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1. 发明专利

JP2002062255A DETECTOR FOR DETECTING SURFACE PLASMON RESONANCE ANGLE AND FLUORESCENCE CONCURRENTLY 失效
公开(公告)号：JP2002062255A
公开(公告)日：2002-02-28
申请号：JP2000250424
申请日：2000-08-22
申请人： NIPPON LASER DENSHI KK , JAPAN SCIENCE & TECH CORP
发明人： TAKEDA SHIGEKI , HAGA TATSUYA , TANAKA KOJI , YONEDA HIDEKATSU
IPC分类号： G01N21/64 , G01N21/05 , G01N21/27
摘要： PROBLEM TO BE SOLVED: To highly precisely detect a characteristic of a specimen by combining an SPR method and a fluorescence detecting method. SOLUTION: Light from a light source 9 is emitted onto a boundary of a metal thin film in a substrate 17 at a prescribed angle width, and the reflected light from the boundary is formed into the prescribed angle width to be received by the first photoreceiving member 15. A cell block is made to closely contact with the substrate, and a specimen solution labeled with a fluorescent substance is made to flow so as to be supplied to a portion corresponding to an area irradiated with the light. The second photoreceiving member 37 is provided in the cell block 21 corresponding to a substrate portion irradiated with the light to photoreceive the fluorescence from the fluorescent substance labeled to the specimen coupled to a sample probe. The specimen coupled to the sample probe is detected based on a surface plasmon resonance angle detected by the first photoreceiving member, and the fluorescence from the fluorescent substance excited by an evanescent wave generated when the light is brought into total reflection in a boundary of the metal thin film in the substrate.

2. 发明专利

JP2001343384A HYBRIDIZING METHOD AND DEHYBRIDIZING METHOD OF SAMPLE CHIP 失效
公开(公告)号：JP2001343384A
公开(公告)日：2001-12-14
申请号：JP2000166710
申请日：2000-06-02
申请人： NIPPON LASER DENSHI KK
发明人： YONEDA HIDEKATSU , SATO TAKATO
IPC分类号： G01N33/53 , C12N15/09 , C12Q1/68 , G01N33/566 , G01N37/00
摘要： PROBLEM TO BE SOLVED: To provide a hybridizing method and a dehybridizing method of a sample chip capable of executing efficient analysis of a gene expressing state by hybridizing and dehybridizing a DNA probe and an analytical DNA in a short time, and to provide a hybridizing method and a dehybridizing method of a sample chip capable of executing analysis work with high accuracy by using a low-concentration analytical DNA, and reducing, the analytical cost. SOLUTION: An analytical sample is hybridized with respect to many sample probes arranged and fixed at fine intervals on the sample chip. At that time, a voltage is applied to the part between a first electrode and a second electrode arranged oppositely to the first electrode at a prescribed interval with the sample chip set on the first electrode heated. The sample probe of the sample chip set on the first electrode is electrified to have the positive charge and simultaneously the analytical sample between both electrodes is electrified to have the negative charge, thereby to cause dielectric attraction of the analytical sample to the sample probe.

3. 发明专利

JP2003247983A TARGET SUBSTANCE MASS SPECTROMETRIC SYSTEM 审中-公开
公开(公告)号：JP2003247983A
公开(公告)日：2003-09-05
申请号：JP2002048148
申请日：2002-02-25
申请人： NIPPON LASER DENSHI KK
发明人： TANAKA KOJI , SATO TAKATO , MORIYAMA EMIKO , FUKAO YASUHIRO , YONEDA HIDEKATSU
IPC分类号： G01N27/62 , G01N1/00 , G01N1/28 , G01N27/64 , G01N37/00
摘要： PROBLEM TO BE SOLVED: To provide a target substance mass spectrometric system capable of performing mass spectrometry with respect to many kinds of target substances effectively and at a low cost. SOLUTION: By using a measurement chip made by specifically bonding target substances to a multitude of fixed specimens fixed on a surface of a substrate, electric-field kinetic energy is given to molecular ions of the target substance ionized by irradiating each target substance with laser light thereby performing mass detection to fix the target substance. It is made possible to selectively and communicatingly connect a multitude of suction members, dispensing members, and suction/discharge members, agreeing with the number of fixed specimens fixed on the substrate with a metallic thin film formed thereon. By using the respective suction members, a prescribed amount of each fixed specimen solution is dispensed onto the substrate. After the solution of each target substance is sucked by each suction member into a corresponding suction/ discharge member, with the suction/discharge member communicating with the dispensing member, the suction/discharge member is activated to dispense the target substance solution to the fixed specimen solution fixed on the substrate for specific bonding reaction. COPYRIGHT: (C)2003,JPO

4. 发明专利

JP2003172701A DEVICE FOR ANALYZING SAMPLE CHIP 审中-公开
公开(公告)号：JP2003172701A
公开(公告)日：2003-06-20
申请号：JP2001374432
申请日：2001-12-07
申请人： NIPPON LASER DENSHI KK
发明人： YONEDA HIDEKATSU , TAKASHIMA NARITSUYO
IPC分类号： G01N21/64 , G01N33/533 , G01N33/536 , G01N37/00
摘要： PROBLEM TO BE SOLVED: To provide a device and a method for analyzing a sample chip capable of improving the efficiency of an analyzing work on an assayed sample by surely and precisely detecting a fluorescence from a fluorescent material labeled to the assayed sample combined with a sample without being affected by an excitation light for the fluorescent material or a disturbing light. SOLUTION: This device is provided with a first and a second moving devices moving a sample chip holding member holding a sample chip with a plurality of samples fixed on a substrate which can guide an incident light in the longitudinal direction and in the longitudinally perpendicular direction of the sample chip respectively, a white light source, a filter member in the output side selecting a light having a wavelength exciting the fluorescent material labeled to the assayed sample reacted to the sample on the sample chip, an optical fiber bundle guiding a transmitted light to each light irradiation member, a filter member in the light reception side arranged facing to the sample chip between a pair of the light irradiation members, selectively transmitting the fluorescence from the excited fluorescent material labeled to the assayed sample reacted with the sample of the sample chip, and a light receiving unit outputting a electrical signal in accordance with the fluorescence by transmitted prescribed area. COPYRIGHT: (C)2003,JPO

5. 发明专利

JP2002085089A METHOD FOR EVALUATING CELL ACTIVITY 失效
公开(公告)号：JP2002085089A
公开(公告)日：2002-03-26
申请号：JP2000270756
申请日：2000-09-06
申请人： JAPAN SCIENCE & TECH CORP , HIROSHIMA IND TECHNOLOGY ORGAN , NIPPON LASER DENSHI KK , JMS CO LTD
发明人： YOSHIZATO KATSUTOSHI , SATO GEN , HIDE MICHIHIRO , TSUTSUI TOMOKO , YONEDA HIDEKATSU
IPC分类号： G01N33/48 , C12Q1/02 , G01N21/27 , G01N21/41 , G01N33/483 , G01N33/487 , G01N33/543
摘要： PROBLEM TO BE SOLVED: To provide a method capable of readily and exactly evaluating an effect of an external stimulation on cell activity. SOLUTION: There is disclosed a method for evaluating a biological activity of the external stimulation to a living cell using a surface plasmon resonance apparatus, and the biological activity of the external stimulation to the cell is evaluated by using as an index a secondary signal appearing after a primary signal observed when the living cell is exposed to the external stimulation.

6. 发明专利

JP2002022744A DEVICE AND METHOD FOR ANALYZING SAMPLE CHIP 失效
公开(公告)号：JP2002022744A
公开(公告)日：2002-01-23
申请号：JP2000205265
申请日：2000-07-06
申请人： NIPPON LASER DENSHI KK
发明人： TAJIMA HARUO , YONEDA HIDEKATSU
IPC分类号： C12M1/00 , C12N15/09 , G01N21/25 , G01N21/64 , G01N33/53 , G01N33/543 , G01N33/552 , G01N37/00 , G01N33/566
摘要： PROBLEM TO BE SOLVED: To provide a device and method for analyzing a sample chip which can make effective the analyzing operation of the sample to be analyzed by detecting with high fidelity and accuracy the fluorescences of different wavelengths at a time from a fluorescent material labeled to the sample which is combined to the sample probe without being affected by excitation light and disturbing light. SOLUTION: Incident light with a definite thickness is totally reflected by this device for analyzing a sample chip which enables to guide waves and irradiate inside the light from the light source to the end face of the wave guide plate, to the surface of which many sample probes are fixed. The surface of the wave guide plate to which sample probes are fixed is made image by members for image making. The fluorescent material is excited to make fluorescent by an evanescent wave occurring when the light is totally reflected to guide waves within the wave guide plate with which the sample to be analyzed, for which the fluorescent material is labeled to the sample probe, is coupled to analyze the sample by the fluorescent image of the wave guide plate which is made image.

7. 发明专利

JP2002014106A SAMPLE DISK, AND SAMPLE ANALYZER 失效
公开(公告)号：JP2002014106A
公开(公告)日：2002-01-18
申请号：JP2000195412
申请日：2000-06-29
申请人： NIPPON LASER DENSHI KK
发明人： YONEDA HIDEKATSU , SATO TAKATO
IPC分类号： G01N35/00 , B01J19/00 , C12M1/00 , C12N15/09 , C12Q1/68 , C40B40/06 , C40B70/00 , G01N33/53 , G01N35/02 , G01N35/04 , G01N37/00 , G11B7/004 , G11B7/007 , G11B11/105
摘要： PROBLEM TO BE SOLVED: To easily and efficiently read out various kinds of information abut a sample and a sample probe to be used, in a sample analyzing work. SOLUTION: A recording layer, capable of writing and reading the various kinds of the information abut the sample probe, is provided on one side face of a disk-like substrate, various kinds of the sample probes are classified to be fixed arrayed on the other side face, and at least various kinds of data about the arrayedly fixed sample probes are recordable in the recording layer. An information write and read member is moved numeral-controllably with respect to the recording layer of the sample disk, a magnetizing direction of the recording layer is oriented by light output from a light source to the recording layer and a magnetic field formed in the recording layer to record the various kinds of informations, and a labeling substance labeled to the sample for analysis for reading the various kinds of information is detected by reflected light intensity of the light emitted toward the recording layer so as to specify the sample probe crossed with the sample for analysis.

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