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    • 1. 发明申请
    • A MASK FOR CRYSTALLIZING POLYSILICON AND A METHOD FOR FORMING THIN FILM TRANSISTOR USING THE MASK
    • 用于晶体结晶的掩模和使用掩模形成薄膜晶体管的方法
    • WO2003043093A1
    • 2003-05-22
    • PCT/KR2002/000111
    • 2002-01-24
    • SAMSUNG ELECTRONICS CO., LTD.KANG, Myung-KooKIM, Hyun-JaeKANG, Sook-Young
    • KANG, Myung-KooKIM, Hyun-JaeKANG, Sook-Young
    • H01L29/786
    • H01L21/02675H01L21/02532H01L21/0268H01L21/2026H01L29/66757H01L29/78675Y10S260/35
    • A mask for forming polysilicon has a first slit region where a plurality of horizontal slit patterns are arranged in the vertical direction while bearing the same width, a second slit region where a plurality of horizontal slit patterns are arranged in the vertical direction while bearing the same width, a third slit region where a plurality of horizontal slit patterns are arranged in the vertical direction while bearing the same width, and a fourth slit region where a plurality of horizontal slit patterns are arranged in the vertical direction while bearing the same width. The slit patterns arranged at the first to fourth slit regions are sequentially enlarged in width in the horizontal direction in multiple proportion to the width d of the slit pattern at the first slit region. The centers of the slit patterns arranged at the first to fourth slit regions in the horizontal direction are placed at the same line. The slit patterns arranged at the respective slit regions in the vertical direction are spaced from each other with a distance of 8*d. Alternatively, the first to fourth slit regions may be arranged in reverse order, or in the vertical direction.
    • 用于形成多晶硅的掩模具有第一狭缝区域,其中垂直方向上布置多个水平狭缝图案,同时承载相同的宽度,在垂直方向上布置多个水平狭缝图案的第二狭缝区域,同时承载相同的宽度 宽度,在垂直方向上布置多个水平狭缝图案同时具有相同宽度的第三狭缝区域,以及沿着垂直方向布置多个水平狭缝图案的第四狭缝区域,同时承载相同的宽度。 布置在第一至第四狭缝区域的狭缝图案在第一狭缝区域上与狭缝图案的宽度d成一定比例地沿水平方向的宽度依次增大。 沿水平方向布置在第一至第四狭缝区域处的狭缝图案的中心位于相同的线上。 在垂直方向的各个狭缝区域上排列的狭缝图案彼此间隔8 * d。 或者,第一至第四狭缝区域可以以相反的顺序或在垂直方向上布置。
    • 3. 发明申请
    • THIN FILM TRANSISTOR AND LIQUID CRYSTAL DISPLAY
    • 薄膜晶体管和液晶显示器
    • WO2003060602A1
    • 2003-07-24
    • PCT/KR2003/000008
    • 2003-01-03
    • SAMSUNG ELECTRONICS CO., LTD.KANG, Myung-KooKIM, Hyun-JaeKANG, Sook-YoungCHUNG, Woo-Suk
    • KANG, Myung-KooKIM, Hyun-JaeKANG, Sook-YoungCHUNG, Woo-Suk
    • G02F1/136
    • H01L29/42384G02F1/13454G02F2202/104H01L21/02675H01L21/2026H01L29/78675
    • The present invention relates to a thin film transistor and a liquid crystal display. A gate electrode is formed to include at least one portion extending in a direction perpendicular to a gain growing direction in order to make electrical charge mobility of TFTs uniform without increasing the size of the driving circuit. A thin film transistor according to the present invention includes a semiconductor pattern a thin film of poly-crystalline silicon containing grown grains on the insulating substrate. The semiconductor pattern includes a channel region and source and drain regions opposite with respect to the channel region. A gate insulating layer covers the semiconductor pattern. On the gate insulating layer, a gate electrode including at least one portion extending in a direction crossing the growing direction of the grains and overlapping the channel region is formed. In a liquid crystal display according to the present invention, a plurality of thin film transistors forming a data driver circuit include thin films of polycrystalline silicon formed by sequential lateral solidification, at least one portion of a gate electrode of each thin film transistor extends in a direction crossing the grain growing direction, and at least one of the plurality of thin film transistors has a gate electrode having a pattern different from other thin film transistors.
    • 本发明涉及薄膜晶体管和液晶显示器。 栅电极被形成为包括沿垂直于增益生长方向的方向延伸的至少一个部分,以使TFT的电荷迁移率均匀,而不增加驱动电路的尺寸。 根据本发明的薄膜晶体管包括在绝缘基板上具有含有生长晶粒的多晶硅薄膜的半导体图案。 半导体图案包括沟道区和相对于沟道区相反的源极和漏极区。 栅极绝缘层覆盖半导体图案。 在栅极绝缘层上形成栅电极,该栅电极具有沿与晶粒的生长方向交叉的方向延伸的至少一部分,与沟道区重叠。 在根据本发明的液晶显示器中,形成数据驱动电路的多个薄膜晶体管包括通过顺序横向固化形成的多晶硅薄膜,每个薄膜晶体管的栅电极的至少一部分以 方向与晶粒生长方向交叉,并且多个薄膜晶体管中的至少一个具有与其它薄膜晶体管不同的图案的栅电极。
    • 5. 发明申请
    • A METHOD FOR MANUFACTURING A THIN FILM TRANSISTOR USING POLY SILICON
    • 使用聚硅制造薄膜晶体管的方法
    • WO2003052833A1
    • 2003-06-26
    • PCT/KR2002/000131
    • 2002-01-29
    • SAMSUNG ELECTRONICS CO., LTD.SONG, Jean, HoCHOI, Joon, HooCHOI, Beom-RakKANG, Myung-KooKANG, Sook-Young
    • SONG, Jean, HoCHOI, Joon, HooCHOI, Beom-RakKANG, Myung-KooKANG, Sook-Young
    • H01L29/786
    • H01L29/66757H01L29/78675
    • A manufacturing method of a thin film transistor. An amorphous silicon thin film is formed on an insulating substrate, and is crystallized by a lateral solidification process with illumination of laser beams into the amorphous silicon thin film to form a polysilicon thin film. Next, protrusion portions protruding from the surface of the polysilicon thin film are removed by plasma dry-etching using a gas mixture including Cl 2 , SF 6 and Ar at the ratio of 3:1:2 to smooth the surface of the polysilicon thin film, and the semiconductor layer is formed by patterning the polysilicon thin film. A gate insulating film covering the semiconductor layer is formed and a gate electrode is formed on the gate insulating film opposite the semiconductor layer. A source region and a drain region opposite each other with respect to the gate electrode are formed by implanting impurities into I the semiconductor layer and a source electrode and drain electrode are forined to be electrically connected to the source region and drain region.
    • 薄膜晶体管的制造方法。 在绝缘基板上形成非晶硅薄膜,并通过横向固化工艺使激光束照射到非晶硅薄膜中而形成多晶硅薄膜而结晶。 接下来,通过使用包含Cl 2,SF 6和Ar的气体混合物以3:1:2的比例通过等离子体干法蚀刻去除从多​​晶硅薄膜的表面突出的突出部分,以平滑多晶硅薄膜的表面,并且 通过图案化多晶硅薄膜形成半导体层。 形成覆盖半导体层的栅极绝缘膜,并且在与半导体层相对的栅极绝缘膜上形成栅电极。 通过将杂质注入到半导体层中而形成源极区域和相对于栅极电极相对的漏极区域,源电极和漏极电极被电连接到源极区域和漏极区域。
    • 9. 发明申请
    • WAFER TESTING SYSTEM COMPRISING CHILLER
    • 包括冷冻机的水果测试系统
    • WO2009113749A1
    • 2009-09-17
    • PCT/KR2008/001499
    • 2008-03-17
    • SEMICS INC.KANG, Myung-KooPARK, Chan-MinKANG, Kun-Su
    • KANG, Myung-KooPARK, Chan-MinKANG, Kun-Su
    • H01L21/66
    • H01L21/67109G01R31/2877
    • A wafer test system including a wafer prober device having a chuck is provided. The wafer test system includes: a dry air supply device receiving compressed air and dehumidifying the compressed air; a cooling device including a container for storing liquefied gas; and a central control device cooling dry air supplied from the dry air supply device, mixing the cooled dry air with a predetermined amount of the liquefied gas stored in the container, and supplying the mixture to the chuck of the wafer prober device. Accordingly, the wafer test system has refrigeration efficiency optimized for testing a wafer in an ultra-low temperature environment by using the wafer prober device, thereby reducing a preparation time for testing the wafer in the ultra-low temperature environment.
    • 提供了包括具有卡盘的晶片探测器装置的晶片测试系统。 晶片测试系统包括:干燥空气供应装置,接收压缩空气并对压缩空气进行除湿; 冷却装置,包括用于储存液化气体的容器; 以及中央控制装置,其冷却从干燥空气供给装置供给的干燥空气,将冷却的干燥空气与存储在容器中的规定量的液化气体混合,将混合物供给到晶片探测装置的卡盘。 因此,晶片测试系统具有优化的制冷效率,用于通过使用晶片探针器件在超低温环境中测试晶片,从而减少了在超低温环境下测试晶片的准备时间。
    • 10. 发明申请
    • ILLUMINATING DEVICE USING LIGHT SOURCE DEVICE
    • 使用光源设备的照明设备
    • WO2006031037A1
    • 2006-03-23
    • PCT/KR2005/002998
    • 2005-09-12
    • KANG, Myung-Koo
    • KANG, Myung-Koo
    • F21V8/00
    • G02B6/0006G03B15/02
    • Disclosed is an illuminating device using light emitting elements. The illuminating device includes a plurality of focusing lens sets (2) including light emitting elements and a lens assembly for gathering light such that the light radiated from the light emitting elements is directed to a single focusing point within a predetermined incident angle, a light transfer unit (3) spaced apart from the focusing lens sets (2) by a predetermined distance and including an optical fiber or an optical waveguide having a light incident surface formed at the focusing point and a light emitting surface formed in opposition to the light incident surface, and a light radiating unit (4) connected to the light emitting surface of the light transfer unit (3) in order to radiate the light generated from the light emitting surface toward a predetermined area. The light emitting elements, such as laser diodes or LEDs, are used as light sources. Light generated from the light emitting element is focused onto the light incident surface of the optical fiber or the optical waveguide spaced apart from the light emitting element by a predetermine distance, so that the light emits through the light emitting surface by passing through the optical fiber or the optical waveguide, thereby illuminating a desired place. The illuminating device effectively illuminates a specific area located within a short distance or a long distance (more than 1 Km) from the illuminating device. If the light radiating unit (4) is fabricated in the form of a projection lens set equipped with a reverse-zoom lens, the illuminating device maximizes the light efficiency in cooperation with an external device, such as a camera using a zoom lens.
    • 公开了使用发光元件的照明装置。 照明装置包括多个包括发光元件的聚焦透镜组(2)和用于聚集光的透镜组件,使得从发光元件辐射的光被引导到预定入射角内的单个聚焦点,光传输 单元(3)与聚焦透镜组(2)间隔预定距离,并且包括具有形成在聚焦点处的光入射表面的光纤或光波导和与光入射面成反比的发光面 以及连接到光传输单元(3)的发光表面的光辐射单元(4),以便将从发光表面产生的光朝向预定区域辐射。 诸如激光二极管或LED的发光元件被用作光源。 从发光元件产生的光被聚焦在与光发射元件间隔开的光纤或光波导的光入射面上预定的距离,使得光通过光纤通过发光表面 或光波导,从而照亮所需的位置。 照明装置有效地照射距离照明装置短距离或长距离(大于1公里)的特定区域。 如果以配备有反变焦镜头的投影透镜组的形式制造光照射单元(4),则照明装置与诸如使用变焦透镜的照相机等外部装置协调使光效达到最大。