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    • 1. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US07933141B2
    • 2011-04-26
    • US12416432
    • 2009-04-01
    • Kazuhiko KajigayaSoichiro YoshidaTomonori SekiguchiRiichiro TakemuraYasutoshi Yamada
    • Kazuhiko KajigayaSoichiro YoshidaTomonori SekiguchiRiichiro TakemuraYasutoshi Yamada
    • G11C11/24
    • G11C5/147G11C7/04G11C11/4076G11C11/4091G11C11/4097
    • In a semiconductor memory device, a memory cell is connected with a local sense amplifier and a global sense amplifier via a local bit line and a global bit line. The local sense amplifier is a single-ended sense amplifier including a single MOS transistor, which detects a potential of the local bit line which varies when reading and writing data with the memory cell. The threshold voltage of the MOS transistor is monitored so as to produce a high-level write voltage and a low-level write voltage, which are corrected and shifted based on the monitoring result so as to properly perform a reload operation on the memory cell by the global local sense amplifier. Thus, it is possible to cancel out temperature-dependent variations of the threshold voltage and shifting of the threshold voltage due to dispersions of manufacturing processes.
    • 在半导体存储器件中,存储单元通过局部位线和全局位线与本地读出放大器和全局读出放大器连接。 本地读出放大器是包括单个MOS晶体管的单端读出放大器,其检测当与存储单元读取和写入数据时变化的局部位线的电位。 监视MOS晶体管的阈值电压,以产生高电平写入电压和低电平写入电压,这些电压根据监视结果进行校正和移位,从而通过以下方式适当地执行对存储器单元的重新加载操作: 全局局部感测放大器。 因此,可以消除阈值电压的温度变化和由于制造工艺的分散造成的阈值电压的偏移。
    • 5. 发明申请
    • Semiconductor device and data processing system
    • 半导体器件和数据处理系统
    • US20110248697A1
    • 2011-10-13
    • US13064683
    • 2011-04-08
    • Kazuhiko KajigayaSoichiro YoshidaYasutoshi Yamada
    • Kazuhiko KajigayaSoichiro YoshidaYasutoshi Yamada
    • G05F3/08
    • G11C5/147G11C7/04G11C11/4091
    • A semiconductor device comprises a first circuit outputting a signal to a first signal line, a first FET applied with a driving signal and having a gate electrode connected to a first node, a second FET controlling an electrical connection between the first signal line and the first node, a third FET amplifying a signal of the first node, a second circuit precharging the first signal line, and a voltage control circuit. A gate capacitance of the first FET is controlled in response to a voltage difference between the first node and the driving signal. The voltage control circuit shifts a potential of the driving signal when the second FET is non-conductive after the signal of the first-circuit is transmitted to the first node, and performs an offset control for the driving signal so as to compensate a variation of a threshold voltage of the first FET.
    • 半导体器件包括将信号输出到第一信号线的第一电路,施加有驱动信号的第一FET并具有连接到第一节点的栅极;第二FET控制第一信号线与第一信号线之间的电连接 放大第一节点的信号的第三FET,对第一信号线预充电的第二电路和电压控制电路。 响应于第一节点和驱动信号之间的电压差来控制第一FET的栅极电容。 在第一电路的信号被发送到第一节点之后,当第二FET不导通时,电压控制电路移动驱动信号的电位,并且对驱动信号进行偏移控制,以补偿 第一FET的阈值电压。
    • 9. 发明授权
    • Sense amplifier circuit and semiconductor device
    • 感应放大器电路和半导体器件
    • US08320208B2
    • 2012-11-27
    • US12882789
    • 2010-09-15
    • Kazuhiko KajigayaSoichiro YoshidaYasutoshi Yamada
    • Kazuhiko KajigayaSoichiro YoshidaYasutoshi Yamada
    • G11C7/02G11C7/00
    • G11C7/06G11C5/147G11C7/065G11C7/067G11C7/1087G11C11/4091
    • A single-ended sense amplifier circuit of the invention comprises first and second MOS transistors and first and second precharge circuits. The first MOS transistor drives the bit line to a predetermined voltage and switches connection between the bit line and a sense node and the second MOS transistor whose gate is connected to the sense node amplifies the signal via the first MOS transistor. The first precharge circuit precharges the bit line to a first potential and the second precharge circuit precharges the sense node to a second potential. Before sensing operation, the bit line is driven to the predetermined voltage when the above gate voltage is controlled to decrease. The predetermined voltage is appropriately set so that a required voltage difference at the sense node between high and low levels can be obtained near a changing point between charge transfer/distributing modes.
    • 本发明的单端读出放大器电路包括第一和第二MOS晶体管以及第一和第二预充电电路。 第一MOS晶体管将位线驱动到预定电压并且切换位线和感测节点之间的连接,并且栅极连接到感测节点的第二MOS晶体管经由第一MOS晶体管放大信号。 第一预充电电路将位线预充电到第一电位,而第二预充电电路将感测节点预充电到第二电位。 在感测操作之前,当控制上述栅极电压降低时,位线被驱动到预定电压。 适当地设定预定电压,使得可以在电荷转移/分配模式之间的变化点附近获得在高电平和低电平之间的感测节点处的所需电压差。