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    • 3. 发明申请
    • DEVICE FOR BACTERIA CLASSIFICATION AND PRETREATMENT DEVICE FOR BACTERIA TEST
    • 用于细菌检验的细菌分类和预处理装置的装置
    • US20120258525A1
    • 2012-10-11
    • US13389824
    • 2010-05-21
    • Noriko IizumiAkira Maekawa
    • Noriko IizumiAkira Maekawa
    • C12M1/34
    • C12Q1/04C12M41/46
    • When automatically classified results are different from judgment of a laboratory technician, the laboratory technician has to reselect the bacterial colonies one-by-one to be a pickup colony through watching the displayed image. To get rid of the inconvenience, provided is a pretreatment device for a bacteria test comprising: a specification unit by which an operator instructs to specify the number of bacterial colonies and the increased/decreased number of the bacterial colonies to be displayed; and a display unit for displaying classification results obtained following the operator's instruction. The pretreatment device for a bacteria test facilitates the automatically classified results to be brought close to the judgment of the laboratory technician, resulting in the saving of the time required for checking the appropriate bacterial colonies for the pickup colony.
    • 当自动分类的结果与实验室技术人员的判断不同时,实验室技术人员必须通过观察显示的图像逐一选择细菌菌落成为拾取菌落。 为了消除不便,提供了用于细菌试验的预处理装置,其包括:操作者指示指定待显示的细菌菌落数目的增加/减少的规格单位; 以及显示单元,用于显示在操作者指令之后获得的分类结果。 用于细菌测试的预处理装置有助于自动分类的结果接近实验室技术人员的判断,从而节省了用于检查取代菌落的适当细菌菌落所需的时间。
    • 4. 发明授权
    • Mass spectrometry and mass spetrometer using the same
    • 质谱和质谱仪使用相同
    • US06765200B2
    • 2004-07-20
    • US09792582
    • 2001-02-23
    • Akira MaekawaAkira OwadaYasushi Terui
    • Akira MaekawaAkira OwadaYasushi Terui
    • H01J4910
    • H01J49/105
    • In order to provide an equipment that permits easy elimination of interference ions even in a low resolution mass spectrometer, the isotope mass number information and the isotope presence ratio information for each element are stored, and processing is done as is shown in FIG. 1 using such information and the measurement results, and the amount of target elemental ions is calculated by calculating and eliminating the amount of interference caused by other elemental isotopes to the target element. Because of this, when carrying out element analysis using a mass spectrometer with a relatively low resolution, the user can easily obtain the measurement result of the amount of any target elemental ions.
    • 为了提供即使在低分辨率质谱仪中也容易消除干扰离子的设备,存储每个元件的同位素质量数信息和同位素存在比信息,并且如图1所示进行处理。 使用这样的信息和测量结果,并且通过计算和消除由其他元素同位素对目标元素引起的干扰量来计算目标元素离子的量。 因此,当使用分辨率相对较低的质谱仪进行元素分析时,用户可以容易地获得任何目标元素离子的量的测量结果。
    • 6. 发明申请
    • METHOD FOR FLUORESCENCE ANALYSIS AND FLUORESCENCE ANALYZER
    • 荧光分析和荧光分析仪的方法
    • US20090242804A1
    • 2009-10-01
    • US12400321
    • 2009-03-09
    • Takayuki OBARASatoshi TakahashiAkira MaekawaTakuya MatsuiNobutaka Kumazaki
    • Takayuki OBARASatoshi TakahashiAkira MaekawaTakuya MatsuiNobutaka Kumazaki
    • G01N21/64
    • G01N21/648G01N21/15G01N21/274G01N21/6452
    • The present invention aims at reducing background noise derived from a substance that is present in the vicinity of a target substance such as a DNA and protein and attached to the surface of a substrate without an effect on a fluorescent dye labeling the target substance. The substrate that has a probe and is capable of interacting with the target substance is irradiated with noise removing light such that an evanescent field is generated on the surface of the substrate. A target substance and a foreign particle, which are non-specifically stuck to the surface of the substrate, are decomposed by the evanescent field generated by the irradiation with the noise removing light. The evanescent field present near the surface of the substrate has almost no effect on the probe. It is possible to reduce the background noise derived from the substance that is present in the vicinity of the target substance and attached to the surface of the substrate and suppress effects on the probe and the target substance interacting with the probe.
    • 本发明旨在减少由存在于目标物质(例如DNA和蛋白质)附近的物质衍生的背景噪声,并附着于基材表面,而不影响标记目标物质的荧光染料。 具有探针并且能够与目标物质相互作用的基板被消除噪声的光照射,使得在基板的表面上产生ev逝场。 非特异性地粘附在基板表面上的目标物质和外来粒子被消除噪声的光照射产生的ev逝场分解。 在衬底表面附近存在的消逝场对探针几乎没有影响。 可以减少由存在于目标物质附近并附着于基板表面的物质导致的背景噪声,并抑制与探针相互作用的探针和目标物质的影响。