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    • 1. 发明授权
    • Wire form heat exchange element
    • 线形换热元件
    • US4465130A
    • 1984-08-14
    • US395723
    • 1982-07-06
    • Samuel R. RomaniaGrant M. Smith
    • Samuel R. RomaniaGrant M. Smith
    • H01L23/367H01L23/467F28F7/00H01L23/34
    • H01L23/467H01L23/3677H01L2924/0002
    • The present disclosure describes a heat exchange element for attachment to the external surface of a package containing an integrated circuit chip or die. The element has particular application in high density electronic packaging configurations, where space limitations severely curtail the volume which can be occupied thereby. The structure of the present element is such that both the effective cooling area per given volume and the heat transfer coefficient are maximized. Basically the element is an integral structure comprised of a generally helical wire form with substantially elliptic turns wrapped around a metallic plate in symmetrical fashion and in intimate contact with opposed edges of the latter. The wire form provides a plurality of parallel closely spaced-apart cylindrical sections capable of being disposed in an air stream for dissipating the heat generated in the integrated circuit package to which the element is attached.
    • 本公开描述了用于附接到包含集成电路芯片或管芯的封装的外表面的热交换元件。 该元件在高密度电子封装结构中具有特殊应用,其中空间限制严重地限制了由此可以占用的体积。 本元件的结构使得每给定体积的有效冷却面积和传热系数都最大化。 基本上,该元件是整体结构,其包括大致螺旋形的线形,其基本上椭圆形的匝以对称的方式缠绕在金属板上并且与后者的相对的边缘紧密接触。 导线形式提供多个平行紧密间隔开的圆柱形部分,其能够设置在空气流中,以便散发在元件附接到的集成电路封装中产生的热量。
    • 2. 发明授权
    • Heat exchanger for integrated circuit packages
    • 用于集成电路封装的热交换器
    • US4421161A
    • 1983-12-20
    • US375491
    • 1982-05-06
    • Samuel R. RomaniaGrant M. Smith
    • Samuel R. RomaniaGrant M. Smith
    • H01L23/467F28F7/00
    • H01L23/467H01L2924/0002
    • The present disclosure describes a heat exchange device for attachment to the external surface of a package containing an integrated circuit chip or die. The device has particular application in high density electronic packaging configurations, where space limitations severely curtail the volume which can be occupied thereby. The structure of the present device is such that both the effective cooling area per given volume and the heat transfer coefficient are maximized. Basically, the device is an integral structure comprised of a generally helical wire form affixed to a metallic frame-like member. The wire form provides a plurality of parallel closely spaced-apart cylindrical sections capable of being disposed in an air stream for dissipating the heat generated in the integrated circuit package to which the device is attached.
    • 本公开描述了用于附接到包含集成电路芯片或管芯的封装的外表面的热交换装置。 该装置在高密度电子封装配置中具有特殊应用,其中空间限制严重地限制了由此可以占用的体积。 本装置的结构使得每给定体积的有效冷却面积和传热系数都最大化。 基本上,该装置是整体结构,其包括固定在金属框架状构件上的大致螺旋形线形式。 导线形式提供多个平行紧密间隔开的圆柱形部分,其能够设置在空气流中,用于耗散在装置所附接的集成电路封装中产生的热量。
    • 4. 发明授权
    • Air sampling system for smoke detection
    • 用于烟雾探测的空气采样系统
    • US4615224A
    • 1986-10-07
    • US764230
    • 1985-08-09
    • Grant M. SmithSamuel R. RomaniaVladimir M. Tamarkin
    • Grant M. SmithSamuel R. RomaniaVladimir M. Tamarkin
    • G01N1/26
    • G01N1/26
    • The present disclosure describes an air sampling system which is particularly effective in detecting minute quantities of smoke caused by electrical short circuits in equipment housed in an air cooled cabinet. More, specifically, the system is useful where large number of rack-mounted printed circuit cards are employed. The system employs air sampling cylinders mounted in proximity to the cards, and through the establishment of a pressure differential, causes an air sample to be drawn into the tubes and through a detector box which includes a smoke detection unit. The presence of smoke is conveyed to a control box which responds by removing electrical power to the cards, thereby averting further damage to the cards or surrounding structures.
    • 本公开描述了一种空气采样系统,其特别有效地检测由容纳在空气冷却柜中的设备中的电气短路引起的微小烟雾。 更具体地说,该系统在使用大量机架安装印刷电路卡时是有用的。 该系统采用安装在卡附近的空气取样筒,并且通过建立压力差,使空气样品被吸入管中并通过包括烟雾检测单元的检测器盒。 烟雾的存在被传送到控制箱,其通过去除卡的电力来进行响应,从而避免对卡或周围结构的进一步的损坏。
    • 9. 发明授权
    • Stackable high density RAM modules
    • 可堆叠高密度RAM模块
    • US6049467A
    • 2000-04-11
    • US144322
    • 1998-08-31
    • Vladimir K. TamarkinGrant M. Smith
    • Vladimir K. TamarkinGrant M. Smith
    • H01L25/10H05K1/14H05K7/02
    • H05K1/144H01L25/105H01L2225/1023H01L2225/1058H01L2225/1094H01L2924/0002
    • A stacked circuit assembly is provided for mounting memory modules in close proximity to an integrated circuit. The assembly includes an integrated circuit mounted on a printed circuit board and at least one stacked printed circuit board mounted in substantially parallel arrangement with respect to the printed circuit board on which the integrated circuit is mounted. A memory module is mounted for electrical connection on a surface of the stacked printed circuit board and an interface connector is mounted on facing surfaces of the printed circuit board and the stacked printed circuit board, thereby providing means for both mechanical and electrical connection between the boards. The integrated circuit and the memory module are mounted in parallel relationship with respect to one another for electrical interconnection through the boards and the interface connectors, thereby reducing the physical distance between the integrated circuit and the memory module.
    • 提供了用于将存储器模块安装在紧密集成电路的堆叠电路组件。 组件包括安装在印刷电路板上的集成电路和至少一个堆叠的印刷电路板,该印刷电路板相对于其上安装集成电路的印刷电路板基本上平行地布置。 安装存储器模块用于在堆叠的印刷电路板的表面上电连接,并且接口连接器安装在印刷电路板和堆叠的印刷电路板的相对表面上,由此提供用于板之间的机械和电连接的装置 。 集成电路和存储器模块相对于彼此并联安装,以通过电路板和接口连接器进行电互连,从而减小集成电路和存储器模块之间的物理距离。
    • 10. 发明授权
    • Contact probe assembly
    • 接触探头组件
    • US4647852A
    • 1987-03-03
    • US782949
    • 1985-09-25
    • Grant M. SmithGeorge J. Sprenkle
    • Grant M. SmithGeorge J. Sprenkle
    • G01R31/28G01R31/02G01R1/06
    • H01R12/714G01R31/2808
    • The present disclosure describes an assembly which has particular application in the testing of printed circuit boards. More specifically, the assembly is comprised of an apertured holding plate which is registered with the board under test, and a probe subassembly. The latter includes a body member having a spring-actuated plunger type probe and a hook-like member. In operation, the body member is advanced toward the plate and the probe and hook-like member enter respective plate apertures. As electrical contact is made by the probe with a desired test location on the board, the hook-like member locks the body onto the plate. The body member is so formed that subsequent pressure applied thereto will release it from its locked condition.
    • 本公开描述了在印刷电路板的测试中具有特殊应用的组件。 更具体地,该组件包括与被测试板配准的多孔保持板和探针子组件。 后者包括具有弹簧致动柱塞型探针和钩状构件的主体构件。 在操作中,主体部件朝向板前进,探针和钩状部件进入相应的板孔。 由于通过探针在板上具有期望的测试位置进行电接触,钩状构件将身体锁定在板上。 主体构件形成为随后施加的压力将其从其锁定状态释放。