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1. 发明申请

US20060257015A1 Board inspection apparatus and method and apparatus for setting inspection logic thereof 有权
标题翻译：板检查装置及其检查逻辑的设置方法和装置
公开(公告)号：US20060257015A1
公开(公告)日：2006-11-16
申请号：US11377938
申请日：2006-03-16
申请人： Takatoshi Katahata , Hirotaka Wada , Toshihiro Moriya , Atsushi Shimizu , Akira Nakajima
发明人： Takatoshi Katahata , Hirotaka Wada , Toshihiro Moriya , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/30141 , G06T2207/30148 , G06T2207/30152
摘要： image In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.
摘要翻译：图像在产生新分量的检验逻辑时，获得新分量的图像，计算出新分量聚焦区域选定特征的趋势数据; 通过将新组件的趋势数据与先前检查的组件的趋势数据进行比较来选择具有与新组件类似的特征的先前检查的组件，从存储设备读取所选（先前检查）组件的图像，并且使用新组件的图像和先前检查的组件的图像作为教学数据来生成新组件的检查逻辑。

2. 发明授权

US07720274B2 Board inspection apparatus and method and apparatus for setting inspection logic thereof 有权
标题翻译：板检查装置及其检查逻辑的设置方法和装置
公开(公告)号：US07720274B2
公开(公告)日：2010-05-18
申请号：US11377938
申请日：2006-03-16
申请人： Takatoshi Katahata , Hirotaka Wada , Toshihiro Moriya , Atsushi Shimizu , Akira Nakajima
发明人： Takatoshi Katahata , Hirotaka Wada , Toshihiro Moriya , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/30141 , G06T2207/30148 , G06T2207/30152
摘要： In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.
摘要翻译：在生成新分量的检验逻辑时，获得新分量的图像，计算出新分量聚焦区域选定特征的趋势数据; 通过将新组件的趋势数据与先前检查的组件的趋势数据进行比较来选择具有与新组件类似的特征的先前检查的组件，从存储设备读取所选（先前检查）组件的图像，并且使用新组件的图像和先前检查的组件的图像作为教学数据来生成新组件的检查逻辑。

3. 发明申请

US20060204074A1 PC board inspecting method and apparatus and inspection logic setting method and apparatus 有权
标题翻译： PC板检查方法及装置及检查逻辑设定方法及装置
公开(公告)号：US20060204074A1
公开(公告)日：2006-09-14
申请号：US11358914
申请日：2006-02-21
申请人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
发明人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： H05K13/08
摘要： A PC board inspecting method capable of detecting deviation of an IC component at high speed with small storage capacity utilizes inspection logic particular to a component to be inspected. The inspection logic includes a color condition for specifying a color appearing in the body of the component to be inspected. The component is radiated with a plurality of color rays at different angles of incidence. An image formed by reflection light of the color rays is captured, and an inspection image including at least part of an edge of the body of the component to be inspected is captured. By using the color condition, a component body area satisfying the color condition is extracted from the inspection image by an image process.
摘要翻译：能够以小的存储容量检测IC组件在高速下的偏差的PC板检查方法利用要检查的部件特有的检查逻辑。检查逻辑包括用于指定出现在要检查的部件的主体中的颜色的颜色条件。该组件以不同入射角的多根彩色光线照射。捕获由彩色光线的反射光形成的图像，并且捕获包括要检查的部件的主体的边缘的至少一部分的检查图像。通过使用颜色条件，通过图像处理从检查图像中提取满足色彩条件的部件体区域。

4. 发明申请

US20060153439A1 PC board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatus 审中-公开
标题翻译： PC板检查装置，检查逻辑设定方法以及检查逻辑设定装置
公开(公告)号：US20060153439A1
公开(公告)日：2006-07-13
申请号：US11329432
申请日：2006-01-11
申请人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
发明人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： G01R31/048 , G01N21/95684
摘要： A technology is provided for automatically producing an inspection logic to be used in the action of inspecting a PC board. An inspection logic setting apparatus is arranged for acquiring a plurality of first images of components to be detected by the inspection and a plurality of second images of components to be rejected by the inspection, dividing each first and second images into the plurality of blocks, calculating a color distance between the plurality of first images and the plurality of second images in each block, selecting one or more blocks from the plurality of blocks which are relatively greater in the color distance, and assigning the selected block(s) to an area condition.
摘要翻译：提供了一种技术，用于自动产生在检查PC板的动作中使用的检查逻辑。一种检查逻辑设置装置，用于通过检查获取待检测的成分的多个第一图像以及通过检查要被拒绝的成分的多个第二图像，将每个第一和第二图像划分成多个块，计算在每个块中的多个第一图像和多个第二图像之间的颜色距离，从多个颜色距离相对较大的多个块中选择一个或多个块，并将所选择的块分配给区域条件。

5. 发明授权

US07822261B2 Board inspecting apparatus, its parameter setting method and parameter setting apparatus 有权
标题翻译：板检测装置，其参数设定方法和参数设定装置
公开(公告)号：US07822261B2
公开(公告)日：2010-10-26
申请号：US11472508
申请日：2006-06-21
申请人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
发明人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/0004 , G06T2207/30141
摘要： For each teaching image, a plurality of patterns of color pickup regions each include a first region for picking up a color of a first part and a second region for picking up a color of a second part are set, the color of each pixel in the first region and the color of each pixel in the second region are mapped as a target point and an exclusion point respectively, to a color space for each of the patterns of the color pickup regions, a degree in separation between a target point distribution and an exclusion point distribution in the color space is calculated for each of the patterns of the color pickup regions, a pattern of a color pickup region having a maximum degree in separation is selected, a color range which divides the color space and has the largest difference between the number of target points and the number of exclusion points in the selected pattern therein is found, and the found color range is set as a color condition used in a board inspecting process.
摘要翻译：对于每个示教图像，多个图案的颜色拾取区域各自包括用于拾取第一部分的颜色的第一区域和用于拾取第二部分的颜色的第二区域，每个像素的颜色在第一区域和第二区域中的每个像素的颜色分别作为目标点和排除点映射到颜色拾取区域的每个图案的颜色空间，目标点分布和针对颜色拾取区域的每个图案计算颜色空间中的排除点分布，选择具有最大分离度的颜色拾取区域的图案，分割颜色空间并且具有最大差异的颜色范围找到所选择的图案中的目标点的数量和排除点的数量，并且将所发现的颜色范围设置为在板检查处理中使用的颜色条件。

6. 发明授权

US07715616B2 PC board inspecting method and apparatus and inspection logic setting method and apparatus 有权
标题翻译： PC板检查方法及装置及检查逻辑设定方法及装置
公开(公告)号：US07715616B2
公开(公告)日：2010-05-11
申请号：US11358914
申请日：2006-02-21
申请人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
发明人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： H05K13/08
摘要： A PC board inspecting method capable of detecting deviation of an IC component at high speed with small storage capacity utilizes inspection logic particular to a component to be inspected. The inspection logic includes a color condition for specifying a color appearing in the body of the component to be inspected. The component is radiated with a plurality of color rays at different angles of incidence. An image formed by reflection light of the color rays is captured, and an inspection image including at least part of an edge of the body of the component to be inspected is captured. By using the color condition, a component body area satisfying the color condition is extracted from the inspection image by an image process.
摘要翻译：能够以小的存储容量检测IC组件在高速下的偏差的PC板检查方法利用要检查的部件特有的检查逻辑。检查逻辑包括用于指定出现在要检查的部件的主体中的颜色的颜色条件。该组件以不同入射角的多根彩色光线照射。捕获由彩色光线的反射光形成的图像，并且捕获包括要检查的部件的主体的边缘的至少一部分的检查图像。通过使用颜色条件，通过图像处理从检查图像中提取满足色彩条件的部件体区域。

7. 发明申请

US20060291713A1 Board inspecting apparatus, its parameter setting method and parameter setting apparatus 有权
标题翻译：板检测装置，其参数设定方法和参数设定装置
公开(公告)号：US20060291713A1
公开(公告)日：2006-12-28
申请号：US11472508
申请日：2006-06-21
申请人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
发明人： Toshihiro Moriya , Hirotaka Wada , Takako Onishi , Atsushi Shimizu , Akira Nakajima
IPC分类号： G06K9/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/0004 , G06T2207/30141
摘要： For each teaching image, a plurality of patterns of color pickup regions each include a first region for picking up a color of a first part and a second region for picking up a color of a second part are set, the color of each pixel in the first region and the color of each pixel in the second region are mapped as a target point and an exclusion point respectively, to a color space for each of the patterns of the color pickup regions, a degree in separation between a target point distribution and an exclusion point distribution in the color space is calculated for each of the patterns of the color pickup regions, a pattern of a color pickup region having a maximum degree in separation is selected, a color range which divides the color space and has the largest difference between the number of target points and the number of exclusion points in the selected pattern therein is found, and the found color range is set as a color condition used in a board inspecting process.
摘要翻译：对于每个示教图像，多个图案的颜色拾取区域各自包括用于拾取第一部分的颜色的第一区域和用于拾取第二部分的颜色的第二区域，每个像素的颜色在第一区域和第二区域中的每个像素的颜色分别作为目标点和排除点映射到颜色拾取区域的每个图案的颜色空间，目标点分布和针对颜色拾取区域的每个图案计算颜色空间中的排除点分布，选择具有最大分离度的颜色拾取区域的图案，分割颜色空间并且具有最大差异的颜色范围找到所选择的图案中的目标点的数量和排除点的数量，并且将所发现的颜色范围设置为在板检查处理中使用的颜色条件。

8. 发明授权

US5070147A Graft copolymers effective as additives to unsaturated polyester resins 失效
标题翻译：有效地作为不饱和聚酯树脂添加剂的共聚物
公开(公告)号：US5070147A
公开(公告)日：1991-12-03
申请号：US400479
申请日：1989-08-30
申请人： Tatsuhiko Ozaki , Hirotaka Wada , Fumitoshi Sugiura
发明人： Tatsuhiko Ozaki , Hirotaka Wada , Fumitoshi Sugiura
IPC分类号： C08F283/02 , C08F283/01 , C08F290/00 , C08F290/06 , C08F293/00 , C08F299/04 , C08G63/08 , C08L67/06
CPC分类号： C08F299/0485
摘要： A graft copolymer, which is effective as an additive to unsaturated polyester resins, contains 10-80 weight % of a macromonomer of a specified kind, 20-89.9 weight % of a vinyl monomer of another specified kind, and 0.1-5 weight % of vinyl monomers of still other kinds. If necessary, up to 40 weight % of still another constituent of a specified kind may be contained.

9. 发明授权

US5364903A Molded products for molding compositions containing thermalsetting (meth)acrylate liquid resins 失效
标题翻译：含有热固性（甲基）丙烯酸酯液体树脂的成型组合物的成型产品
公开(公告)号：US5364903A
公开(公告)日：1994-11-15
申请号：US930975
申请日：1992-08-14
申请人： Yuji Takayama , Hirotaka Wada , Iwao Komiya
发明人： Yuji Takayama , Hirotaka Wada , Iwao Komiya
IPC分类号： C08F220/36 , C08G18/81 , C08K3/22 , C08F220/26
CPC分类号： C08G18/8116 , C08F220/36
摘要： Thermosetting (meth)acrylate molding liquid resin consisting of a specified type of unsaturated oligourethane and alkyl (meth)acrylate within a specified range of ratio. Such a specified type of unsaturated oligourethane may be obtained by reaction between 2-isocyanatoalkyl (meth)acrylate and polyhydric alcohol or by reacting 2-isocyanatoalkyl (meth)acrylate with polyhydric alcohol at molar ratio of functional groups NCO/OH between 1.1 and 1.6 to form a urethane compound and reacting hydroxyalkyl (meth)acrylate with a residual portion of 2-isocyanatoalkyl (meth)acrylate at molar ratio of functional groups OH/NCO between 1.0 and 1.5. This invention also includes molding compositions containing such liquid resin and a specified type of inorganic filler and/or a certain type of thermoplastic high molecular compound as well as molded objects obtained by curing such compositions in a mold.
摘要翻译：由指定类型的不饱和低聚氨酯和（甲基）丙烯酸烷基酯组成的热固性（甲基）丙烯酸酯成型液体树脂在指定的比例范围内。这种特定类型的不饱和低聚氨酯可以通过（甲基）丙烯酸2-异氰酸烷基酯与多元醇反应或通过使异氰酸烷基（甲基）丙烯酸酯与多元醇与官能团NCO / OH的摩尔比在1.1和1.6之间反应获得，形成氨基甲酸酯化合物，并使（甲基）丙烯酸羟烷基酯与官能团OH / NCO的摩尔比在1.0和1.5之间的残留部分的（甲基）丙烯酸-2-异氰酸烷基酯反应。本发明还包括含有这种液体树脂和特定类型的无机填料和/或某种类型的热塑性高分子化合物的模塑组合物以及通过在模具中固化这种组合物而获得的模制物品。

10. 发明授权

US5331041A Polymerizable compositions and in-mold cured products using same 失效
标题翻译：可聚合组合物和使用其的模内固化产物
公开(公告)号：US5331041A
公开(公告)日：1994-07-19
申请号：US52634
申请日：1993-04-22
申请人： Yuji Takayama , Hirokazu Matsueda , Masato Sugiura , Tatsuhiko Ozaki , Hirotaka Wada , Toshiharu Suzuki
发明人： Yuji Takayama , Hirokazu Matsueda , Masato Sugiura , Tatsuhiko Ozaki , Hirotaka Wada , Toshiharu Suzuki
IPC分类号： B29C39/00 , B29K75/00 , B29K105/16 , C08F20/34 , C08F220/36 , C08F290/00 , C08F299/06 , C08G18/67 , C08J5/04 , C08L75/00 , C08L75/14 , C09D4/00 , C08J3/02 , C08K3/00 , C08L39/00 , C08L51/00
CPC分类号： C08G18/672 , C08F220/36 , C09D4/00 , Y10S525/92
摘要： A polymerizable composition contains unsaturated urethane shown by Formula (1) given below, vinyl monomer which is copolymerizable with this unsaturated urethane, and an inorganic powder filler at weight ratio of (unsaturated urethane)/(vinyl monomer)=10/90-90/10, the inorganic powder filler being 30-300 weight parts with respect to 100 weight parts of the sum of the unsaturated urethane and vinyl monomer: ##STR1## where R.sup.1 is hydrogen atom or methyl group; X is a residual group obtained by removing isocyanate groups from diisocyanate; Y is a residual group obtained by removing hydroxyl groups from non-radical polymerizable di-ol or tri-ol of a specified kind; Z is an organic group in the form of (R.sup.2 O).sub.m or R.sup.3 O, R.sup.2 being an alkylene group with 2-4 carbon atoms, R.sup.3 being an alkylene group with 2-12 carbon atoms, and m being an integer 2-10; and n is 2 or 3.
摘要翻译：聚合性组合物含有下述式（1）所示的不饱和氨基甲酸酯，可与该不饱和氨基甲酸酯共聚的乙烯基单体和重量比为（不饱和氨基甲酸酯）/（乙烯基单体）= 10/90〜90 / 如图10所示，无机粉末填料相对于不饱和聚氨酯和乙烯基单体的总和的100重量份为30-300重量份：其中R 1是氢原子或甲基; X是通过从二异氰酸酯中除去异氰酸酯基而获得的残基; Y是通过从特定种类的不可自由基聚合的二醇或三醇中除去羟基获得的残基; Z是（R 2 O）m或R 3 O的形式的有机基团，R 2是具有2-4个碳原子的亚烷基，R 3是具有2-12个碳原子的亚烷基，m是整数2-10; n为2或3。

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