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1. 发明授权

US5921125A Control method of terminal crimping device 失效
标题翻译：端子压接装置的控制方法
公开(公告)号：US5921125A
公开(公告)日：1999-07-13
申请号：US871950
申请日：1997-06-10
申请人： Toshihiro Inoue , Tatsuya Maeda , Mitsuru Yoshikawa , Chiaki Hatano , Yukinori Takano
发明人： Toshihiro Inoue , Tatsuya Maeda , Mitsuru Yoshikawa , Chiaki Hatano , Yukinori Takano
IPC分类号： B30B1/26 , B30B15/14 , H01R43/048 , B21B37/00
CPC分类号： H01R43/0488 , B30B1/266 , B30B15/14 , Y10T29/53022 , Y10T29/53235
摘要： A method of controlling a terminal press attaching device by providing a elevating crimper for crimping terminals onto exposed conductors of the cables, setting an anvil opposite to the crimper, and elevating the drive means including a servo motor. More specifically, the crimp height for press attached terminals is monitored, a detected height and the predetermined set value are compared to control said drive means such that the detected height is made equal to the set value. Thus, the crimp height of the terminal to be attached (or the crimper height) is automatically and easily adjusted.
摘要翻译：一种通过提供用于将端子压接在电缆的裸露导体上的升降压接器来设置端子压接装置的方法，设置与压接器相对的砧座，以及升高包括伺服电动机的驱动装置。更具体地，监视压接附接端子的压接高度，将检测到的高度和预定设定值进行比较以控制所述驱动装置，使得检测到的高度等于设定值。因此，可以自动且容易地调节要安装的端子的压接高度（或压接器高度）。

2. 发明授权

US5901440A Control method of terminal crimping device 失效
标题翻译：端子压接装置的控制方法
公开(公告)号：US5901440A
公开(公告)日：1999-05-11
申请号：US872147
申请日：1997-06-10
申请人： Tatsuya Maeda , Chiaki Hatano
发明人： Tatsuya Maeda , Chiaki Hatano
IPC分类号： G01R31/04 , B30B15/14 , B30B15/28 , G08B23/00 , H01R43/048 , H01R43/04
CPC分类号： H01R43/0488 , B30B15/14 , B30B15/281 , Y10T29/49185 , Y10T29/53022 , Y10T29/53213 , Y10T29/53235
摘要： A method of controlling the terminal crimping device is proposed by providing an elevating crimper for crimping terminals onto exposed conductors of cables, positioning an anvil opposite to said crimper, elevating the drive means including a servo motor. The standard value for determining whether or not the crimper height is out of conformity with the standard value, the administration value for administering the crimper height, and the decision value for determining whether or not the crimping performance is good or not on the basis of the crimper height are recorded such that an alarm is issued when the crimper height is out of conformity with said standard value, said administration value, and said decision value at the time of terminal crimping operation.
摘要翻译：提出了一种控制端子压接装置的方法，该方法通过提供用于将端子压接在电缆暴露导体上的升降压接器，定位与所述压接器相对的砧板，升高包括伺服电动机的驱动装置。用于确定卷边机高度是否不符合标准值的标准值，用于施加卷曲机高度的管理值以及用于基于该压接器高度确定卷曲性能是否良好的判定值记录卷边器高度，使得当卷边机高度与端子压接操作时的标准值，所述管理值和所述判定值不一致时发出报警。

3. 发明授权

US5887469A Terminal crimping device 失效
标题翻译：端子压接装置
公开(公告)号：US5887469A
公开(公告)日：1999-03-30
申请号：US901281
申请日：1997-07-29
申请人： Tatsuya Maeda , Chiaki Hatano
发明人： Tatsuya Maeda , Chiaki Hatano
IPC分类号： B30B1/26 , B30B15/14 , H01R43/048 , B21B37/00
CPC分类号： H01R43/0486 , B30B1/266 , B30B15/14 , Y10T29/53022 , Y10T29/53235
摘要： A terminal crimping device includes an elevating crimper for crimping terminals onto exposed conductors of cables and an anvil positioned opposite to said elevating crimper so that the ascend/descend of the crimper is carried out by a servo motor. The terminal crimping device further includes a height sensor for outputting a crimp height at the time of crimping said terminals, a data storage unit for storing a pressing time range for determination on whether or not terminal crimping is normal and a crimper height value for determination of said pressing time; and determining unit for time measuring the time during which an output from said height sensor is not larger than the crimper height and determining that crimping is normal if the measured time is within said pressing time range. Thus, the determination on whether or not the terminal crimping is normal can be surely made.
摘要翻译：端子压接装置包括用于将端子压接在暴露的电缆导体上的升降压接器和与所述升降压接器相对定位的砧座，使得压接器的上升/下降由伺服电动机执行。端子压接装置还包括用于在压接所述端子时输出压接高度的高度传感器，用于存储用于确定端子压接是否正常的按压时间范围的数据存储单元，以及用于确定端子压接装置的压接器高度值说压力时间以及确定单元，用于时间测量来自所述高度传感器的输出不大于所述压接器高度的时间，并且如果所测量的时间在所述按压时间范围内，则确定所述压接正常。因此，可以确定端子压接是否正常的判定。

4. 发明授权

US5966806A Control method of terminal crimping device 失效
标题翻译：端子压接装置的控制方法
公开(公告)号：US5966806A
公开(公告)日：1999-10-19
申请号：US871938
申请日：1997-06-10
申请人： Tatsuya Maeda , Chiaki Hatano
发明人： Tatsuya Maeda , Chiaki Hatano
IPC分类号： G01R31/04 , H01R43/048 , H01R43/04
CPC分类号： B30B15/148 , H01R43/0486 , H01R43/0488 , Y10T29/49174 , Y10T29/49181 , Y10T29/49185
摘要： A terminal crimping device is composed of an elevating crimper for crimping terminals onto the exposed conductors of cables and an anvil positioned opposite said crimper. The crimper is caused to ascend and descend by means of drive means including a servo motor. The controlling of the terminal crimping operation is done by monitoring the height of the crimper at the time of terminal crimping and the load applied to said drive means and comparing a detected load to the height with the preset reference data to determine whether the terminal crimping performance is good or not. Thus, a reliable determination whether the terminal crimping performance is good or not is performed.
摘要翻译：端子压接装置由用于将端子压接到暴露的电缆导体上的升降压接器和与所述压接器相对定位的砧座组成。通过包括伺服电机的驱动装置使卷边机上升和下降。端子压接操作的控制是通过在端子压接时监测压接器的高度和施加到所述驱动装置的负载并将检测到的负载与高度与预设的参考数据进行比较来确定端子压接性能是否好。因此，可以确定端子压接性能是否良好。

5. 发明授权

US08124934B2 Scanning electron microscope 有权
标题翻译：扫描电子显微镜
公开(公告)号：US08124934B2
公开(公告)日：2012-02-28
申请号：US12264605
申请日：2008-11-04
申请人： Tatsuya Maeda
发明人： Tatsuya Maeda
IPC分类号： G01N23/00
CPC分类号： H04N5/76 , H01J37/265 , H01J37/28 , H01J2237/2487 , H01J2237/2817 , H04N5/772 , H04N5/775 , H04N5/781 , H04N5/907 , H04N9/8205
摘要： It is facilitated in a scanning electron microscope to save the labor of executing the reproduction test, conduct basic analysis on a problem caused in execution of the automatic observation process, and confirm details resulting in the error. Upon detecting an error from an abnormality, the scanning electron microscope extracts a sample image lm(t2) obtained by retroceding from a sample image lm(te) stored so as to be associated with time te of error occurrence by a predetermined video quantity (for example, total recording time period t2) previously set and registered by an input-output device, from sample images stored in a recording device while being overwritten, and stores a resultant sample image in another recording device.
摘要翻译：在扫描电子显微镜中便于执行再现测试的劳动，对执行自动观察过程所引起的问题进行基本分析，并确认导致错误的细节。扫描电子显微镜从检测到异常的误差时，提取通过从存储的与样品图像lm（te）相反的获得的样本图像lm（t2），以使与出现错误的时间t相关联的预定视频量（对于例如，由输入 - 输出设备预先设置和登记的总记录时间段t2）从存储在记录设备中的样本图像被重写，并将所得到的样本图像存储在另一个记录设备中。

6. 发明授权

US07807980B2 Charged particle beam apparatus and methods for capturing images using the same 有权
标题翻译：带电粒子束装置及使用该装置拍摄图像的方法
公开(公告)号：US07807980B2
公开(公告)日：2010-10-05
申请号：US11647348
申请日：2006-12-29
申请人： Chie Shishido , Mayuka Oosaki , Mitsugu Sato , Hiroki Kawada , Tatsuya Maeda
发明人： Chie Shishido , Mayuka Oosaki , Mitsugu Sato , Hiroki Kawada , Tatsuya Maeda
IPC分类号： G21K7/00 , A61N5/00 , G21G5/00
CPC分类号： H01J37/263 , H01J37/265 , H01J37/28 , H01J2237/2826
摘要： The present invention provides a charged particle beam apparatus used to measure micro-dimensions (CD value) of a semiconductor apparatus or the like which captures images for measurement. For the present invention, a sample for calibration, on which a plurality of polyhedral structural objects with known angles on surfaces produced by the crystal anisotropic etching technology are arranged in a viewing field, is used. A beam landing angle at each position within a viewing field is calculated based on geometric deformation on an image of each polyhedral structural object. Beam control parameters for equalizing the beam landing angle at each position within the viewing field are pre-registered. The registered beam control parameters are applied according to the position of the pattern to be measured within the viewing field when performing dimensional measurement. Accordingly, the present invention provides methods for reducing the variation in the CD value caused by the variation in the electron beam landing angle with respect to the sample with an equal beam landing angle and methods for reducing the instrumental error caused by the difference in the electron beam landing angle between apparatuses.
摘要翻译：本发明提供一种用于测量捕获用于测量的图像的半导体装置等的微尺寸（CD值）的带电粒子束装置。对于本发明，使用用于校准的样品，其上在视场中排列有通过晶体各向异性蚀刻技术产生的表面上具有已知角度的多个多面体结构物体。基于每个多面体结构物体的图像上的几何变形来计算视野内的每个位置处的束着陆角。用于均衡视场内每个位置的束着陆角的光束控制参数被预先注册。当进行尺寸测量时，根据待测图案的位置在观察区域中应用登记的光束控制参数。因此，本发明提供了减少相对于具有相同束着陆角的样品的电子束着角的变化引起的CD值的变化的方法，以及用于减少由电子差异引起的仪器误差的方法设备之间的束着陆角度。

7. 发明申请

US20090032693A1 Scanning Electron Microscope Alignment Method and Scanning Electron Microscope 有权
标题翻译：扫描电子显微镜对准方法和扫描电子显微镜
公开(公告)号：US20090032693A1
公开(公告)日：2009-02-05
申请号：US12182704
申请日：2008-07-30
申请人： Junichi Kakuta , Kazuhiro Ueda , Tatsuya Maeda , Hiroyuki Saito , Katsuhiro Sasada
发明人： Junichi Kakuta , Kazuhiro Ueda , Tatsuya Maeda , Hiroyuki Saito , Katsuhiro Sasada
IPC分类号： G01D18/00 , G01N23/00
CPC分类号： G01N23/225 , H01J37/1471 , H01J37/153 , H01J37/28 , H01J2237/1501 , H01J2237/1532
摘要： The present invention aims to provide an axis alignment method, astigmatism correction method and SEM for implementing these methods, which can prevent an alignment or correction error attributable to conditions of a specimen. A first aspect is to obtain the difference between the optimal values acquired from an automatic axis alignment result on a standard sample and from each of automatic axis alignment results on a observation target sample, and to correct an optimal value adjusted using the standard sample by use of the difference thus obtained. A second aspect is to acquire an optimal stigmator value (astigmatism correction signal) by using the standard sample, to store the optimal stigmator value as a default value, to add the optimal stigmator value and the default value depending on the height of an observation target sample pattern, and to perform an astigmatism correction on the basis of the resultant stigmator value.
摘要翻译：本发明旨在提供一种用于实现这些方法的轴对准方法，像散校正方法和SEM，其可以防止由于样品的条件引起的对准或校正误差。第一方面是获得从标准样品的自动轴对准结果获取的最佳值与观察目标样品上的自动轴对准结果中的每一种之间的差异，并且通过使用校正使用标准样品调整的最佳值的差异。第二方面是通过使用标准样本来获取最佳标称值（像散校正信号），以将最佳标称值作为默认值来存储，以根据观察目标的高度添加最优标示符值和默认值样本图案，并且基于得到的标记值进行散光校正。

8. 发明申请

US20060290716A1 Program creation apparatus, program creation method and program 有权
公开(公告)号：US20060290716A1
公开(公告)日：2006-12-28
申请号：US11446287
申请日：2006-06-05
申请人： Takahisa Gunji , Tatsuya Maeda
发明人： Takahisa Gunji , Tatsuya Maeda
IPC分类号： G09G5/00
CPC分类号： G06F8/38 , G06F8/34
摘要： A program creation apparatus creates a program for a microcomputer that includes an input section, a processor and an output section. The apparatus includes a GUI display section displaying a plurality of icons, each corresponding to each operation of the input section, the processor and the output section, and a program creator creating a program according to manipulation of the icons by a user.

9. 发明授权

US07006681B2 Inspection method of electrical part, inspection apparatus of electric junction box and inspection apparatus of terminal fittings 失效
公开(公告)号：US07006681B2
公开(公告)日：2006-02-28
申请号：US09963710
申请日：2001-09-27
申请人： Tatsuya Maeda , Shigenori Miyawaki
发明人： Tatsuya Maeda , Shigenori Miyawaki
IPC分类号： G06K9/00
CPC分类号： G06T7/0004 , G01N21/8851 , G06T2207/30148
摘要： An inspection apparatus of an electric junction box is provided, by which improper mounting of electric parts can be detected. The inspection apparatus 1 has a CCD camera 5, an image-processing device 7 and a control device 8. The CCD camera picks up images of fuse 14 in the electric junction box 12 as a subject of the inspection. The image-processing device 7 stores an image consulting data 60. The image consulting data 60 includes a plurality of images of each fuse 14 having the same item symbol with regard to every item symbol, the fuses 14 being used in the electric junction box 12. The control device 8 stores normal data indicating the proper item symbol of the fuse 14 to be mounted on a corresponding mount 13. The image-processing device 7 extracts the image most analogous to the image picked up by the CCD camera 5 from the images in the image consulting data. The control device 8 judge the quality of the item symbol of the fuse 14 having the most analogous image on the basis of the normal data.

10. 发明申请

US20050189501A1 Charged particle system and a method for measuring image magnification 有权
标题翻译：带电粒子系统和测量图像放大倍数的方法
公开(公告)号：US20050189501A1
公开(公告)日：2005-09-01
申请号：US11038478
申请日：2005-01-21
申请人： Mitsugu Sato , Atsushi Takane , Shigeto Isakozawa , Takashi Iizumi , Tatsuya Maeda , Hiromi Inada
发明人： Mitsugu Sato , Atsushi Takane , Shigeto Isakozawa , Takashi Iizumi , Tatsuya Maeda , Hiromi Inada
IPC分类号： G21K5/00 , G03F7/20 , G21K5/04 , H01J37/08 , H01J37/22 , H01J37/256 , H01J37/28 , H01L21/027 , H01L21/66
CPC分类号： H01J37/28 , H01J2237/2826
摘要： A charged particle beam apparatus capable of automatically measuring an image magnification error of an apparatus and capable of automatically calibrating the image magnification in high precision is provided. To this end, while an image processing operation of either an auto-correlation function or an FFT transformation is employed with respect to a scanning image of a reference material having a periodic structure, the averaged pitch dimension of which is known, averaged periodic information owned by the scanning image is detected so as to measure an image magnification error of the apparatus. Also, the information as to the acquired image magnification error is fed back to an image magnification control means of the apparatus so as to automatically execute a calibration as to the image magnification in high precision.
摘要翻译：提供一种能够自动测量装置的图像放大误差并且能够以高精度自动校准图像放大率的带电粒子束装置。为此，当对具有周期性结构的参考材料的扫描图像采用自相关函数或FFT变换的图像处理操作时，其平均间距尺寸已知，所拥有的平均周期信息检测扫描图像以测量装置的图像放大误差。此外，关于获取的图像放大误差的信息被反馈到装置的图像倍率控制装置，以便以高精度自动执行关于图像放大的校准。

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