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    • 1. 发明授权
    • Methods, systems, and articles of manufacture for creating or manipulating electrical data sets for an electronic design
    • 用于创建或操纵电子设计的电子数据集的方法,系统和制造
    • US09177095B1
    • 2015-11-03
    • US13282177
    • 2011-10-26
    • Prakash KrishnanWilfred Vance KenzleAkshat Shah
    • Prakash KrishnanWilfred Vance KenzleAkshat Shah
    • G06G7/62G06F17/50
    • G06F17/5063G06F17/5036G06F17/5045G06F17/5068G06F17/5081
    • Disclosed are method(s), system(s), and article(s) of manufacture for creating or manipulating electrical data sets for an electronic design across multiple abstraction levels. The method identifies simulation result(s) obtained from simulation run(s) for an electronic circuit or at least a portion thereof, identifies at least a part of one or more sets of simulation results, each of which is obtained from a simulation run for the electronic circuit or at least a portion thereof at the first abstraction level, identify relevant electrical data or information for design under test instance(s) of a master library or a master cell and creates electrical data set(s), generates a view for at least some of the electrical data set(s), and hand-off the electrical data set(s) to second abstraction level. The method may further identify preexisting electrical data set(s). The method may further compare the electrical data set(s) and preexisting electrical data set(s).
    • 公开了用于跨多个抽象层次创建或操纵电子设计的电气数据集的方法,系统和制造文章。 该方法识别从电子电路或其至少一部分的模拟运行获得的模拟结果,识别一组或多组模拟结果的至少一部分,每组模拟结果是从模拟运行获得的, 电子电路或其至少一部分在第一抽象级别识别用于在主库或主单元的测试实例下的设计的相关电数据或信息,并创建电数据集,生成电视数据或视图, 电数据集中的至少一些,以及将电数据集切换到第二抽象级。 该方法还可以识别预先存在的电数据集。 该方法可以进一步比较电数据集和预先存在的电数据集。
    • 4. 发明授权
    • Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness
    • 用于实现具有电气意识的电子电路设计的约束验证的方法,系统和制造
    • US08762914B2
    • 2014-06-24
    • US12982732
    • 2010-12-30
    • Ed FischerMichael McSherryDavid WhiteBruce YanagidaAkshat Shah
    • Ed FischerMichael McSherryDavid WhiteBruce YanagidaAkshat Shah
    • G06F17/50
    • G06F17/5081G06F17/5068G06F17/5077
    • Disclosed are methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness. Some embodiments identify or set parasitic constraint(s) and compare the electrical parasitic(s) with corresponding parasitic constraint(s) to determine whether the parasitic constraints are met. Some embodiments first identify, determine, or update the physical data of a component of a partial layout and characterize the electrical parasitics associated with the physical data of the component. Some embodiments identify or determine some schematic level performance constraints and estimate parasitic constraints based on schematic simulation results and the performance constraints; the estimated parasitic constraints are then compared with the corresponding electrical parasitics to determine whether the constraints are satisfied. Some embodiments further map schematic level parasitic constraints to a physical design representation and then compares the mapped parasitic constraints with corresponding electrical constraints to determine whether the mapped constraints are met.
    • 公开了用于实现具有电气意识的电子电路设计的约束验证的方法,系统和制造。 一些实施例识别或设置寄生约束,并将电子寄生与相应的寄生约束进行比较,以确定是否满足寄生约束。 一些实施例首先识别,确定或更新部分布局的部件的物理数据,并表征与部件的物理数据相关联的电寄生效应。 一些实施例基于示意性模拟结果和性能约束来识别或确定一些示意图级性能约束并且估计寄生约束; 然后将估计的寄生约束与相应的电寄生效应进行比较,以确定是否满足约束。 一些实施例还将原理层级寄生约束映射到物理设计表示,然后将映射的寄生约束与对应的电限制进行比较,以确定是否满足映射的约束。