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    • 2. 发明授权
    • Surface acoustic wave element
    • 表面声波元件
    • US08004148B2
    • 2011-08-23
    • US12535945
    • 2009-08-05
    • Takatoshi UmedaShuichi KawanoSatoshi Fujii
    • Takatoshi UmedaShuichi KawanoSatoshi Fujii
    • H03H9/25
    • H03H9/02574H03H9/14538
    • A surface acoustic wave element includes: a diamond layer; an alumina nitride layer provided on the diamond layer; a silicon oxide layer provided on the alumina nitride layer; and a pair of electrodes provided between the alumina nitride layer and the silicon oxide layer, the electrodes applying a voltage to the alumina nitride layer. If a thickness of the alumina nitride layer is represented by H1, a thickness of the silicon oxide layer is represented by H2, a wavelength of a surface acoustic wave is represented by λ, x is defined as x=2πH1/λ, and y is defined as y=2πH2/λ, (x, y) meets all of the following formulas 1 to 4 below. That is, the formula 1 is y≦0.750×x+0.325; the formula 2 is y≦−0.300×x+1.690; the formula 3 is y≧−0.500×x+0.950; and the formula 4 is y≧0.700×x−0.610.
    • 表面声波元件包括:金刚石层; 设置在金刚石层上的氧化铝氮化物层; 设置在氧化铝层上的氧化硅层; 以及设置在氧化铝氮化物层和氧化硅层之间的一对电极,电极向氧化铝氮化物层施加电压。 如果氮化铝层的厚度由H1表示,则氧化硅层的厚度由H2表示,表面声波的波长由λ表示,x被定义为x = 2&pgr; H1 /λ,以及 y定义为y = 2&pgr; H2 /λ,(x,y)满足以下所有下列式1至4。 也就是说,公式1是y≦̸ 0.750×x + 0.325; 公式2为y≦̸ -0.300×x + 1.690; 公式3为y≥-0.500×x + 0.950; 式4为y≥0.700×x-0.610。