse direction in the main surface of the semiconductor substrate. A respective, preferably ferroelectric, capacitor is connected to the source/drain region of the respective memory cell and is arranged above the word lines.
    • 存储单元配置在半导体衬底中具有多个优选铁电存储单元。 相互并行的位线沟槽在半导体衬底的主表面中沿纵向延伸。 位线设置在沟槽的底部。 源极/漏极区域形成在沟槽的冠部中。 通道区域设置在沟槽的壁中。 在每种情况下,壁上的沟道区域被构造成使得相关存储单元的可驱动选择晶体管形成在其中,而另一壁上的沟道区域被配置为使得位于那里的晶体管闭合。 用于驱动选择晶体管的绝缘字线通过位线沟槽沿着半导体衬底的主表面在横向方向上延伸。 用于绝缘沟槽,用于使相邻存储单元的纵向上的源极/漏极区域绝缘,在半导体衬底的主表面中沿横向延伸。 相应的优选铁电电容器连接到相应存储单元的源极/漏极区域并且被布置在字线之上。
    • 10. 发明申请
    • DEVICE FOR THE MANUFACTURE OF ABSORBENT PRODUCTS
    • 吸收产品的制造设备
    • US20090272240A1
    • 2009-11-05
    • US12306101
    • 2006-06-30
    • Thomas BöhmDaniel Carlsson
    • Thomas BöhmDaniel Carlsson
    • B26F1/20B26D3/12
    • B26F1/20B26D1/0006B26D3/10B26D3/12B26D2001/0053B26D2001/006B26F1/22B26F1/44B26F2001/4409B26F2001/4481Y10T83/4836Y10T83/4838Y10T83/9314Y10T156/12
    • A device for the manufacture of an absorbent product including a rotatable slitting tool having an extent in a radial direction and an extent in an axial direction perpendicular to the radial direction, the slitting tool being divided in the axial direction into two lateral parts and lying between them a central part. The central part has a circular cross section in the radial direction, and the lateral parts include, in the axial direction, intermittent protuberances projecting from the central part. The protuberances are the same distance from the center of the slitting tool as the circular cross section. The central part between the protuberances, in the direction of curvature of the envelope surface, forms a plurality of cutting edges, each of which has a width which, at a given pressure, permits slitting of a layer of material intended for the absorbent product, and the protuberances form supporting surfaces between the cutting edges.
    • 一种用于制造吸收产品的装置,包括具有与径向方向垂直的径向方向和程度的可旋转切割工具,该切割工具沿轴向方向分成两个侧面部分,位于 他们是中心部分。 中心部分在径向上具有圆形横截面,并且侧向部分在轴向方向上包括从中心部分突出的间歇突起。 突起与切割工具的中心距圆形截面相同。 突起之间的中心部分在包络表面的曲率方向上形成多个切割边缘,每个切割边缘具有宽度,该宽度在给定压力下允许切割用于吸收产品的一层材料, 并且突起在切割刃之间形成支撑表面。