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    • 3. 发明申请
    • Inventory control system and method
    • 库存控制系统和方法
    • US20060089867A1
    • 2006-04-27
    • US11255151
    • 2005-10-21
    • Toshiyuki SakumaTomoyuki AokiYuichi Kaneko
    • Toshiyuki SakumaTomoyuki AokiYuichi Kaneko
    • G06Q99/00G05B19/418
    • G06Q10/087Y02P90/18
    • The invention suppresses stock excess or deficiency of circulation items through a life cycle of the circulation items. In an inventory control system, an information processing device calculates an index (KPI) which shows a current phase of a circulation item from actual data of the circulation item, at predetermined timing (S1101) . After that, the information processing device compares a shift condition stored in a code storage area with KPI, and in case that KPI satisfies the shift condition, it judges that a phase of the circulation item is changed (S1103). Here, when a user inputs renewal permission of safety stock quantity of circulation item (S1104), the information processing device calculates safety stock quantity of circulation items in the shifted phase (S1107).
    • 本发明通过流通物品的生命周期来抑制流通物品的库存过量或不足。 在库存控制系统中,信息处理装置在规定的定时,根据循环项目的实际数据,计算出显示循环项目的当前阶段的指标(KPI)(S 1101)。 之后,信息处理装置将存储在代码存储区域中的移位条件与KPI进行比较,并且在KPI满足移位条件的情况下,判断循环项目的相位改变(S101)。 这里,当用户输入循环项目的安全库存量的更新许可时(S1104),信息处理装置计算移动阶段的循环项目的安全库存量(S 1107)。
    • 8. 发明授权
    • Method of manufacturing a semiconductor device and substrate carrier structure
    • 制造半导体器件和衬底载体结构的方法
    • US08216919B2
    • 2012-07-10
    • US13009673
    • 2011-01-19
    • Yuichi Kaneko
    • Yuichi Kaneko
    • H01L21/263
    • H01L21/6835H01L2221/68313H01L2221/6835
    • A substrate carrier structure includes a tray and a secondary electron absorbing material. The tray holds a semiconductor substrate having a first surface on which semiconductor device elements are formed. The secondary electron absorbing material is interposed between the tray and this first surface of the semiconductor substrate. When the semiconductor substrate is irradiated with charged particles to form lattice defects, the secondary electron absorbing material prevents unwanted trapping of secondary electrons emitted from the tray, and thereby reduces the variability of electrical characteristics of semiconductor device elements formed on the semiconductor substrate.
    • 衬底载体结构包括托盘和二次电子吸收材料。 托盘保持具有形成半导体器件元件的第一表面的半导体衬底。 二次电子吸收材料介于托盘和半导体衬底的第一表面之间。 当半导体衬底被带电粒子照射以形成晶格缺陷时,二次电子吸收材料防止从托盘发射的二次电子的不期望的捕获,从而减少形成在半导体衬底上的半导体器件元件的电特性的变化。