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1. 发明授权

US06825478B1 MALDI plate with removable magnetic insert 失效
标题翻译： MALDI板带可移动磁性插件
公开(公告)号：US06825478B1
公开(公告)日：2004-11-30
申请号：US10683024
申请日：2003-10-10
申请人： Robert D. McCarthy , Kevin M. Hayden , Timothy E. Hutchins , Philip J. Savickas , Peter C. Cranshaw
发明人： Robert D. McCarthy , Kevin M. Hayden , Timothy E. Hutchins , Philip J. Savickas , Peter C. Cranshaw
IPC分类号： B01D5944
CPC分类号： B01L9/523 , B01L2200/04 , B01L2300/0829 , H01J49/0418
摘要： A sample plate structure is provided including a retainer plate having a central recess with a trough along its periphery, a sample insert plate which fits into and rests on contact surface of the recess, and a magnet that is held below the contact surface. A portion of the bottom surface of the insert is formed of a magnetic material. The magnet provides sufficient force to retain the insert plate in the retainer plate during MALDI MS analysis. The sample insert plate is provided with a peripheral configuration, which assures that the sample insert plate is properly oriented within the sample plate support structure and is held flat. A hole for a protrusion allows easy insert installation and alignment against the orientation feature in the recess as well as easy removal of the insert simply by pushing up from underneath the retainer plate. While the insert sample plate can be a consumable, the remaining portion of the apparatus can be reused.
摘要翻译：提供了样品板结构，其包括保持板，该保持板具有沿着其周边具有槽的中心凹部，嵌入并搁置在凹部的接触表面上的样品插入板以及保持在接触表面下方的磁体。插入件底面的一部分由磁性材料形成。在MALDI MS分析期间，磁体提供足够的力以将插入板保持在保持板中。样品插入板设置有周边结构，其确保样品插入板适当地定位在样品板支撑结构内并保持平坦。用于突起的孔允许容易的插入件安装和对准凹部中的取向特征，并且简单地通过从保持板的下方向上推动来容易地移除插入件。当插入样品板可以是消耗品时，装置的剩余部分可以重复使用。

2. 发明授权

US06953928B2 Ion source and methods for MALDI mass spectrometry 有权
公开(公告)号：US06953928B2
公开(公告)日：2005-10-11
申请号：US10700300
申请日：2003-10-31
申请人： Marvin L. Vestal , Kevin M. Hayden , Philip J. Savickas
发明人： Marvin L. Vestal , Kevin M. Hayden , Philip J. Savickas
IPC分类号： H01J27/24 , H01J49/16 , H01J49/40 , B01D59/44 , H01J49/00
CPC分类号： H01J49/0418 , H01J49/061 , H01J49/164
摘要： Provided are MALDI ion sources, methods of forming ions and mass analyzer systems. In various embodiments, provided are MALDI ion sources configured to irradiate a sample on a sample surface with a pulse of laser energy at angle within 10 degrees or less of the surface normal, and a first ion optics system configured to extract sample ions in a direction within 5 degrees or less of the surface normal. In various embodiments, MALDI ion sources having substantially coaxial sample irradiation and ion extraction are provided. In various embodiments, methods are provided, which produce sample ions by MALDI and extract sample ions using an accelerating electrical field to form an ion beam, such that, the angle of the trajectory at the exit from the accelerating electrical field of sample ions substantially at the center of the ion beam is substantially independent of sample ion mass.

3. 发明授权

US07109480B2 Ion source and methods for MALDI mass spectrometry 有权
标题翻译：离子源和MALDI质谱法的方法
公开(公告)号：US07109480B2
公开(公告)日：2006-09-19
申请号：US11065341
申请日：2005-02-23
申请人： Marvin L. Vestal , Kevin M. Hayden , Philip J. Savickas
发明人： Marvin L. Vestal , Kevin M. Hayden , Philip J. Savickas
IPC分类号： H01J49/10 , H01J49/00 , B01D59/44
CPC分类号： H01J49/0418 , H01J49/061 , H01J49/164
摘要： Provided are MALDI ion sources, methods of forming ions and mass analyzer systems. In various embodiments, provided are MALDI ion sources configured to irradiate a sample on a sample surface with a pulse of laser energy at angle within 10 degrees or less of the surface normal, and a first ion optics system configured to extract sample ions in a direction within 5 degrees or less of the surface normal. In various embodiments, MALDI ion sources having substantially coaxial sample irradiation and ion extraction are provided. In various embodiments, methods are provided, which produce sample ions by MALDI and extract sample ions using an accelerating electrical field to form an ion beam, such that, the angle of the trajectory at the exit from the accelerating electrical field of sample ions substantially at the center of the ion beam is substantially independent of sample ion mass.
摘要翻译：提供的是MALDI离子源，形成离子的方法和质量分析仪系统。在各种实施例中，提供了配置成用样品表面上的样品以表面法线的10度或更小的角度的激光能量的脉冲照射的MALDI离子源，以及第一离子光学系统，其被配置为沿着方向在5度以内的表面正常。在各种实施例中，提供具有基本上同轴的样品照射和离子提取的MALDI离子源。在各种实施例中，提供了通过MALDI产生样品离子并使用加速电场提取样品离子以形成离子束的方法，使得在离开加速电场的出口处的轨迹的角度基本上在离子束的中心基本上与样品离子质量无关。

4. 发明授权

US07351959B2 Mass analyzer systems and methods for their operation 有权
标题翻译：质量分析仪系统及其操作方法
公开(公告)号：US07351959B2
公开(公告)日：2008-04-01
申请号：US11129204
申请日：2005-05-13
申请人： Kevin M. Hayden , Marvin L. Vestal , Jennifer M. Campbell
发明人： Kevin M. Hayden , Marvin L. Vestal , Jennifer M. Campbell
IPC分类号： H01J49/16 , H01J49/40
CPC分类号： H01J49/164 , H01J49/004
摘要： The present teachings relate to MALDI-TOF instruments, instrument components, and methods of operation thereof. In various aspects, the MALDI-TOF instrument can serve and be operated as a MS/MS instrument. In various embodiments, provided are MALDI-TOF instruments, and methods of operating one or more components of a MALDI-TOF instrument, that facilitate one or more of increasing sensitivity, increasing resolution, increasing dynamic mass range, increasing sample support throughput, and decreasing operational downtime.
摘要翻译：本教导涉及MALDI-TOF仪器，仪器部件及其操作方法。在各个方面，MALDI-TOF仪器可以作为MS / MS仪器进行操作。在各种实施方案中，提供了MALDI-TOF仪器，以及操作MALDI-TOF仪器的一个或多个组分的方法，其促进增加灵敏度，增加分辨率，增加动态质量范围，增加样品支持产量和降低运行停机

5. 发明授权

US07385186B2 Methods of operating ion optics for mass spectrometry 有权
标题翻译：操作离子光学用于质谱的方法
公开(公告)号：US07385186B2
公开(公告)日：2008-06-10
申请号：US11129661
申请日：2005-05-13
申请人： Kevin M. Hayden , Marvin L. Vestal
发明人： Kevin M. Hayden , Marvin L. Vestal
IPC分类号： B01D59/44 , H01J49/00
CPC分类号： H01J49/06
摘要： In various embodiments, provided are methods for focusing ions for an ion fragmentor, and methods for operating an ion optics assembly. In various embodiments, the present teachings provide methods that substantially maintain the position of the focal point of the an incoming ion beam over a wide range of collision energies, and thereby provide a collimated ion beam for a collision cell over a wide range of energies. In various embodiments, the present teachings provide methods that facilitate decreasing ion transmission losses over a wide range of collision energies.
摘要翻译：在各种实施例中，提供了用于聚焦离子用于离子碎片的方法，以及用于操作离子光学组件的方法。在各种实施例中，本教导提供了在大范围的碰撞能量上基本上保持入射离子束的焦点的位置的方法，从而在宽范围的能量下为碰撞单元提供准直的离子束。在各种实施例中，本教导提供了有助于在宽范围的碰撞能量下减少离子传播损失的方法。

6. 发明授权

US07176454B2 Ion sources for mass spectrometry 有权
标题翻译：用于质谱的离子源
公开(公告)号：US07176454B2
公开(公告)日：2007-02-13
申请号：US11129658
申请日：2005-05-13
申请人： Kevin M. Hayden , Marvin Vestal , Jennifer M. Campbell
发明人： Kevin M. Hayden , Marvin Vestal , Jennifer M. Campbell
IPC分类号： H01J49/00
CPC分类号： H01J49/164
摘要： Provided are ion sources, methods of forming ions and mass analyzer systems. In various embodiments, the present teachings provide ion sources, methods for focusing ions from an ion source, and methods for operating a time-of-flight mass analyzer. In various embodiments, the present teachings relate to matrix-assisted laser desorption/ionization (MALDI) ion sources and methods of MALDI ion source operation, for use with mass analyzers. In various aspects, provided are ion sources and methods of operation thereof that facilitate increasing one or more of sensitivity and resolution of a TOF mass analyzer configured for multiple modes of operation.
摘要翻译：提供离子源，形成离子的方法和质量分析仪系统。在各种实施例中，本教导提供离子源，用于聚焦离子源的离子的方法以及用于操作飞行时间质量分析器的方法。在各种实施例中，本教导涉及基质辅助激光解吸/电离（MALDI）离子源和MALDI离子源操作的方法，用于质谱分析仪。在各个方面，提供离子源及其操作方法，其有助于增加配置为多种操作模式的TOF质量分析仪的灵敏度和分辨率的一种或多种。

7. 发明授权

US06534764B1 Tandem time-of-flight mass spectrometer with damping in collision cell and method for use 有权
标题翻译：串联飞行时间质谱仪在碰撞池中具有阻尼和使用方法
公开(公告)号：US06534764B1
公开(公告)日：2003-03-18
申请号：US09590878
申请日：2000-06-09
申请人： Anatoli N. Verentchikov , Marvin L. Vestal , Kevin M. Hayden
发明人： Anatoli N. Verentchikov , Marvin L. Vestal , Kevin M. Hayden
IPC分类号： B01D5944
CPC分类号： H01J49/40 , H01J49/004
摘要： A tandem mass spectrometer is disclosed having a collisional damping cell that slows down and adapts an ion beam, from a time-of-flight mass spectrometer (TOF MS) to a second mass spectrometer, preferably an orthogonal TOF MS. The cell provides a substantial damping of the energy of the ions in multiple collisions with a gas. An RF-only quadrupole is used to spatially focus the ion beam in the collision cell. As result, the operation of second mass spectrometer can be decoupled from the rest of the instrument, or in some cases with the energy being sufficiently damped the pulsed nature of the primary ion beam can be partially preserved and used to enhance the sensitivity of the second mass spectrometer. An ion selector passes only stable parent ions of interest, thereby introducing ions into the cell at a well controlled low energy. The ion beam can be injected into the collision cell with or without separation as well as with or without fragmentation. Thus, the results obtained with the second mass spectrometer can be used to control each individual step of the tandem MS, including ion formation in the source, ion focusing, metastable fragmentation in the first time of-flight spectrometer, primary ion selection and fragmentation in the cell as well as provide mass analysis of fragment ions. By using a high repetition rate laser at increased energy levels, the acquisition of data is significantly accelerated and adjustments on each individual step may be conveniently automated. The MS analysis can be also applied to analysis of analytes from continuous ion sources by using an orthogonal pulser in the first TOF MS to modulate the beam followed by spatial focusing of the pulsed beam.
摘要翻译：公开了一种串联质谱仪，其具有从飞行时间质谱仪（TOF MS）到第二质谱仪（优选正交TOF MS）减慢并适应离子束的碰撞阻尼单元。电池在与气体的多次碰撞中提供离子的能量的实质阻尼。仅使用RF的四极杆用于将碰撞室中的离子束空间聚焦。因此，第二质谱仪的操作可以与仪器的其余部分分离，或者在某些情况下，能量被充分阻尼，主离子束的脉冲特性可被部分保留并用于提高第二质谱仪的灵敏度质谱仪离子选择器仅通过感兴趣的稳定的母体离子，从而以良好控制的低能量将离子引入电池。可以将离子束注入到具有或不具有分离的碰撞池中，以及是否具有分段。因此，使用第二质谱仪获得的结果可用于控制串联MS的每个单独步骤，包括源中的离子形成，离子聚焦，第一次飞行时光谱仪中的亚稳碎裂，初级离子选择和碎裂并提供碎片离子的质量分析。通过在增加的能量水平下使用高重复率激光器，数据的采集被显着加速，并且可以方便地自动地对每个单独步骤进行调整。 MS分析还可以应用于通过使用第一TOF MS中的正交脉冲发生器来对来自连续离子源的分析物进行分析，以调制光束，然后进行脉冲束的空间聚焦。

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