专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20080110809A1 Multifunctional handler system for electrical testing of semiconductor devices 有权
标题翻译：用于半导体器件电气测试的多功能处理器系统
公开(公告)号：US20080110809A1
公开(公告)日：2008-05-15
申请号：US11983635
申请日：2007-11-09
申请人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
发明人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
IPC分类号： G01R31/28 , B07C5/344 , G01R31/319 , B65G65/02
CPC分类号： H01L21/67282 , G01R31/2867 , G01R31/2893 , H01L21/67271 , Y10S414/135
摘要： A multifunctional handler system for electrical testing of semiconductor devices is provided. The multifunctional handler system comprises: (1) a semiconductor device processing section comprising a loading unit including a buffer, a sorting unit including a separate marking machine, and a unloading unit; (2) a semiconductor device testing section, separate from the semiconductor device processing section, comprises a test chamber, the test chamber is separated into two or more test spaces, and the test spaces of the test chamber include a second chamber positioned at a lower position, a first chamber positioned above the second chamber, and pipelines for connecting the first and second chambers to each other; and (3) a host computer which is independently connected to the semiconductor device processing section and the semiconductor device testing section and controls tray information, test results, marking information, and test program information.
摘要翻译：提供了一种用于半导体器件的电测试的多功能处理器系统。多功能处理器系统包括：（1）半导体器件处理部分，包括包括缓冲器的加载单元，包括单独的标记机的分拣单元和卸载单元; （2）与半导体器件处理部分分离的半导体器件测试部分包括测试室，测试室被分离成两个或更多个测试空间，并且测试室的测试空间包括位于下部的第二室位置，位于第二室上方的第一室以及用于将第一和第二室彼此连接的管道; 和（3）独立地连接到半导体器件处理部分和半导体器件测试部分并且控制托盘信息，测试结果，标记信息和测试程序信息的主计算机。

2. 发明申请

US20070236235A1 Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments 有权
标题翻译：用于测试能够在测试环境中保持稳定温度的半导体器件的处理程序
公开(公告)号：US20070236235A1
公开(公告)日：2007-10-11
申请号：US11727938
申请日：2007-03-29
申请人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
发明人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
IPC分类号： G01R31/02
CPC分类号： G01R31/2865 , G01R31/2862
摘要： A semiconductor device test handler for maintaining stable temperature in a test environment may include a loading unit that loads a plurality of semiconductor devices mounted on a test tray; a soak chamber configured to receive the test tray from the loading unit and to age the semiconductor devices at an aging temperature; and a test chamber configured to receive and test the aged semiconductor devices. The test chamber may include: a test board; a first chamber; a second chamber; one or more pipelines connected to the first and second chambers that allow a temperature-control medium to flow between the first and second chambers; a de-soak chamber that further ages the tested semiconductor devices so that the tested semiconductor devices substantially return to ambient temperature; and a sorting and unloading unit that sorts the tested semiconductor devices according to results of the test and that unloads the sorted semiconductor devices.
摘要翻译：用于在测试环境中保持稳定温度的半导体器件测试处理器可以包括加载单元，其加载安装在测试托盘上的多个半导体器件; 浸泡室，其构造成从加载单元接收测试托盘并在老化温度下老化半导体器件; 以及被配置为接收和测试老化的半导体器件的测试室。测试室可以包括：测试板; 第一个房间第二个房间连接到第一和第二室的一个或多个管道，允许温度控制介质在第一和第二室之间流动; 脱泡室，其进一步老化测试的半导体器件，使得测试的半导体器件基本上回到环境温度; 以及分类和卸载单元，其根据测试结果对测试的半导体器件进行排序，并且对排序的半导体器件进行卸载。

3. 发明授权

US07838790B2 Multifunctional handler system for electrical testing of semiconductor devices 有权
标题翻译：用于半导体器件电气测试的多功能处理器系统
公开(公告)号：US07838790B2
公开(公告)日：2010-11-23
申请号：US11983635
申请日：2007-11-09
申请人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
发明人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
IPC分类号： B07C5/34
CPC分类号： H01L21/67282 , G01R31/2867 , G01R31/2893 , H01L21/67271 , Y10S414/135
摘要： A multifunctional handler system for electrical testing of semiconductor devices is provided. The multifunctional handler system comprises: (1) a semiconductor device processing section comprising a loading unit including a buffer, a sorting unit including a separate marking machine, and a unloading unit; (2) a semiconductor device testing section, separate from the semiconductor device processing section, comprises a test chamber, the test chamber is separated into two or more test spaces, and the test spaces of the test chamber include a second chamber positioned at a lower position, a first chamber positioned above the second chamber, and pipelines for connecting the first and second chambers to each other; and (3) a host computer which is independently connected to the semiconductor device processing section and the semiconductor device testing section and controls tray information, test results, marking information, and test program information.
摘要翻译：提供了一种用于半导体器件的电测试的多功能处理器系统。多功能处理器系统包括：（1）半导体器件处理部分，包括包括缓冲器的加载单元，包括单独的标记机的分拣单元和卸载单元; （2）与半导体器件处理部分分离的半导体器件测试部分包括测试室，测试室被分离成两个或更多个测试空间，并且测试室的测试空间包括位于下部的第二室位置，位于第二室上方的第一室以及用于将第一和第二室彼此连接的管道; 和（3）独立地连接到半导体器件处理部分和半导体器件测试部分并且控制托盘信息，测试结果，标记信息和测试程序信息的主计算机。

4. 发明授权

US07554349B2 Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments 有权
标题翻译：用于测试能够在测试环境中保持稳定温度的半导体器件的处理程序
公开(公告)号：US07554349B2
公开(公告)日：2009-06-30
申请号：US11727938
申请日：2007-03-29
申请人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
发明人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
IPC分类号： G01R31/02
CPC分类号： G01R31/2865 , G01R31/2862
摘要： A semiconductor device test handler for maintaining stable temperature in a test environment may include a loading unit that loads a plurality of semiconductor devices mounted on a test tray; a soak chamber configured to receive the test tray from the loading unit and to age the semiconductor devices at an aging temperature; and a test chamber configured to receive and test the aged semiconductor devices. The test chamber may include: a test board; a first chamber; a second chamber; one or more pipelines connected to the first and second chambers that allow a temperature-control medium to flow between the first and second chambers; a de-soak chamber that further ages the tested semiconductor devices so that the tested semiconductor devices substantially return to ambient temperature; and a sorting and unloading unit that sorts the tested semiconductor devices according to results of the test and that unloads the sorted semiconductor devices.
摘要翻译：用于在测试环境中保持稳定温度的半导体器件测试处理器可以包括加载单元，其加载安装在测试托盘上的多个半导体器件; 浸泡室，其构造成从加载单元接收测试托盘并在老化温度下老化半导体器件; 以及被配置为接收和测试老化的半导体器件的测试室。测试室可以包括：测试板; 第一个房间第二个房间连接到第一和第二室的一个或多个管道，允许温度控制介质在第一和第二室之间流动; 脱泡室，其进一步老化测试的半导体器件，使得测试的半导体器件基本上回到环境温度; 以及分类和卸载单元，其根据测试结果对测试的半导体器件进行排序，并且对排序的半导体器件进行卸载。

5. 发明授权

US07101442B2 Reaction apparatus 有权
标题翻译：反应装置
公开(公告)号：US07101442B2
公开(公告)日：2006-09-05
申请号：US10802926
申请日：2004-03-18
申请人： Jin-hyuk Choi , Do-young Kam , Jung-wook Kim , Suk-chan Lee
发明人： Jin-hyuk Choi , Do-young Kam , Jung-wook Kim , Suk-chan Lee
IPC分类号： B65D51/04 , F16J13/16 , H01L21/00 , C23C14/00
CPC分类号： H01L21/67126 , B01J3/03 , H01L21/6719 , Y10T16/532 , Y10T16/5323
摘要： A reaction apparatus including: a main body having a reaction chamber with an upper opening thereof, a lid hinge, and a lid combined to the lid hinge, rotationally opening and closing the upper opening; a lifting member having a first end part separated from a rotation axis of the lid and rotatably combined with the lid, and a second end part rotatably combined to the main body, that moves in opening and closing directions; and a driver activating the lifting member. With this configuration, the present invention provides a reaction apparatus, with a lid that is opened and closed readily, and in which the lid parallelly contacts a sealing member, and thereby creating a vacuum in the reaction chamber with ease.
摘要翻译：一种反应装置，包括：主体，具有其上开口的反应室，盖铰链和与盖铰链组合的盖，可旋转地打开和关闭上开口; 提升构件，其具有与所述盖的旋转轴线分离并与所述盖可旋转地组合的第一端部，以及可旋转地组合到所述主体的第二端部，其沿打开和关闭方向移动; 以及激活升降构件的驾驶员。采用这种结构，本发明提供了一种反应装置，其具有容易打开和关闭的盖，并且其中盖平行地接触密封构件，从而容易地在反应室中产生真空。

6. 发明授权

US5850146A Probe apparatus for electrical inspection of printed circuit board assembly 失效
标题翻译：用于印刷电路板组件电气检测的探针装置
公开(公告)号：US5850146A
公开(公告)日：1998-12-15
申请号：US680693
申请日：1996-07-18
申请人： Jae-hong Shim , Hyung-suck Cho , Do-young Kam
发明人： Jae-hong Shim , Hyung-suck Cho , Do-young Kam
IPC分类号： G01R1/06 , G01R1/067 , G01R31/02 , G01R31/28 , H05K3/34
CPC分类号： G01R1/06705 , G01R31/2806
摘要： A probe apparatus for the electrical inspection of a printed circuit board (PCB) assembly includes a probe assembly for inspecting the electrical circuitry of a PCB having electronic components mounted thereon. A first driving mechanism is provided for moving the probe assembly rectilinearly, and a guide is provided for guiding the rectilinear movement of the probe assembly. The probe assembly includes a probe tip for making contact with a solder joint on the PCB to detect a signal for the electrical inspection, a force sensor combined with the rear portion of the probe tip for measuring a contact force applied to the probe tip when the probe tip makes contact with the solder joint, a location sensor for measuring the location of the probe tip when in contact with the solder joint, and a device for controlling the location of the probe tip, according to the measured contact force and location thereof. The probe may further include a second driving mechanism for controlling the angle of inclination of the probe assembly to solder joints. Such a probe is improved in adaptability to the various patterns of the solder joints and thus enables stable testing of the PCB, by preventing poor soldering as well as vibration of the probe tips.
摘要翻译：用于电气检查印刷电路板（PCB）组件的探针装置包括用于检查其上安装有电子部件的PCB的电路的探针组件。提供了用于直线地移动探针组件的第一驱动机构，并且提供用于引导探针组件的直线运动的引导件。探头组件包括用于与PCB上的焊接接头接触以探测用于电气检查的信号的探针尖端，与探针末端的后部结合的力传感器，用于测量当探针尖端的接触力时探针尖端与焊点接触，位置传感器用于测量与焊点接触时的探针尖端的位置，以及根据测量的接触力和位置来控制探针尖端的位置的装置。探针还可以包括用于控制探针组件对焊接接头的倾斜角度的第二驱动机构。这种探针在适应于焊接接头的各种图案方面得到改善，因此可以通过防止焊接不良以及探头尖端的振动来实现PCB的稳定测试。

7. 发明授权

US07701546B2 Method and apparatus for manufacturing an LCD 有权
标题翻译：用于制造LCD的方法和装置
公开(公告)号：US07701546B2
公开(公告)日：2010-04-20
申请号：US11156946
申请日：2005-06-20
申请人： In-kwang Yu , Sung-jin Lee , Do-young Kam , Jung-kun Shin , Goang-young Park
发明人： In-kwang Yu , Sung-jin Lee , Do-young Kam , Jung-kun Shin , Goang-young Park
IPC分类号： G02F1/13
CPC分类号： G02F1/133528 , B32B37/003 , B32B2037/1072 , B32B2457/20 , B32B2457/202
摘要： A method of manufacturing an LCD comprising, preparing a liquid crystal panel which comprises a substrate assembly and a polarizing plate, wherein the polarizing plate is attached to the substrate assembly, disposing a gas injecting part towards the plate surface of the liquid crystal panel, while the gas injecting part is exposed to atmospheric conditions, and applying a pressure to the plate surface of the liquid crystal panel by injecting gas through the gas injecting part. With this configuration, the present invention provides a method to remove bubbles between the polarizing plate and liquid crystal panel without the use of a chamber.
摘要翻译：一种制造LCD的方法，包括：制备包括基板组件和偏振板的液晶面板，其中所述偏振板附接到所述基板组件，将气体注入部分朝向所述液晶面板的板表面设置，同时气体注入部分暴露于大气条件下，并通过气体注入部分注入气体向液晶板的板表面施加压力。采用这种结构，本发明提供了一种在不使用室的情况下，在偏光板和液晶面板之间除去气泡的方法。

8. 发明申请

US20060028611A1 Method and apparatus for manufacturing an LCD 有权
标题翻译：用于制造LCD的方法和装置
公开(公告)号：US20060028611A1
公开(公告)日：2006-02-09
申请号：US11156946
申请日：2005-06-20
申请人： In-kwang Yu , Sung-jin Lee , Do-young Kam , Jung-kun Shin , Goang-young Park
发明人： In-kwang Yu , Sung-jin Lee , Do-young Kam , Jung-kun Shin , Goang-young Park
IPC分类号： G02F1/1341
CPC分类号： G02F1/133528 , B32B37/003 , B32B2037/1072 , B32B2457/20 , B32B2457/202
摘要： A method of manufacturing an LCD comprising, preparing a liquid crystal panel which comprises a substrate assembly and a polarizing plate, wherein the polarizing plate is attached to the substrate assembly, disposing a gas injecting part towards the plate surface of the liquid crystal panel, while the gas injecting part is exposed to atmospheric conditions, and applying a pressure to the plate surface of the liquid crystal panel by injecting gas through the gas injecting part. With this configuration, the present invention provides a method to remove bubbles between the polarizing plate and liquid crystal panel without the use of a chamber.
摘要翻译：一种制造LCD的方法，包括：制备包括基板组件和偏振板的液晶面板，其中所述偏振板附接到所述基板组件，将气体注入部分朝向所述液晶面板的板表面设置，同时气体注入部分暴露于大气条件下，并通过气体注入部分注入气体向液晶板的板表面施加压力。采用这种结构，本发明提供了一种在不使用室的情况下，在偏光板和液晶面板之间除去气泡的方法。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式