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1. 发明授权

US5814815A Phase-contrast electron microscope and phase plate therefor 失效
标题翻译：相差电子显微镜及相位板
公开(公告)号：US5814815A
公开(公告)日：1998-09-29
申请号：US768355
申请日：1996-12-17
申请人： Takao Matsumoto , Nobuyuki Osakabe , Akira Tonomura
发明人： Takao Matsumoto , Nobuyuki Osakabe , Akira Tonomura
IPC分类号： H01J37/26
CPC分类号： H01J37/263 , H01J37/26 , H01J2237/1514 , H01J2237/226 , H01J2237/2614
摘要： An electrostatic potential in a vacuum in the vicinity of a focused electron beam of a direct wave formed on an optical axis of a back focal plane of an objective lens used in an electron microscope can be externally controlled. Therefore, the electrostatic potential is controlled by supplying an electric potential to a ring-shaped electrode from the outside. The outer sides of the electrode are interposed between both of insulators and conductors so as to shield the electrostatic potential against the outer side of a ring, whereby a phase shift is supplied only to an electron beam that passes through the inside of the ring. A phase-contrast electron microscope can be realized which includes a phase plate corresponding to an electron beam, which is capable of observing a phase object with contrast.
摘要翻译：在电子显微镜中使用的物镜的后焦平面的光轴上形成的直接波的聚焦电子束附近的真空中的静电电位可以被外部控制。因此，通过从外部向环形电极提供电位来控制静电势。电极的外侧被插入在两个绝缘体和导体之间，以便将静电电位屏蔽在环的外侧，由此相对于通过环的内部的电子束被提供。可以实现相位对比电子显微镜，其包括对应于电子束的相位板，其能够观察相对物体的对比度。

2. 发明授权

US4935625A Electron holography apparatus 失效
标题翻译：电子全息设备
公开(公告)号：US4935625A
公开(公告)日：1990-06-19
申请号：US238143
申请日：1988-08-30
申请人： Shuji Hasegawa , Junji Endo , Nobuyuki Osakabe , Akira Tonomura
发明人： Shuji Hasegawa , Junji Endo , Nobuyuki Osakabe , Akira Tonomura
IPC分类号： G01Q30/02 , G03H5/00 , H01J37/04 , H01J37/22 , H01J37/26
CPC分类号： H01J37/26 , G03H5/00 , H01J2237/1514 , H01J2237/228 , H01J2237/2614
摘要： An electron holography apparatus includes an electron microscope which is provided with an electron source, a beam splitter for dividing an electron beam emitted from the electron source into first and second electron beams, and a phase controller for controllably changing a phase difference between the first and second electron beams, and further includes an image detector for detecting an electron interference fringe pattern which varies in accordance with the phase difference between the first and second electron beams, as a picture image, and an image data processor for determining the phase distribution of one of the first and second electron beams from detected image data.
摘要翻译：一种电子全息摄影装置，具备：具有电子源的电子显微镜，将从电子源射出的电子束分割成第一和第二电子束的分束器，以及相位控制器，用于可控地改变第一和第二电子束之间的相位差第二电子束，还包括用于检测根据第一和第二电子束之间的相位差而变化的电子干涉条纹图案作为图像图像的图像检测器，以及用于确定第一和第二电子束的相位分布的图像数据处理器的来自检测到的图像数据的第一和第二电子束。

3. 发明授权

US4642461A Field emission type electron microscope using a multi-stage acceleration tube 失效
标题翻译：场发射型电子显微镜采用多级加速管
公开(公告)号：US4642461A
公开(公告)日：1987-02-10
申请号：US676313
申请日：1984-11-29
申请人： Junji Endo , Akira Tonomura , Susumu Ozasa , Tsuyoshi Matsuda , Chikara Kimura , Nobuyuki Osakabe
发明人： Junji Endo , Akira Tonomura , Susumu Ozasa , Tsuyoshi Matsuda , Chikara Kimura , Nobuyuki Osakabe
IPC分类号： H01J37/06 , H01J37/073 , H01J37/248 , H01J37/26 , G01N23/00
CPC分类号： H01J37/073
摘要： A field emission type electron microscope using a multi-stage acceleration tube wherein an acceleration voltage to be applied to at least one, always inclusive of a first-stage acceleration electrode, of acceleration electrodes is changed in interlocked relationship with a change in a field emission voltage to be applied to a field emission electrode, so that power of an electrostatic lens can be kept constant.
摘要翻译：使用多级加速管的场致发射型电子显微镜，其中施加到加速电极的至少一个总是包括第一级加速电极的加速电压与场致发射的变化互锁的关系改变施加到场发射电极的电压，使得静电透镜的功率可以保持恒定。

4. 发明授权

US5192867A Electron optical measurement apparatus 失效
标题翻译：电子光学测量装置
公开(公告)号：US5192867A
公开(公告)日：1993-03-09
申请号：US697576
申请日：1991-05-09
申请人： Nobuyuki Osakabe , Junji Endo , Akira Tonomura , Masahiro Tomita , Tadao Furutsu
发明人： Nobuyuki Osakabe , Junji Endo , Akira Tonomura , Masahiro Tomita , Tadao Furutsu
IPC分类号： H01J37/147 , H01J37/20 , H01J37/26 , H01J37/29
CPC分类号： H01J37/20 , H01J37/147 , H01J37/26 , H01J37/29 , H01J2237/1514 , H01J2237/228 , H01J2237/2614
摘要： In an electron holography apparatus having an electron source, a specimen holder, an electron lens system, and an electron biprism, the electron biprism is so constructed as to be rotatable about the electron optics axis. The rotation angle about the electron optics axis is commanded by the operator of the electron holography apparatus. A central wire of the electron biprism is allowed to be translated in a direction orthogonal to the electron optics axis, thus permitting the application of the fringe scanning method. The center of an aperture is selectively allowed to be aligned with that of the electron biprism to ensure that the measurement apparatus can be used selectively as either the electron holography apparatus or an electron microscope.
摘要翻译：在具有电子源，样本保持器，电子透镜系统和电子双棱镜的电子全息设备中，电子双棱镜被构造成可围绕电子光轴旋转。围绕电子光轴的旋转角度由电子全息设备的操作者命令。允许电子双棱镜的中心线在与电子光轴垂直的方向上平移，从而允许施加边缘扫描方法。选择性地允许孔的中心与电子双棱镜的中心对准，以确保测量装置可以选择性地用作电子全息设备或电子显微镜。

5. 发明授权

US4998788A Reflection electron holography apparatus 失效
标题翻译：反射电子全息设备
公开(公告)号：US4998788A
公开(公告)日：1991-03-12
申请号：US462769
申请日：1990-01-10
申请人： Nobuyuki Osakabe , Akira Tonomura
发明人： Nobuyuki Osakabe , Akira Tonomura
IPC分类号： H01J37/22 , G01Q30/04 , H01J37/28 , H01J37/29
CPC分类号： H01J37/29 , H01J2237/1514
摘要： An apparatus forming a reflection electron hologram, wherein a fraction of an electron wave from an electron source illuminate a specimen and caused to be reflected thereat, the remaining electron wave does not illuminate the specimen, but passes aside, the specimen, and the electron wave reflected from the specimen and the electron wave not illuminating, but passes aside, the specimen, are superimposed one upon the other.

6. 发明授权

US06838675B2 Specimen observation system for applying external magnetic field 失效
标题翻译：应用外部磁场的试样观测系统
公开(公告)号：US06838675B2
公开(公告)日：2005-01-04
申请号：US10450614
申请日：2002-01-18
申请人： Ken Harada , Junji Endo , Nobuyuki Osakabe
发明人： Ken Harada , Junji Endo , Nobuyuki Osakabe
IPC分类号： G01N23/04 , G01N27/83 , G01Q20/02 , G01Q30/20 , G01R33/12 , H01J37/147 , H01J37/20 , H01J37/26 , H01J3/14
CPC分类号： H01J37/26 , H01J37/147
摘要： To prevent the displacement from an optical axis of a charged particle beam from being made independent of the direction (parallel to or perpendicular to the optical axis) of a magnetic field applied to a specimen, a system including an electron microscope and using a charged particle beam optical system is provided with a source of a charged particle beam, a condenser optical system, a specimen to be observed, a system for applying a magnetic field to the specimen, an imaging optical system and an image observation/recording apparatus, is provided with first and second charged particle beam deflection systems in order along a direction in which the charged particle beam travels between the condenser optical system and the specimen, is provided with third and fourth charged particle beam deflection systems in order between the specimen and the imaging lens system, and the quantity and the direction of the deflection of the charged particle beam by each deflection system and the intensity and the bearing of a magnetic field applied to the specimen are related according to predetermined relation.
摘要翻译：为了防止来自带电粒子束的光轴的位移不依赖于施加到样本的磁场的方向（平行于或垂直于光轴），包括电子显微镜并使用带电粒子的系统光束光学系统设置有带电粒子束的源，聚光镜系统，待观察的样本，向样本施加磁场的系统，成像光学系统和图像观察/记录装置第一和第二带电粒子束偏转系统沿着带电粒子束在聚光器光学系统和样本之间行进的方向依次排列，在样本和成像透镜之间依次设置有第三和第四带电粒子束偏转系统系统，以及每个偏转系统和强度的带电粒子束的偏转的数量和方向并且根据预定关系，施加到样本的磁场的轴承相关。

7. 发明授权

US5811805A Charged particle guide apparatus and image viewing apparatus for charged particle microscope using the same 失效
标题翻译：带电粒子引导装置和使用其的带电粒子显微镜的图像观察装置
公开(公告)号：US5811805A
公开(公告)日：1998-09-22
申请号：US702183
申请日：1996-08-23
申请人： Nobuyuki Osakabe , Junji Endo , Tetsuji Kodama , Tsuneyuki Urakami , Hiroshi Tsuchiya , Shinji Ohsuka
发明人： Nobuyuki Osakabe , Junji Endo , Tetsuji Kodama , Tsuneyuki Urakami , Hiroshi Tsuchiya , Shinji Ohsuka
IPC分类号： H01J37/22 , H01J37/244 , H01J37/26
CPC分类号： H01J37/22 , H01J37/244
摘要： An electron-microscope image viewing apparatus capable of measuring of a moving speed or a vibration frequency of an atomic structure, a magnetic structure, an electric structure or the like of a specimen even when the structure changes at a high rate. The apparatus includes a charged particle source for emitting charged particles, an illuminating electron lens system for illuminating a specimen with a beam of the charged particles, an image magnifying/projecting lens system for magnifying an image of the specimen formed by charged particles scattered upon transmission through the specimen and projecting the magnified image onto an image forming plane, at least one charged particle extracting means provided on the image forming plane of the image magnifying/projecting lens system for taking out the charged particles from a predetermined portion of the charged particle beam projected onto the image forming plane, at least one charged particle detector for detecting the charged particles taken out through the charged particle extracting means, and a signal processing means for processing a signal outputted from the charged particle detector.
摘要翻译：即使当结构以高速率变化时，也可以测量试样的原子结构，磁性结构，电结构等的移动速度或振动频率的电子显微镜图像观察装置。该装置包括用于发射带电粒子的带电粒子源，用于用带电粒子束照射样本的照明电子透镜系统，用于放大由透射时散射的带电粒子形成的样本的图像的图像放大/投影透镜系统通过样本并将放大图像投影到图像形成平面上，至少一个带电粒子提取装置，设置在图像放大/投影透镜系统的图像形成平面上，用于从带电粒子束的预定部分中取出带电粒子投影到图像形成平面上的至少一个带电粒子检测器，用于检测通过带电粒子提取装置取出的带电粒子;以及信号处理装置，用于处理从带电粒子检测器输出的信号。

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