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    • 3. 发明授权
    • High voltage bipolar transistor with pseudo buried layers
    • 具有伪埋层的高压双极晶体管
    • US08674480B2
    • 2014-03-18
    • US12966078
    • 2010-12-13
    • Tzuyin ChiuTungYuan ChuWensheng QianYungChieh FanJun HuDonghua LiuYukun Lv
    • Tzuyin ChiuTungYuan ChuWensheng QianYungChieh FanJun HuDonghua LiuYukun Lv
    • H01L29/66
    • H01L21/76232H01L21/8249H01L27/0623H01L29/0657H01L29/0821H01L29/41708H01L29/66242H01L29/66287H01L29/7322H01L29/7378
    • A high voltage bipolar transistor with shallow trench isolation (STI) comprises the areas of a collector formed by implanting first electric type impurities into active area and connected with pseudo buried layers at two sides; Pseudo buried layers which are formed by implanting high dose first type impurity through the bottoms of STI at two sides if active area, and do not touch directly; deep contact through field oxide to contact pseudo buried layers and pick up the collectors; a base deposited on the collector by epitaxial growth and in-situ doped by second electric type impurity, in which the intrinsic base touches local collector and extrinsic base is used for base pick-up; a emitter which is a polysilicon layer deposited on the intrinsic base and doped with first electric type impurities. This invention makes the depletion region of collector/base junction from 1D (vertical) distribution to 2D (vertical and lateral) distribution. The bipolar transistor's breakdown voltages are increased by only enlarge active critical dimension (CD). This is low-cost process.
    • 具有浅沟槽隔离(STI)的高电压双极晶体管包括通过将第一电型杂质注入有源区并且在两侧与伪掩埋层连接而形成的集电极的区域; 伪埋层是通过在两侧的STI两侧植入高剂量第一类杂质而形成的,如果有活动区域,并且不直接接触; 通过场氧化物深接触接触伪埋层并拾取集电器; 通过外延生长沉积在集电体上并通过第二电型杂质原位掺杂的基极,其中本征基极接触局部集电极和外部基极用于基极拾取; 作为沉积在本征基底上并掺杂有第一电型杂质的多晶硅层的发射极。 本发明使集电极/基极结的耗尽区从1D(垂直)分布到2D(垂直和横向)分布。 双极晶体管的击穿电压仅通过增加主动临界尺寸(CD)来增加。 这是低成本的过程。
    • 6. 发明授权
    • Parasitic vertical PNP bipolar transistor and its fabrication method in BiCMOS process
    • 寄生垂直PNP双极晶体管及其在BiCMOS工艺中的制造方法
    • US08420475B2
    • 2013-04-16
    • US12975545
    • 2010-12-22
    • Tzuyin ChiuTungYuan ChuWensheng QianYungChieh FanDonghua LiuJun Hu
    • Tzuyin ChiuTungYuan ChuWensheng QianYungChieh FanDonghua LiuJun Hu
    • H01L21/8238
    • H01L29/732H01L21/8249H01L27/0623H01L29/0821H01L29/1004H01L29/66242H01L29/66287H01L29/7371
    • This invention published a parasitic vertical PNP bipolar transistor in BiCMOS (Bipolar Complementary Metal Oxide Semiconductor) process; the bipolar transistor comprises a collector, a base and an emitter. Collector is formed by active region with p-type ion implanting layer. It connects a p-type buried layer which formed in the bottom region of STI (Shallow Trench Isolation). The collector terminal connection is through the p-type buried layer and the adjacent active region. The base is formed by active region with n type ion implanting which is on the collector. Its connection is through the original p-type epitaxy layer after converting to n-type. The emitter is formed by the p-type epitaxy layer on the base region with heavy p-type doped. This invention also comprises the fabrication method of this parasitic vertical PNP bipolar in BiCMOS (Bipolar Complementary Metal Oxide Semiconductor) process. And this PNP bipolar transistor can be used as the IO (Input/Output) device in high speed, high current and power gain BiCMOS (Bipolar Complementary Metal Oxide Semiconductor) circuits. It also provides a device option with low cost.
    • 本发明公开了BiCMOS(双极互补金属氧化物半导体)工艺中的寄生垂直PNP双极晶体管; 双极晶体管包括集电极,基极和发射极。 集电极由具有p型离子注入层的有源区形成。 它连接形成在STI底部区域(浅沟槽隔离)的p型掩埋层。 集电极端子连接通过p型掩埋层和相邻的有源区。 基极由在集电极上的n型离子注入的有源区形成。 其连接是通过原始的p型外延层转换为n型。 发射极由重p型掺杂的基极区上的p型外延层形成。 本发明还包括BiCMOS(双极互补金属氧化物半导体)工艺中该寄生垂直PNP双极的制造方法。 而这种PNP双极晶体管可以用作高速,大电流和功率增益BiCMOS(双极互补金属氧化物半导体)电路中的IO(输入/输出)器件。 它还提供低成本的设备选项。
    • 7. 发明授权
    • Stacked inductor
    • 堆叠电感
    • US08289118B2
    • 2012-10-16
    • US12963462
    • 2010-12-08
    • Tzuyin ChiuXiangming XuMiao Cai
    • Tzuyin ChiuXiangming XuMiao Cai
    • H01F21/02H01F5/00H01F27/28
    • H01F17/0013
    • A stacked inductor with combined metal layers is represented in this invention. The stacked inductor includes: a top layer metal coil, and at least two lower layer metal coils, the metal coils being aligned with each other; adjacent metal coils being connected at the corresponding ends through a via; wherein, each of the lower layer metal coils is consisted of plural layers of metal lines which are interconnected. With the same chip area, the stacked inductor of the present invention can achieve higher inductance and Q factor because of the mutual inductance generated from the plural layers of metal lines and the reduced parasitic resistance.
    • 具有组合金属层的堆叠电感器在本发明中被表示。 堆叠电感器包括:顶层金属线圈和至少两个下层金属线圈,金属线圈彼此对准; 相邻的金属线圈通过通孔在相应的端部连接; 其中,每个下层金属线圈由互连的多层金属线构成。 由于相同的芯片面积,由于由多层金属线产生的互感和降低的寄生电阻,本发明的层叠电感器可以实现更高的电感和Q因数。
    • 8. 发明授权
    • SiGe heterojunction bipolar transistor multi-finger structure
    • SiGe异质结双极晶体管多指结构
    • US08227832B2
    • 2012-07-24
    • US12971063
    • 2010-12-17
    • Tzuyin ChiuZhengliang ZhouXiongbin Chen
    • Tzuyin ChiuZhengliang ZhouXiongbin Chen
    • H01L29/66
    • H01L29/7378H01L29/0692H01L29/0821
    • The present invention provides a multi-finger structure of a SiGe heterojunction bipolar transistor (HBT). It is consisted of plural SiGe HBT single cells. The multi-finger structure is in a form of C/BEBC/BEBC/.../C, wherein, C, B, E respectively stands for collector, base and emitter; CBEBC stands for a SiGe HBT single cell. The collector region is consisted of an n type ion implanted layer inside the active region. The bottom of the implanted layer is connected to two n type pseudo buried layers. The two pseudo buried layers are formed through implantation to the bottom of the shallow trenches that surround the collector active region. Two collectors are picked up by deep trench contact through the field oxide above the two pseudo buried layers. The present invention can reduce junction capacitance, decrease collector electrode output resistance, and improve device frequency characteristics.
    • 本发明提供了一种SiGe异质结双极晶体管(HBT)的多指结构。 它由多个SiGe HBT单电池组成。 多指结构为C / BEBC / BEBC / ... / C,其中C,B,E分别代表集电极,基极和发射极; CBEBC代表SiGe HBT单电池。 集电极区域由有源区域内的n型离子注入层构成。 注入层的底部连接到两个n型伪埋层。 两个伪埋层通过注入到围绕收集器有源区的浅沟槽的底部而形成。 通过深沟槽接触通过两个伪埋层之上的场氧化物拾取两个集电极。 本发明可以减少结电容,降低集电极输出电阻,提高器件频率特性。