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    • 1. 发明授权
    • Mass spectrometry and mass spetrometer using the same
    • 质谱和质谱仪使用相同
    • US06765200B2
    • 2004-07-20
    • US09792582
    • 2001-02-23
    • Akira MaekawaAkira OwadaYasushi Terui
    • Akira MaekawaAkira OwadaYasushi Terui
    • H01J4910
    • H01J49/105
    • In order to provide an equipment that permits easy elimination of interference ions even in a low resolution mass spectrometer, the isotope mass number information and the isotope presence ratio information for each element are stored, and processing is done as is shown in FIG. 1 using such information and the measurement results, and the amount of target elemental ions is calculated by calculating and eliminating the amount of interference caused by other elemental isotopes to the target element. Because of this, when carrying out element analysis using a mass spectrometer with a relatively low resolution, the user can easily obtain the measurement result of the amount of any target elemental ions.
    • 为了提供即使在低分辨率质谱仪中也容易消除干扰离子的设备,存储每个元件的同位素质量数信息和同位素存在比信息,并且如图1所示进行处理。 使用这样的信息和测量结果,并且通过计算和消除由其他元素同位素对目标元素引起的干扰量来计算目标元素离子的量。 因此,当使用分辨率相对较低的质谱仪进行元素分析时,用户可以容易地获得任何目标元素离子的量的测量结果。
    • 3. 发明申请
    • MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
    • 质谱仪和质谱方法
    • US20090179148A1
    • 2009-07-16
    • US12350328
    • 2009-01-08
    • Hiroyuki YasudaYasushi TeruiShinji NagaiTetsuya Nishida
    • Hiroyuki YasudaYasushi TeruiShinji NagaiTetsuya Nishida
    • B01D59/44H01J49/00
    • H01J49/004H01J49/063
    • Performing an MS3 with a tandem mass spectrometer causes problems of increase in size of the device and of increase in cost. Likewise, a plural number of times MS/MS analyses are even more difficult. An electrode to create a harmonic potential is disposed in a collision cell, and fragment ions produced by the first-time collision induced dissociation are accumulated in the harmonic potential. Target ions of the subsequent stage are let out, by means of an axial resonance excitation, selectively from the accumulated ions. The ions are excited in the axial direction to have a potential exceeding the harmonic potential. Thereby, the second-time collision induced dissociation is performed by means of a potential difference provided at the subsequent stage. In addition, an operation to return the ions back to the harmonic potential enables a plural number of times MS/MS analyses to be performed.
    • 使用串联质谱仪进行MS3会导致设备尺寸增加和成本增加的问题。 同样,多次MS / MS分析更加困难。 用于产生谐波电位的电极设置在碰撞室中,并且由第一次碰撞引起的解离产生的碎片离子累积在谐波电位中。 选择性地从累积的离子中排出后续阶段的目标离子,借助于轴向共振激发。 离子在轴向上被激发以具有超过谐波电位的电位。 因此,通过在后续阶段提供的电位差来执行第二次碰撞诱导解离。 此外,使离子返回到谐波电位的操作能够进行多次MS / MS分析。
    • 4. 发明授权
    • Tandem type mass analysis system and method
    • 串联式质量分析系统及方法
    • US07544930B2
    • 2009-06-09
    • US11624248
    • 2007-01-18
    • Kiyomi YoshinariYasushi TeruiToshiyuki YokosukaKinya KobayashiAtsumu Hirabayashi
    • Kiyomi YoshinariYasushi TeruiToshiyuki YokosukaKinya KobayashiAtsumu Hirabayashi
    • H01J49/00
    • H01J49/02H01J49/004
    • The present invention provides a tandem type mass analysis system capable of carrying out the differential analysis with high efficiency by the tandem type mass analysis. A predetermined number of m/z regions are set up for carrying out the mass analysis with the all ions included therein being dissociated collectively for each m/z region so as to obtain measurement MS2 data. By comparing the measurement MS2 data with reference MS2 data stored in a reference data base, a difference thereof is detected. For the m/z region with a differential component detected, the mass analysis is carried out collectively without dissociation for the all ions included therein so as to obtain measurement MS1 data. By comparing the measurement MS1 data with the reference MS1 data, a difference thereof is detected. From the difference thereof, a parent ion considered to be the differential component factor is presumed for carrying out the mass analysis with the same being dissociated.
    • 本发明提供一种能够通过串联型质量分析以高效率进行差示分析的串联式质量分析系统。 建立预定数量的m / z区域以进行质量分析,其中包含的全部离子为每个m / z区域共同解离,以获得测量MS2数据。 通过将测量MS2数据与参考数据库中存储的参考MS2数据进行比较,检测其差异。 对于检测到差分成分的m / z区域,对于其中包含的所有离子,不分离地进行质量分析,以获得测量MS1数据。 通过将测量MS1数据与参考MS1数据进行比较,检测其差异。 从它们的差异来看,推测认为是差分成分因子的母离子用于进行相同解离的质量分析。
    • 5. 发明申请
    • Mass spectrometric analyzer
    • 质谱仪
    • US20080315082A1
    • 2008-12-25
    • US12078680
    • 2008-04-03
    • Izumi OgataYasushi Terui
    • Izumi OgataYasushi Terui
    • B01D59/44
    • H01J49/004
    • A tandem mass spectrometer comprising an ion source for ionizing a sample, an ion trap section for carrying out collision induced dissociation of the target ions thereby to produce fragment ions, a multi electrode collision section for conducting collision induced dissociation of fragment ions discharged from the ion trap section, a mass spectrometer section for conducting mass spectrometric analysis of the converged fragment ions. After the target ions selected by the ion trap section are subjected to collision induced dissociation, specific fragment ions among the fragment ions are selected and transferred to the multi electrode collision section thereby to carry out collision induced dissociation therein.
    • 一种串联质谱仪,包括用于离子化样品的离子源,用于进行目标离子的碰撞诱导解离从而产生碎片离子的离子捕获部分,用于进行从离子排出的碎片离子的碰撞诱导解离的多电极碰撞部分 捕获部分,用于进行会聚碎片离子的质谱分析的质谱仪部分。 在由离子阱部分选择的目标离子经受碰撞诱导解离之后,选择碎片离子之间的特定碎片离子并将其转移到多电极碰撞部分,从而在其中进行碰撞诱导解离。
    • 6. 发明申请
    • Ion trap/time-of-flight mass analyzing apparatus and mass analyzing method
    • 离子阱/飞行时间质量分析仪和质量分析方法
    • US20050279926A1
    • 2005-12-22
    • US11149263
    • 2005-06-10
    • Yasushi TeruiToyoharu OkumotoTsukasa ShishikaShinji NagaiMasaru Tomioka
    • Yasushi TeruiToyoharu OkumotoTsukasa ShishikaShinji NagaiMasaru Tomioka
    • G01N27/62B01D59/44H01J49/40H01J49/42
    • H01J49/424H01J49/0009H01J49/0031H01J49/004H01J49/40H01J49/427
    • An “ion trap-TOF/MS” capable of calibrating the observed mass for each of an ion trap and a TOF. In the ion trap-TOF/MS, sample ions having known mass numbers and ionized by an ion source are trapped within an ion trap. Auxiliary AC voltages having a frequency component ω are applied to the end cap electrodes of the ion trap to expel unwanted ions out of the ion trap. A measurement process is carried out by applying DC voltages to the ring electrode and the end cap electrodes to expel an ion remaining within the ion trap, and measuring the mass number of the expelled ion by the time-of-flight mass spectrometer. The measurement process is repeated while changing the frequency component ω, and the ion signal intensity measured by the time-of-flight mass spectrometer is compared with a previously stored threshold, thereby making calibration of the frequency component ω for the ion having the known mass number. Thus, the calibrating of the observed mass can be realized for each of the ion trap and the TOF.
    • 能够校准每个离子阱和TOF的观察质量的“离子阱TOF / MS”。 在离子阱TOF / MS中,已知质量数和离子源电离的样品离子被捕获在离子阱内。 具有频率分量ω的辅助AC电压被施加到离子阱的端盖电极以将不需要的离子排出离子阱。 通过向环形电极和端盖电极施加直流电压以排出留在离子阱内的离子,并且通过飞行时间质谱仪测量排出的离子的质量数来进行测量处理。 在改变频率分量ω时重复测量过程,并将通过飞行时间质谱仪测量的离子信号强度与先前存储的阈值进行比较,从而对具有已知质量的离子进行频率分量ω的校准 数。 因此,可以为每个离子阱和TOF实现观察质量的校准。
    • 8. 发明授权
    • Method and apparatus for mass spectrometry
    • 质谱法和方法
    • US07928365B2
    • 2011-04-19
    • US11319611
    • 2005-12-29
    • Fujio OonishiKenichi ShinboRitsuro OrihashiYasushi TeruiTsukasa Shishika
    • Fujio OonishiKenichi ShinboRitsuro OrihashiYasushi TeruiTsukasa Shishika
    • H01J49/00
    • H01J49/0036H01J49/40
    • For the achievement of data transfer time reduction, removal of noise data, and analytical efficiency improvement in an ADC data processing function of a time-of-flight mass spectrometer, the mass spectrometer comprises a data acquisition circuit including: an A/D converter; a signal intensity addition memory that stores data of ion signals such as a time range and the number of measurements and performs an addition process; a voltage value frequency addition memory that performs an addition process of frequencies of voltage values of the predetermined time range and the number of measurements and stores addition results; a threshold level computation circuit that computes a predetermined threshold level from the results in the memory; a compression memory that extracts only data exceeding the threshold level from the data in the signal intensity addition memory; and a counter that controls a measurement time for data acquisition and the operation of each circuit.
    • 为了实现数据传输时间减少,噪声数据的去除以及飞行时间质谱仪的ADC数据处理功能的分析效率改进,质谱仪包括数据采集电路,包括:A / D转换器; 信号强度相加存储器,其存储诸如时间范围和测量次数的离子信号的数据,并执行加法处理; 电压值频率相加存储器,其执行预定时间范围的电压值的频率和测量次数的加法处理,并存储加法结果; 阈值电平计算电路,用于根据存储器中的结果计算预定的阈值电平; 压缩存储器,其从信号强度相加存储器中的数据中仅提取超过阈值电平的数据; 以及控制数据采集和每个电路的操作的测量时间的计数器。
    • 9. 发明授权
    • Method and its apparatus for mass spectrometry
    • 方法及其质谱仪
    • US07476850B2
    • 2009-01-13
    • US11431656
    • 2006-05-11
    • Fujio OonishiKenichi ShinboRitsuro OrihashiYasushi TeruiTsukasa Shishika
    • Fujio OonishiKenichi ShinboRitsuro OrihashiYasushi TeruiTsukasa Shishika
    • H01J49/00G01N19/10
    • H01J49/40H01J49/0036
    • The present invention relates to a data processing device for mass spectrometry, in which measurements are performed in a high dynamic range without causing an overrange in an A/D converter in any TOF scan. A data acquisition circuit of a mass spectrometer includes an amplitude value computing circuit which measures and stores a maximum amplitude value of an ion detection signal, a gain control circuit for determining and setting a gain amount for the next measurement, and others. From the immediately preceding TOF scan data or TOF scan data plural times before, the maximum amplitude value of the ion detection signal is extracted. Then, before the next TOF scan, an optimum gain amount is determined based on the extracted maximum amplitude value to adjust the gain of the input signal, and the ion signal is sampled in the A/D converter.
    • 本发明涉及用于质谱的数据处理装置,其中在高动态范围内进行测量,而不会在任何TOF扫描中导致A / D转换器中的超范围。 质谱仪的数据采集电路包括测量和存储离子检测信号的最大振幅值的振幅值计算电路,用于确定和设定下次测量的增益量的增益控制电路等。 从前面的多个TOF扫描数据或多次TOF扫描数据,提取离子检测信号的最大振幅值。 然后,在下一个TOF扫描之前,基于提取的最大振幅值来确定最佳增益量,以调整输入信号的增益,并且在A / D转换器中对离子信号进行采样。
    • 10. 发明申请
    • TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD
    • TANDEM类型质量分析系统和方法
    • US20070187588A1
    • 2007-08-16
    • US11624248
    • 2007-01-18
    • Kiyomi YoshinariYasushi TeruiToshiyuki YokosukaKinya KobayashiAtsumu Hirabayashi
    • Kiyomi YoshinariYasushi TeruiToshiyuki YokosukaKinya KobayashiAtsumu Hirabayashi
    • H01J49/00
    • H01J49/02H01J49/004
    • The present invention provides a tandem type mass analysis system capable of carrying out the differential analysis with high efficiency by the tandem type mass analysis. A predetermined number of m/z regions are set up for carrying out the mass analysis with the all ions included therein being dissociated collectively for each m/z region so as to obtain measurement MS2 data. By comparing the measurement MS2 data with reference MS2 data stored in a reference data base, a difference thereof is detected. For the m/z region with a differential component detected, the mass analysis is carried out collectively without dissociation for the all ions included therein so as to obtain measurement MS1 data. By comparing the measurement MS1 data with the reference MS1 data, a difference thereof is detected. From the difference thereof, a parent ion considered to be the differential component factor is presumed for carrying out the mass analysis with the same being dissociated.
    • 本发明提供一种能够通过串联型质量分析以高效率进行差示分析的串联式质量分析系统。 设定预定数量的m / z区域,用于进行质量分析,其中包含的全部离子为每个m / z区域共同解离,以获得测量MS 2的数据。 通过将测量MS 2 SUP数据与存储在参考数据库中的参考MS 2 SUP数据进行比较,检测其差异。 对于检测到差分成分的m / z区域,对于包含在其中的全部离子而不解离地进行质量分析,以获得测量MS 1的数据。 通过将测量MS< 1>数据与参考MS< 1>数据进行比较,检测其差异。 从它们的差异来看,推测认为是差分成分因子的母离子用于进行相同解离的质量分析。