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1. 发明申请

US20070236235A1 Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments 有权
标题翻译：用于测试能够在测试环境中保持稳定温度的半导体器件的处理程序
公开(公告)号：US20070236235A1
公开(公告)日：2007-10-11
申请号：US11727938
申请日：2007-03-29
申请人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
发明人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
IPC分类号： G01R31/02
CPC分类号： G01R31/2865 , G01R31/2862
摘要： A semiconductor device test handler for maintaining stable temperature in a test environment may include a loading unit that loads a plurality of semiconductor devices mounted on a test tray; a soak chamber configured to receive the test tray from the loading unit and to age the semiconductor devices at an aging temperature; and a test chamber configured to receive and test the aged semiconductor devices. The test chamber may include: a test board; a first chamber; a second chamber; one or more pipelines connected to the first and second chambers that allow a temperature-control medium to flow between the first and second chambers; a de-soak chamber that further ages the tested semiconductor devices so that the tested semiconductor devices substantially return to ambient temperature; and a sorting and unloading unit that sorts the tested semiconductor devices according to results of the test and that unloads the sorted semiconductor devices.
摘要翻译：用于在测试环境中保持稳定温度的半导体器件测试处理器可以包括加载单元，其加载安装在测试托盘上的多个半导体器件; 浸泡室，其构造成从加载单元接收测试托盘并在老化温度下老化半导体器件; 以及被配置为接收和测试老化的半导体器件的测试室。测试室可以包括：测试板; 第一个房间第二个房间连接到第一和第二室的一个或多个管道，允许温度控制介质在第一和第二室之间流动; 脱泡室，其进一步老化测试的半导体器件，使得测试的半导体器件基本上回到环境温度; 以及分类和卸载单元，其根据测试结果对测试的半导体器件进行排序，并且对排序的半导体器件进行卸载。

2. 发明申请

US20080110809A1 Multifunctional handler system for electrical testing of semiconductor devices 有权
标题翻译：用于半导体器件电气测试的多功能处理器系统
公开(公告)号：US20080110809A1
公开(公告)日：2008-05-15
申请号：US11983635
申请日：2007-11-09
申请人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
发明人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
IPC分类号： G01R31/28 , B07C5/344 , G01R31/319 , B65G65/02
CPC分类号： H01L21/67282 , G01R31/2867 , G01R31/2893 , H01L21/67271 , Y10S414/135
摘要： A multifunctional handler system for electrical testing of semiconductor devices is provided. The multifunctional handler system comprises: (1) a semiconductor device processing section comprising a loading unit including a buffer, a sorting unit including a separate marking machine, and a unloading unit; (2) a semiconductor device testing section, separate from the semiconductor device processing section, comprises a test chamber, the test chamber is separated into two or more test spaces, and the test spaces of the test chamber include a second chamber positioned at a lower position, a first chamber positioned above the second chamber, and pipelines for connecting the first and second chambers to each other; and (3) a host computer which is independently connected to the semiconductor device processing section and the semiconductor device testing section and controls tray information, test results, marking information, and test program information.
摘要翻译：提供了一种用于半导体器件的电测试的多功能处理器系统。多功能处理器系统包括：（1）半导体器件处理部分，包括包括缓冲器的加载单元，包括单独的标记机的分拣单元和卸载单元; （2）与半导体器件处理部分分离的半导体器件测试部分包括测试室，测试室被分离成两个或更多个测试空间，并且测试室的测试空间包括位于下部的第二室位置，位于第二室上方的第一室以及用于将第一和第二室彼此连接的管道; 和（3）独立地连接到半导体器件处理部分和半导体器件测试部分并且控制托盘信息，测试结果，标记信息和测试程序信息的主计算机。

3. 发明授权

US07838790B2 Multifunctional handler system for electrical testing of semiconductor devices 有权
标题翻译：用于半导体器件电气测试的多功能处理器系统
公开(公告)号：US07838790B2
公开(公告)日：2010-11-23
申请号：US11983635
申请日：2007-11-09
申请人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
发明人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
IPC分类号： B07C5/34
CPC分类号： H01L21/67282 , G01R31/2867 , G01R31/2893 , H01L21/67271 , Y10S414/135
摘要： A multifunctional handler system for electrical testing of semiconductor devices is provided. The multifunctional handler system comprises: (1) a semiconductor device processing section comprising a loading unit including a buffer, a sorting unit including a separate marking machine, and a unloading unit; (2) a semiconductor device testing section, separate from the semiconductor device processing section, comprises a test chamber, the test chamber is separated into two or more test spaces, and the test spaces of the test chamber include a second chamber positioned at a lower position, a first chamber positioned above the second chamber, and pipelines for connecting the first and second chambers to each other; and (3) a host computer which is independently connected to the semiconductor device processing section and the semiconductor device testing section and controls tray information, test results, marking information, and test program information.
摘要翻译：提供了一种用于半导体器件的电测试的多功能处理器系统。多功能处理器系统包括：（1）半导体器件处理部分，包括包括缓冲器的加载单元，包括单独的标记机的分拣单元和卸载单元; （2）与半导体器件处理部分分离的半导体器件测试部分包括测试室，测试室被分离成两个或更多个测试空间，并且测试室的测试空间包括位于下部的第二室位置，位于第二室上方的第一室以及用于将第一和第二室彼此连接的管道; 和（3）独立地连接到半导体器件处理部分和半导体器件测试部分并且控制托盘信息，测试结果，标记信息和测试程序信息的主计算机。

4. 发明授权

US07554349B2 Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments 有权
标题翻译：用于测试能够在测试环境中保持稳定温度的半导体器件的处理程序
公开(公告)号：US07554349B2
公开(公告)日：2009-06-30
申请号：US11727938
申请日：2007-03-29
申请人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
发明人： Seong-goo Kang , Jun-ho Lee , Ki-sang Kang , Hyun-seop Shim , Do-young Kam , Jae-il Lee , Ju-il Kang
IPC分类号： G01R31/02
CPC分类号： G01R31/2865 , G01R31/2862
摘要： A semiconductor device test handler for maintaining stable temperature in a test environment may include a loading unit that loads a plurality of semiconductor devices mounted on a test tray; a soak chamber configured to receive the test tray from the loading unit and to age the semiconductor devices at an aging temperature; and a test chamber configured to receive and test the aged semiconductor devices. The test chamber may include: a test board; a first chamber; a second chamber; one or more pipelines connected to the first and second chambers that allow a temperature-control medium to flow between the first and second chambers; a de-soak chamber that further ages the tested semiconductor devices so that the tested semiconductor devices substantially return to ambient temperature; and a sorting and unloading unit that sorts the tested semiconductor devices according to results of the test and that unloads the sorted semiconductor devices.
摘要翻译：用于在测试环境中保持稳定温度的半导体器件测试处理器可以包括加载单元，其加载安装在测试托盘上的多个半导体器件; 浸泡室，其构造成从加载单元接收测试托盘并在老化温度下老化半导体器件; 以及被配置为接收和测试老化的半导体器件的测试室。测试室可以包括：测试板; 第一个房间第二个房间连接到第一和第二室的一个或多个管道，允许温度控制介质在第一和第二室之间流动; 脱泡室，其进一步老化测试的半导体器件，使得测试的半导体器件基本上回到环境温度; 以及分类和卸载单元，其根据测试结果对测试的半导体器件进行排序，并且对排序的半导体器件进行卸载。

5. 发明申请

US20060187647A1 Test kit semiconductor package and method of testing semiconductor package using the same 审中-公开
标题翻译：测试套件半导体封装及使用该半导体封装的半导体封装方法
公开(公告)号：US20060187647A1
公开(公告)日：2006-08-24
申请号：US11347569
申请日：2006-02-06
申请人： Hyun-Guen Iy , Jeong-Ho Bang , Hyun-Seop Shim , Jae-il Lee , Kum-Jin Yun
发明人： Hyun-Guen Iy , Jeong-Ho Bang , Hyun-Seop Shim , Jae-il Lee , Kum-Jin Yun
IPC分类号： H05K7/20
CPC分类号： H05K7/1061 , G01R31/2863 , G01R31/2893
摘要： A test kit for a semiconductor package and a method of testing a semiconductor package using the same are provided. The test kit may include a pick-and-place tool for loading/unloading a semiconductor package, a head assembly for guiding a semiconductor package released from the pick-and-place tool, and a socket for receiving the semiconductor package from the pick-and-place tool. The method may include performing pre-alignment by inserting one or more slide posts of an alignment tool into a socket, releasing a semiconductor package through a package guider, and attaching the semiconductor package onto a socket.
摘要翻译：提供一种用于半导体封装的测试套件以及使用其的半导体封装测试方法。测试套件可以包括用于加载/卸载半导体封装的拾取和放置工具，用于引导从拾取和放置工具释放的半导体封装的头组件和用于从拾取放置工具接收半导体封装的插座，放置工具。该方法可以包括通过将对准工具的一个或多个滑动柱插入插座来执行预对准，通过封装导向器释放半导体封装，以及将半导体封装连接到插座上。

6. 发明授权

US08476908B2 Signal capture system and test apparatus including the same 有权
标题翻译：信号捕获系统和包括其的测试装置
公开(公告)号：US08476908B2
公开(公告)日：2013-07-02
申请号：US12840573
申请日：2010-07-21
申请人： Woon-sup Choi , Ho-sun Yoo , In-su Yang , Min-sung Kim , Jong-pill Park , In-ho Choi , Sung-yeol Kim , Jeong-gon Lee , Seung-jun Chee , Jae-il Lee , Chul-woong Jang
发明人： Woon-sup Choi , Ho-sun Yoo , In-su Yang , Min-sung Kim , Jong-pill Park , In-ho Choi , Sung-yeol Kim , Jeong-gon Lee , Seung-jun Chee , Jae-il Lee , Chul-woong Jang
IPC分类号： G01R31/02 , G01R31/00
CPC分类号： G11C29/56 , G11C2029/5606 , H05K1/0295 , H05K2201/10159 , H05K2201/10325 , H05K2203/162
摘要： A signal capture system for capturing a signal and storing the captured signal in a storage apparatus in real time, and a test apparatus including the signal capture system. The signal capture system includes a printed circuit board; a socket that is connected to the printed circuit board and on which a reference memory component is mounted; and an interposer that is mounted on the printed circuit board, is connected to the socket, an external apparatus, and a storage apparatus, receives first signals from the reference memory component and transmits the received first signals to the external apparatus and the storage apparatus, and receives second signals from the external apparatus and transmits the received second signals to the reference memory component and the storage apparatus, wherein a shape of the socket is defined according to a type of the reference memory component.
摘要翻译：一种用于捕获信号并将捕获的信号实时存储在存储装置中的信号捕获系统，以及包括信号捕获系统的测试装置。信号捕获系统包括印刷电路板; 连接到印刷电路板并且其上安装有参考存储器部件的插座; 并且安装在印刷电路板上的插入件连接到插座，外部装置和存储装置，从参考存储器部件接收第一信号，并将接收的第一信号发送到外部设备和存储装置，并接收来自外部装置的第二信号，并将接收到的第二信号发送到参考存储器部件和存储装置，其中根据参考存储器部件的类型来定义插座的形状。

7. 发明申请

US20110292726A1 Nonvolatile Memory Device Capable Of Reducing Read Disturbance And Read Method Thereof 有权
标题翻译：非易失性存储器件能够减少读取干扰和读取方法
公开(公告)号：US20110292726A1
公开(公告)日：2011-12-01
申请号：US13117390
申请日：2011-05-27
申请人： Jae-il Lee , Moon Sone
发明人： Jae-il Lee , Moon Sone
IPC分类号： G11C16/10 , G11C16/06 , G11C16/26
CPC分类号： G11C16/3418 , G11C11/26 , G11C11/5628 , G11C16/0483
摘要： Provided are a nonvolatile memory device and a read method of the same. The read method applying one of a plurality of unselected read voltages to unselected wordlines adjacent to a selected word line. The voltage applied to the unselected word lines being based on which of a plurality of selected read voltages is applied to the selected wordline.
摘要翻译：提供一种非易失性存储器件及其读取方法。所述读取方法将多个未选择的读取电压中的一个施加到与所选择的字线相邻的未选择的字线。施加到未选字线的电压基于多个选择的读取电压中的哪一个被施加到所选择的字线。

8. 发明申请

US20080204066A1 Automatic test equipment capable of high speed test 有权
标题翻译：自动测试设备能够进行高速测试
公开(公告)号：US20080204066A1
公开(公告)日：2008-08-28
申请号：US12072444
申请日：2008-02-26
申请人： Chul-wuong Jang , Seung-ho Jang , Jae-il Lee , Young-jin Lee
发明人： Chul-wuong Jang , Seung-ho Jang , Jae-il Lee , Young-jin Lee
IPC分类号： G01R31/26
CPC分类号： G01R31/31928 , G01R31/318516 , G01R31/31922 , G11C29/56 , G11C29/56012
摘要： Automatic test equipment is capable of performing a high-speed test of semiconductor devices, with a low cost and high efficiency. The automatic test equipment (ATE) comprises: an ATE body configured to electrically test semiconductor devices; a field programmable gate array (FPGA) controlling drivers and comparators on the ATE; an accelerator connected to an output terminal of the FPGA and that doubles an operating frequency of the FPGA; and a decelerator connected to an output terminal of the FPGA and that converts an operating frequency of data transferred from the semiconductor device to the operating frequency of the FPGA.
摘要翻译：自动测试设备能够以低成本和高效率对半导体器件进行高速测试。自动测试设备（ATE）包括：ATE主体，被配置为电测试半导体器件; 控制ATE上的驱动器和比较器的现场可编程门阵列（FPGA）; 连接到FPGA的输出端的加速器，使FPGA的工作频率加倍; 以及连接到FPGA的输出端子并将从半导体器件传送的数据的工作频率转换为FPGA的工作频率的减速器。

9. 发明授权

US08987425B2 Pharmaceutical composition for preventing or treating cancer 有权
标题翻译：用于预防或治疗癌症的药物组合物
公开(公告)号：US08987425B2
公开(公告)日：2015-03-24
申请号：US13557891
申请日：2012-07-25
申请人： Jae-il Lee
发明人： Jae-il Lee
IPC分类号： C07K16/00 , C07K16/46 , C07K16/28 , C07K16/18
CPC分类号： C07K16/468 , C07K16/18 , C07K16/2809 , C07K16/46 , C07K2319/00
摘要： The invention provides a fusion protein comprising (a) a first protein comprising a polypeptide which specifically binds to Annexin A1 and (b) a second protein comprising a polypeptide which induces a cytotoxic activity of a cytotoxic lymphocyte, pharmaceutical compositions comprising the fusion protein, and methods of treating or preventing cancer by administering the pharmaceutical compositions.
摘要翻译：本发明提供一种融合蛋白，其包含（a）包含特异性结合膜联蛋白A1的多肽的第一蛋白质和（b）包含诱导细胞毒性淋巴细胞的细胞毒性活性的多肽的第二蛋白质，包含所述融合蛋白的药物组合物和通过施用药物组合物治疗或预防癌症的方法。

10. 发明申请

US20110109318A1 SIGNAL CAPTURE SYSTEM AND TEST APPARATUS INCLUDING THE SAME 有权
标题翻译：信号捕获系统和测试装置，包括它们
公开(公告)号：US20110109318A1
公开(公告)日：2011-05-12
申请号：US12840573
申请日：2010-07-21
申请人： Woon-sup Choi , Ho-sun Yoo , In-su Yang , Min-sung Kim , Jong-pill Park , In-ho Choi , Sung-yeol Kim , Jeong-gon Lee , Seung-jun Chee , Jae-il Lee , Chul-woong Jang
发明人： Woon-sup Choi , Ho-sun Yoo , In-su Yang , Min-sung Kim , Jong-pill Park , In-ho Choi , Sung-yeol Kim , Jeong-gon Lee , Seung-jun Chee , Jae-il Lee , Chul-woong Jang
IPC分类号： G01R31/02 , H05K1/18
CPC分类号： G11C29/56 , G11C2029/5606 , H05K1/0295 , H05K2201/10159 , H05K2201/10325 , H05K2203/162
摘要： A signal capture system for capturing a signal and storing the captured signal in a storage apparatus in real time, and a test apparatus including the signal capture system. The signal capture system includes a printed circuit board; a socket that is connected to the printed circuit board and on which a reference memory component is mounted; and an interposer that is mounted on the printed circuit board, is connected to the socket, an external apparatus, and a storage apparatus, receives first signals from the reference memory component and transmits the received first signals to the external apparatus and the storage apparatus, and receives second signals from the external apparatus and transmits the received second signals to the reference memory component and the storage apparatus, wherein a shape of the socket is defined according to a type of the reference memory component.
摘要翻译：一种用于捕获信号并将捕获的信号实时存储在存储装置中的信号捕获系统，以及包括信号捕获系统的测试装置。信号捕获系统包括印刷电路板; 连接到印刷电路板并且其上安装有参考存储器部件的插座; 并且安装在印刷电路板上的插入件连接到插座，外部装置和存储装置，从参考存储器部件接收第一信号，并将接收的第一信号发送到外部设备和存储装置，并接收来自外部装置的第二信号，并将接收到的第二信号发送到参考存储器部件和存储装置，其中根据参考存储器部件的类型来定义插座的形状。

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