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1. 发明授权

US5825182A Nondestructive testing system using a SQUID 失效
标题翻译：使用SQUID的非破坏性测试系统
公开(公告)号：US5825182A
公开(公告)日：1998-10-20
申请号：US325813
申请日：1994-10-19
申请人： Satoshi Nakayama , Kazuo Chinone , Akikazu Odawara , Tatsuaki Ataka
发明人： Satoshi Nakayama , Kazuo Chinone , Akikazu Odawara , Tatsuaki Ataka
IPC分类号： G01N27/82 , G01N27/83 , G01R33/035 , G01N27/87
CPC分类号： G01R33/0358 , G01N27/82
摘要： In order to enhance the sensitivity of a nondestructive testing system, a pair of superconducting coils are disposed in the same plane such that a current flowing through the respective coils when exposed to a uniform magnetic field cancels out. As a result of this configuration, the detection coils are immune to noise, offset fields or other uniform ambient phenomena. In one embodiment, the nondestructive testing unit includes a plurality of detection coils, a SQUID having a pair of connectors for connection to the detection coils, a probe for supporting the detection coils and the SQUID in a coolant, a cryostat for supporting the probe and for keeping the coolant constant, a controller for processing a signal transmitted from the SQUID, and a display device for displaying the result of the processing. At least two detection coils are disposed in the same plane, are directly connected to the SQUID and are integrated on a semiconductor substrate.
摘要翻译：为了提高无损检测系统的灵敏度，将一对超导线圈设置在同一平面上，使得暴露于均匀磁场时流过各线圈的电流抵消。作为这种配置的结果，检测线圈不受噪声，偏移场或其他均匀的环境现象的影响。在一个实施例中，非破坏性测试单元包括多个检测线圈，SQUID具有用于连接到检测线圈的一对连接器，用于支撑检测线圈的探针和冷却剂中的SQUID，用于支撑探针的低温恒温器，为了保持冷却剂不变，用于处理从SQUID发送的信号的控制器以及用于显示处理结果的显示装置。至少两个检测线圈被布置在同一平面中，直接连接到SQUID并被集成在半导体衬底上。

2. 发明授权

US07507957B2 Probe microscope system suitable for observing sample of long body 有权
标题翻译：探头显微镜系统适用于长时间观察样品
公开(公告)号：US07507957B2
公开(公告)日：2009-03-24
申请号：US11216389
申请日：2005-08-31
申请人： Masamichi Fujihira , Masatoshi Yasutake , Tatsuaki Ataka
发明人： Masamichi Fujihira , Masatoshi Yasutake , Tatsuaki Ataka
IPC分类号： G01N23/00
CPC分类号： G01Q30/14 , G01Q10/06 , Y10S977/853 , Y10S977/86 , Y10S977/862 , Y10S977/869 , Y10S977/871
摘要： A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.
摘要翻译：本发明要解决的问题在于提供一种用于检测具有高分辨率和物理属性信息的形状的多功能分析装置，其不仅能够从一端到另一端连续读取基本排列，而且还指定与已知RNA杂交的位置到在板上沿一个方向伸长的单个DNA。本发明的显微镜系统设置有荧光显微镜，扫描型近场显微镜和扫描探针显微镜作为检测系统，将显微镜固定在切换机构上，并可移动到各种显微镜可以观察到的位置通过切换机构的操作来获取样品的相同部分。本发明的显微镜系统具有能够通过扫描探针显微镜通过多功能扫描直接检测一片DNA的形状和物理性质信息的功能。

3. 发明申请

US20060060778A1 Probe microscope system suitable for observing sample of long body 有权
公开(公告)号：US20060060778A1
公开(公告)日：2006-03-23
申请号：US11216389
申请日：2005-08-31
申请人： Masamichi Fujihira , Masatoshi Yasutake , Tatsuaki Ataka
发明人： Masamichi Fujihira , Masatoshi Yasutake , Tatsuaki Ataka
IPC分类号： G21K7/00
CPC分类号： G01Q30/14 , G01Q10/06 , Y10S977/853 , Y10S977/86 , Y10S977/862 , Y10S977/869 , Y10S977/871
摘要： A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.

4. 发明授权

US6046053A Method for amino acid sequencing of protein or peptide from carboxy terminus thereof 失效
标题翻译：从羧基末端对蛋白质或肽进行氨基酸测序的方法
公开(公告)号：US6046053A
公开(公告)日：2000-04-04
申请号：US862625
申请日：1997-05-23
申请人： Akira Tsugita , Keiji Takamoto , Tatsuaki Ataka , Toshihiko Sakuhara , Toyoaki Uchida
发明人： Akira Tsugita , Keiji Takamoto , Tatsuaki Ataka , Toshihiko Sakuhara , Toyoaki Uchida
IPC分类号： G01N31/00 , C07K1/00 , G01N33/68 , G01N33/50 , G01N33/00
CPC分类号： G01N33/6821
摘要： A process is disclosed for sequencing proteins or peptides from the C-terminal end. The process comprises the steps of reacting the peptide or protein with an alkyl acid anhydride to convert the carboxy-terminal thereof into oxazolone, liberating the C-terminal amino acid by reaction with acid and alcohol or with ester, and identifying the liberated amino acid or amino acid derivative.
摘要翻译：公开了从C末端测序蛋白质或肽的方法。该方法包括以下步骤：使肽或蛋白质与烷基酸酐反应，将其羧基末端转化成恶唑酮，通过与酸和醇或酯反应释放C端氨基酸，并鉴定释放的氨基酸或氨基酸衍生物。

5. 发明授权

US5885434A Method and apparatus for performing fine working 失效
标题翻译：执行精细加工的方法和装置
公开(公告)号：US5885434A
公开(公告)日：1999-03-23
申请号：US829840
申请日：1997-04-01
申请人： Masayuki Suda , Toshihiko Sakuhara , Tatsuaki Ataka
发明人： Masayuki Suda , Toshihiko Sakuhara , Tatsuaki Ataka
IPC分类号： B23H3/00 , B81C99/00 , C25D21/12 , C25F3/00 , C25F7/00 , G01N27/416 , G01Q60/10 , G01Q70/08 , G01Q80/00 , G11B9/14 , C25D17/00
CPC分类号： C25D21/12 , C25F3/00 , Y10S977/852 , Y10S977/855
摘要： A method for performing fine working of a material by electrochemical reaction comprises a two-step scanning operation in which a surface topography of the material is obtained during a first scan which is used to control the position of a probe during a second scan in which an electrochemical reaction is performed. During the first scan, an electrochemical cell is constructed with a four-electrode system, including the probe, a material to be worked, a reference electrode and a counter electrode. The potential of each of the probe and the material to be worked is set so that no electrochemical reaction occurs during the first scan. Data representative of the surface topography is stored and used to control the position of the probe during the second scan in which an electrochemical cell is constructed with a three-electrode system, including the probe, the material, and the reference electrode. The potential of the material with respect to the probe is set such that the electrochemical reaction occurs during the second scan, and the probe is maintained at a distance determined based on the stored topographical data.
摘要翻译：用于通过电化学反应进行材料精细加工的方法包括两步扫描操作，其中在第一扫描期间获得材料的表面形貌，其用于在第二扫描期间控制探针的位置，其中进行电化学反应。在第一次扫描期间，电化学电池由四电极系统构成，包括探针，待加工材料，参比电极和对电极。设置每个探针和待加工材料的电位，使得在第一次扫描期间不发生电化学反应。存储表示表面形貌的数据并用于在第二扫描期间控制探针的位置，其中使用包括探针，材料和参比电极的三电极系统构建电化学电池。材料相对于探针的电位被设定为使得在第二扫描期间发生电化学反应，并且探针被保持在基于存储的地形数据确定的距离。

6. 发明授权

US5449901A Fine surface observing apparatus 失效
标题翻译：精细表面观察装置
公开(公告)号：US5449901A
公开(公告)日：1995-09-12
申请号：US95968
申请日：1993-07-22
申请人： Masamichi Fujihira , Tatsuaki Ataka , Hiroshi Muramatsu
发明人： Masamichi Fujihira , Tatsuaki Ataka , Hiroshi Muramatsu
IPC分类号： G01B9/04 , G01B11/30 , G01N37/00 , G01Q30/20 , G01Q60/18 , G01Q60/22 , G01N21/17
CPC分类号： G01Q10/04 , B82Y20/00 , B82Y35/00 , G01Q60/22
摘要： An optical scan type tunnel microscope based on a new principle, having higher resolution, is provided. The apparatus of the invention is comprised of at least an optical fiber 3 whose head portion is covered by an energy acceptor 6, a prism on which a sample which contains an energy donator 7 or is covered by the energy donator 7 is placed, a XY-axis transfer mechanism 9, XY-axis control mechanism 10, Z-axis transfer mechanism 11, Z-axis control mechanism 12, light source 13, optical system 14, and an optical detecting system 15.
摘要翻译：提供了基于具有更高分辨率的新原理的光学扫描型隧道显微镜。本发明的装置至少包括一个光纤3，其光头部分被能量受体6所覆盖，棱镜上装有一个包含能量供给器7或被能量馈给器7覆盖的样品，XY 轴传送机构9，XY轴控制机构10，Z轴传送机构11，Z轴控制机构12，光源13，光学系统14和光学检测系统15。

7. 发明授权

US5304795A High resolution observation apparatus with photon scanning microscope 失效
标题翻译：高分辨率观察装置与光子扫描显微镜
公开(公告)号：US5304795A
公开(公告)日：1994-04-19
申请号：US954317
申请日：1992-09-30
申请人： Masamichi Fujihira , Tatsuaki Ataka , Toshihiro Sakuhara
发明人： Masamichi Fujihira , Tatsuaki Ataka , Toshihiro Sakuhara
IPC分类号： G01B11/30 , G01Q20/02 , G01Q20/04 , G01Q60/18 , G02B6/00 , G11B7/005 , G11B11/00 , H01J3/14
CPC分类号： G01N21/552 , B82Y10/00 , B82Y20/00 , B82Y35/00 , G01N21/645 , G01N21/648 , G01Q60/04 , G01Q60/06 , G01Q60/16 , G01Q60/20 , G01Q60/22 , G01Q60/38 , G11B11/007 , G11B7/005 , G01Q80/00 , Y10S977/862
摘要： A high resolution observation apparatus of material features with a photon scanning microscope. The apparatus detects evanescent light which depends on surface feature of a sample and detects detailed distribution of optical constants of the sample. Namely, the apparatus makes it possible to detect detailed distribution of transparency or refractive index within a sample material in higher resolution than the wavelength of the incident light which is irradiates to the sample material coated on the top surface of the optical prism. The apparatus includes means for maintaining a predetermined distance between the sample and an optical fiber tip or means for detecting a positioning signal. Further, it becomes possible to detect fluorescent condition of the sample.
摘要翻译：具有光子扫描显微镜的材料特征的高分辨率观察装置。该装置检测取决于样品的表面特征的ev逝光，并检测样品的光学常数的详细分布。也就是说，该装置可以以比照射到涂覆在光学棱镜的顶表面上的样品材料的入射光的波长更高的分辨率来检测样品材料内的透明度或折射率的详细分布。该装置包括用于保持样品和光纤末端之间的预定距离的装置或用于检测定位信号的装置。此外，可以检测样品的荧光条件。

8. 发明授权

US4865994A Detection method for amino acid derivatives 失效
标题翻译：氨基酸衍生物检测方法
公开(公告)号：US4865994A
公开(公告)日：1989-09-12
申请号：US185324
申请日：1988-04-19
申请人： Akira Tsugita , Isamu Arai , Tatsuaki Ataka
发明人： Akira Tsugita , Isamu Arai , Tatsuaki Ataka
IPC分类号： C07B59/00 , C07K1/12 , G01N33/533 , G01N33/534 , G01N33/68 , G01N33/76
CPC分类号： C07K1/12 , G01N33/533 , G01N33/534 , G01N33/6809 , G01N33/6824 , Y10T436/141111
摘要： A method for detecting amino acid derivatives in which 2-anilino-5-thiazolinone derivatives of amino acids are reacted with radioactive iodine siotope-labeled amino compounds or with fluorescent amino compounds to form phenylthiocarbamyl amino acid derivatives. The phenylthiocarbamyl amino acid derivatives are detected with a high level of sensitivity by a radioactive detector or a fluorescence spectrophotometer.
摘要翻译：用于检测氨基酸的2-苯胺基-5-噻唑啉酮衍生物与放射性碘素标记的氨基化合物或与荧光氨基化合物反应以形成苯基硫代氨基甲酰基氨基酸衍生物的氨基酸衍生物的方法。通过放射性检测器或荧光分光光度计以高灵敏度检测苯硫基氨基甲酰氨基酸衍生物。

9. 发明授权

US6111342A Instrument for chemical measurement 失效
标题翻译：化学测量仪器
公开(公告)号：US6111342A
公开(公告)日：2000-08-29
申请号：US209638
申请日：1994-03-10
申请人： Hiroshi Muramatsu , Tatsuaki Ataka
发明人： Hiroshi Muramatsu , Tatsuaki Ataka
IPC分类号： G01N5/02 , G01N11/00 , G01N11/16 , G01N27/00 , G01N27/04 , G01N27/403 , G01N27/416 , H01L41/08
CPC分类号： G01N29/036 , G01N2291/0256
摘要： A quartz oscillator for detecting a physicochemical change in a substance to be measured comprises a first electrode having at least two separate electrode portions for contact with the substance to be measured, and a second electrode. A chemical measuring instrument comprises a piezoelectric characteristic-measuring circuit having an output signal line connected to capacitors connected in parallel to the separate electrode portions of the first electrode of the quartz oscillator. An input signal line of the piezoelectric characteristic-measuring circuit is connected to the second electrode of the quartz oscillator. A voltage application circuit is connected to one of the separate electrode portions of the first electrode for applying a voltage between the separate electrode portions. An electrical current-measuring circuit is connected to the other of the separate electrode portions which is electrically grounded. The resonant characteristics of the quartz oscillator and the conductivity on the surfaces of the electrodes can be simultaneously and effectively measured.
摘要翻译：用于检测待测物质的物理化学变化的石英振荡器包括具有至少两个用于与被测物质接触的分离电极部分的第一电极和第二电极。一种化学测量仪器包括压电特性测量电路，其具有连接到与石英振荡器的第一电极的分离电极部分并联连接的电容器的输出信号线。压电特性测量电路的输入信号线连接到石英振荡器的第二电极。电压施加电路连接到第一电极的单独电极部分之一，用于在分离的电极部分之间施加电压。电流测量电路连接到电接地的单独电极部分中的另一个。可以同时有效地测量石英振子的谐振特性和电极表面的导电性。

10. 发明授权

US6059954A Electrochemical machining method and electrochemical machining equipment 失效
标题翻译：电化学加工方法和电化学加工设备
公开(公告)号：US6059954A
公开(公告)日：2000-05-09
申请号：US47855
申请日：1998-03-25
申请人： Masayuki Suda , Toshihiko Sakuhara , Tatsuaki Ataka
发明人： Masayuki Suda , Toshihiko Sakuhara , Tatsuaki Ataka
IPC分类号： B23H3/00 , B23H3/02 , B81C99/00 , C25B15/00
CPC分类号： B23H3/02
摘要： An electrochemical machining method in which a work piece and a machining electrode are opposed to each other and dipped in an electrolyte solution, and a surface of the work piece is machined by causing an electrolytic reaction between the surface of the work piece and a tip of the machining electrode in a state where a separating distance between the surface of the work piece and the tip of the machining electrode is adjusted and a desired separating distance is maintained, wherein a zero contact reference position where the surface of the work piece and the tip of the machining electrode are brought into contact with each other and the separating distance between the work piece and the machining electrode is nullified is electrically detected, moving distances of the work piece and the machining electrode from the zero contact reference position are detected, a relative separating distance between the surface of the work piece and the tip of the machining electrode is calculated based on a result of the detection and the work piece is machined in a state where the desired separating distance is maintained.
摘要翻译：一种电化学加工方法，其中工件和加工电极彼此相对并浸入电解质溶液中，并且通过使工件的表面和工件的表面之间的电解反应来加工工件的表面在工件表面与加工用电极的前端之间的分离距离被调整并保持期望的分离距离的状态下的加工电极，其中，零接触基准位置，其中工件的表面和尖端使电极检测到加工用电极彼此接触并且使工件与加工电极之间的分离距离无效，检测出工件和加工电极与零接触基准位置的移动距离，相对计算工件表面与加工电极前端之间的距离并且在保持期望的分离距离的状态下加工工件。

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