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    • 6. 发明授权
    • Ultrasonic vibration bonding resonator
    • 超声波振动键合谐振器
    • US07854247B2
    • 2010-12-21
    • US12207729
    • 2008-09-10
    • Shigeru SatoMayumi KouyaMitsugu KatsumiRyoichi Ishii
    • Shigeru SatoMayumi KouyaMitsugu KatsumiRyoichi Ishii
    • B32B37/00
    • B23K20/10
    • An ultrasonic vibration bonding resonator includes a resonance body, bonding working portions having a bonding working face and provided at a point of maximum oscillation on upper and lower surfaces of the resonance body and support portions provided at two points of minimum oscillation apart from the bonding working portions to opposite sides in a direction of ultrasonic vibration as projecting from front and back surfaces of the resonance body. It includes a resonance body, tool-attaching portions provided at a point of maximum oscillation on upper and lower surfaces of the resonance body, a bonding working portion having a bonding working face and attached to one of the tool-attaching portions, and support portions provided at two points of minimum oscillation apart from the bonding working portion to opposite sides in a direction of ultrasonic vibration as projecting from front and back surfaces of the resonance body.
    • 超声波振动接合谐振器包括谐振体,具有接合工作面并且设置在谐振体的上表面和下表面上的最大振荡点处的接合作业部分和设置在离接合加工的两个最小振荡点处的支撑部分 从谐振体的前后表面突出的超声波振动的方向的相对侧的部分。 其包括共振体,设置在谐振体的上表面和下表面上的最大振荡点处的工具附接部分,具有接合工作面并且附接到工具附接部分之一的接合作业部分和支撑部分 设置在距离接合工作部分的两个最小振荡点处,在从共振体的前后表面突出的超声波振动的方向上的相对侧。
    • 9. 发明申请
    • CHARGED PARTICLE BEAM TRAJECTORY CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS
    • 充电颗粒光束光栅修正器和充电颗粒光束装置
    • US20090173887A1
    • 2009-07-09
    • US12349708
    • 2009-01-07
    • Hiroyuki ITOYuko SasakiRyoichi IshiiTakashi Doi
    • Hiroyuki ITOYuko SasakiRyoichi IshiiTakashi Doi
    • H01J3/20
    • H01J37/153H01J37/145H01J37/28H01J2237/1534
    • The invention relates to a trajectory correction method for a charged particle beam, and provides a low-cost, high accuracy and high-resolution converging optical system for use with a charged particle beam to solve problems with conventional aberration correction systems. To this end, the present invention uses a configuration which forms electromagnetic field which is concentrated towards a center of a beam trajectory axis, causes oblique of the beam to make use of lens effects and bend the trajectory, and consequently, cancels out large external side non-linear effects such a spherical aberration of the electron lens. Specifically, the configuration generates an electric field concentration in a simple manner by providing electrodes above the axis and applying voltages to the electrodes. Further, the above configuration can be realized trough operations using lenses and deflectors with incident axes and image formation positions that are normal.
    • 本发明涉及一种用于带电粒子束的轨迹校正方法,并且提供了一种用于带电粒子束的低成本,高精度和高分辨率会聚光学系统,以解决常规像差校正系统的问题。 为此,本发明使用形成朝向光束轨迹轴的中心集中的电磁场的结构,使得光束的倾斜利用透镜效果并弯曲轨迹,因此抵消了大的外侧 电子透镜的非线性效应如球面像差。 具体地说,该配置通过在轴上方设置电极并向电极施加电压,以简单的方式产生电场浓度。 此外,可以通过使用具有入射轴和成像位置的透镜和偏转器的槽操作来实现上述配置。
    • 10. 发明申请
    • Scanning Transmission Charged Particle Beam Device
    • 扫描传输带电粒子束装置
    • US20080197282A1
    • 2008-08-21
    • US12031754
    • 2008-02-15
    • Yoshihiko NakayamaIsao NagaokiRyoichi Ishii
    • Yoshihiko NakayamaIsao NagaokiRyoichi Ishii
    • G01N23/00
    • H01J37/26H01J37/265H01J37/28H01J2237/24455H01J2237/24475H01J2237/2804
    • There is provided a scanning transmission charged particle beam device by which charged particles of a bright-field image and charged particles of a dark-field image may be clearly separated, and bright-field images and dark-field images with high accuracy may be obtained even in a state in which the scanning range of a charged particle beams on a sample is changed.A deflecting coil is provided below a sample, and a charged particle detector for a dark-field image with an opening is provided below the deflecting coil. A charged particle detector for a bright-field image is provided below the above opening. By the deflecting coil below the sample, a charged particle beam for a bright-field image is configured to be synchronized with the scanning of a particle beam, and to be deflected in an opposite direction to the deflected direction of the particle beam. Thereby, a charged particles beam of a bright-field image passes through the opening of the charged particle detector for a dark-field image, and is detected by the charged particle detector for a bright-field image.
    • 提供了一种扫描透射带电粒子束装置,通过该扫描透射带电粒子束装置可以清晰地分离亮场图像的带电粒子和暗场图像的带电粒子,并且可以获得高精度的亮场图像和暗视场图像 即使在样品上的带电粒子束的扫描范围发生变化的状态。 在样品下方设置偏转线圈,并且在偏转线圈的下方设置用于具有开口的暗场图像的带电粒子检测器。 在上述开口的下方设置用于明场图像的带电粒子检测器。 通过样品下方的偏转线圈,用于亮场图像的带电粒子束被配置为与粒子束的扫描同步,并且在与粒子束的偏转方向相反的方向上偏转。 因此,亮场图像的带电粒子束通过带电粒子检测器的开口进行暗场图像,并且由带电粒子检测器检测到用于亮场图像。