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    • 3. 发明授权
    • Planarization of substrates using electrochemical mechanical polishing
    • 使用电化学机械抛光对基板进行平面化
    • US06811680B2
    • 2004-11-02
    • US10038066
    • 2002-01-03
    • Liang-Yuh ChenWei-Yung HsuAlain DuboustRatson MoradDaniel A. Carl
    • Liang-Yuh ChenWei-Yung HsuAlain DuboustRatson MoradDaniel A. Carl
    • B23H506
    • B23H5/08
    • A method and apparatus are provided for planarizing a material layer on a substrate. In one aspect, a method is provided for processing a substrate including forming a passivation layer on a substrate surface, polishing the substrate in an electrolyte solution, applying an anodic bias to the substrate surface, and removing material from at least a portion of the substrate surface. In another aspect, an apparatus is provided which includes a partial enclosure, polishing article, a cathode, a power source, a substrate carrier movably disposed above the polishing article, and a computer based controller to position a substrate in an electrolyte solution to form a passivation layer on a substrate surface, to polish the substrate in the electrolyte solution with the polishing article, and to apply an anodic bias to the substrate surface or polishing article to remove material from at least a portion of the substrate surface.
    • 提供了一种用于平坦化衬底上的材料层的方法和装置。 在一个方面,提供一种用于处理衬底的方法,包括在衬底表面上形成钝化层,在电解质溶液中抛光衬底,向衬底表面施加阳极偏压,以及从衬底的至少一部分去除材料 表面。 在另一方面,提供了一种装置,其包括部分外壳,抛光制品,阴极,电源,可移动地设置在抛光制品上方的基板载体,以及基于计算机的控制器,以将基板定位在电解质溶液中以形成 在衬底表面上的钝化层,用抛光制品抛光电解质溶液中的衬底,并将阳极偏压施加到衬底表面或抛光制品上以从衬底表面的至少一部分去除材料。