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    • 4. 发明授权
    • Apparatus and method for image optimization of samples in a scanning electron microscope
    • 扫描电子显微镜中样品图像优化的装置和方法
    • US06992287B2
    • 2006-01-31
    • US10985144
    • 2004-11-10
    • Neal T. Sullivan
    • Neal T. Sullivan
    • G21K7/00G21G5/00
    • H01J37/28H01J2237/2817H01J2237/2826
    • A system and method for identifying an optimal landing energy of a probe current in a scanning electron microscope system. A probe current having a known landing energy is directed at a sample for producing a signal electron beam. The current of the signal electron beam is measured by directing the beam to a current detector for calculating a current yield, which is the ratio of the signal current to the probe current. The landing energy can then be changed for subsequent measurements of the signal current to identify the landing energy which produces a desired current yield. Once identified, the landing energy value can be used to produce a signal electron beam directed towards an imaging detector to generate topographic images of samples.
    • 用于在扫描电子显微镜系统中识别探针电流的最佳着陆能量的系统和方法。 具有已知着陆能量的探针电流被引导到用于产生信号电子束的样本。 通过将光束引导到电流检测器来计算电流产量,即信号电流与探针电流的比值来测量信号电子束的电流。 然后可以改变着陆能量以用于信号电流的随后测量,以识别产生期望电流产量的着陆能量。 一旦被识别,着陆能量值可用于产生指向成像检测器的信号电子束,以产生样本的地形图像。