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    • 6. 发明授权
    • Resist composition, and method of forming resist pattern
    • 抗蚀剂组合物和形成抗蚀剂图案的方法
    • US08658343B2
    • 2014-02-25
    • US13373965
    • 2011-12-05
    • Masatoshi AraiJunichi TsuchiyaDaiju ShionoTomoyuki HiranoDaichi Takaki
    • Masatoshi AraiJunichi TsuchiyaDaiju ShionoTomoyuki HiranoDaichi Takaki
    • G03F7/004G03F7/039
    • G03F7/0045G03F7/0382G03F7/0397G03F7/2041
    • A resist composition including a base component (A) which exhibits changed solubility in a developing solution under the action of acid, and an acid generator component (B) which generates acid upon exposure, wherein the base component (A) contains a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In formula (a5-1), R represents a hydrogen atom, an alkyl group or a halogenated alkyl group, X represents single bond or divalent linking group, W represents a cyclic alkylene group which may include an oxygen atom at arbitrary position, each of Ra and Rb independently represents a hydrogen atom or an alkyl group which may include an oxygen atom at arbitrary position, or alternatively, Ra and Rb may be bonded to each other to form a ring together with the nitrogen atom in the formula, and p represents integer of 1 to 3.
    • 一种抗蚀剂组合物,其包含在酸的作用下在显影溶液中显示出改变的溶解性的碱成分(A)和曝光时产生酸的酸产生剂成分(B),其中,所述碱成分(A)含有高分子化合物 A1)具有由通式(a5-1)表示的结构单元(a5)。 式(a5-1)中,R表示氢原子,烷基或卤代烷基,X表示单键或二价连接基,W表示可以在任意位置含有氧原子的环状亚烷基, Ra和Rb独立地表示氢原子或可以在任意位置包含氧原子的烷基,或者Ra和Rb可以与式中的氮原子一起形成环,p表示 1〜3的整数。