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1. 发明申请

US20060289862A1 Systems and methods for thermal sensing 有权
公开(公告)号：US20060289862A1
公开(公告)日：2006-12-28
申请号：US11168591
申请日：2005-06-28
申请人： Munehiro Yoshida , Daniel Stasiak , Michael Wang , Charles Johns , Hiroki Kihara , Tetsuji Tamura , Kazuaki Yazawa , Iwao Takiguchi
发明人： Munehiro Yoshida , Daniel Stasiak , Michael Wang , Charles Johns , Hiroki Kihara , Tetsuji Tamura , Kazuaki Yazawa , Iwao Takiguchi
IPC分类号： H01L23/58
CPC分类号： H01L25/162 , G06F1/206 , H01L23/34 , H01L2924/0002 , H01L2924/00
摘要： Systems and methods for positioning thermal sensors within an integrated circuit in a manner that provides useful thermal measurements corresponding to different parts of the integrated circuit. In one embodiment, an integrated circuit includes multiple, duplicate functional blocks. A separate thermal sensor is coupled to each of the duplicate functional blocks, preferably in the same relative location on each of the duplicate functional blocks, and preferably at a hotspot. One embodiment also includes thermal sensors on one or more functional blocks of other types in the integrated circuit. One embodiment includes a thermal sensor positioned at a cool spot, such as at the edge of the integrated circuit chip. Each of the thermal sensors may have ports to enable power and ground connections or data connections between the sensors and external components or devices.

2. 发明申请

US20060097757A1 Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuit 失效
公开(公告)号：US20060097757A1
公开(公告)日：2006-05-11
申请号：US10982019
申请日：2004-11-05
申请人： Melia Gordon , Charles Johns , Hiroki Kihara , Iwao Takiguchi , Tetsuji Tamura , Michael Wang , Kazuaki Yazawa , Munehiro Yoshida
发明人： Melia Gordon , Charles Johns , Hiroki Kihara , Iwao Takiguchi , Tetsuji Tamura , Michael Wang , Kazuaki Yazawa , Munehiro Yoshida
IPC分类号： H03K5/153
CPC分类号： G01K15/00 , G01R31/2856 , G01R31/2874 , G01R31/31704 , G01R31/319 , G01R31/31908
摘要： An integrated circuit die is disclosed including a temperature detection circuit and a memory configured to store calibration data. The temperature detection circuit is operatively coupled to the memory, and receives an input signal. The temperature detection circuit is configured to produce an output signal dependent upon the input signal and indicative of whether a temperature of the integrated circuit die is greater than a selected temperature. During a normal operating mode of the integrated circuit die the input signal comprises the calibration data. A system and methods for calibrating the temperature detection circuit are also described.

3. 发明授权

US07535020B2 Systems and methods for thermal sensing 有权
标题翻译：热感测系统和方法
公开(公告)号：US07535020B2
公开(公告)日：2009-05-19
申请号：US11168591
申请日：2005-06-28
申请人： Munehiro Yoshida , Daniel Stasiak , Michael F. Wang , Charles R. Johns , Hiroki Kihara , Tetsuji Tamura , Kazuaki Yazawa , Iwao Takiguchi
发明人： Munehiro Yoshida , Daniel Stasiak , Michael F. Wang , Charles R. Johns , Hiroki Kihara , Tetsuji Tamura , Kazuaki Yazawa , Iwao Takiguchi
IPC分类号： H01L23/58
CPC分类号： H01L25/162 , G06F1/206 , H01L23/34 , H01L2924/0002 , H01L2924/00
摘要： Systems and methods for positioning thermal sensors within an integrated circuit in a manner that provides useful thermal measurements corresponding to different parts of the integrated circuit. In one embodiment, an integrated circuit includes multiple, duplicate functional blocks. A separate thermal sensor is coupled to each of the duplicate functional blocks, preferably in the same relative location on each of the duplicate functional blocks, and preferably at a hotspot. One embodiment also includes thermal sensors on one or more functional blocks of other types in the integrated circuit. One embodiment includes a thermal sensor positioned at a cool spot, such as at the edge of the integrated circuit chip. Each of the thermal sensors may have ports to enable power and ground connections or data connections between the sensors and external components or devices.
摘要翻译：用于以集成电路的不同部分提供有用的热测量的方式在集成电路内定位热传感器的系统和方法。在一个实施例中，集成电路包括多个复制功能块。单独的热传感器耦合到每个重复功能块，优选地在每个复制功能块上相同的相对位置，并且优选地在热点处。一个实施例还包括在集成电路中的其它类型的一个或多个功能块上的热传感器。一个实施例包括位于集成电路芯片的边缘处的冷点处的热传感器。每个热传感器可以具有端口，以实现传感器和外部组件或设备之间的电源和接地连接或数据连接。

4. 发明授权

US07102417B2 Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuit 失效
标题翻译：包括温度检测电路的集成电路管芯，以及用于校准温度检测电路的系统和方法
公开(公告)号：US07102417B2
公开(公告)日：2006-09-05
申请号：US10982019
申请日：2004-11-05
申请人： Melia F. Gordon , Charles Ray Johns , Hiroki Kihara , Iwao Takiguchi , Tetsuji Tamura , Michael Fan Wang , Kazuaki Yazawa , Munehiro Yoshida
发明人： Melia F. Gordon , Charles Ray Johns , Hiroki Kihara , Iwao Takiguchi , Tetsuji Tamura , Michael Fan Wang , Kazuaki Yazawa , Munehiro Yoshida
IPC分类号： H03K17/78
CPC分类号： G01K15/00 , G01R31/2856 , G01R31/2874 , G01R31/31704 , G01R31/319 , G01R31/31908
摘要： An integrated circuit die is disclosed including a temperature detection circuit and a memory configured to store calibration data. The temperature detection circuit is operatively coupled to the memory, and receives an input signal. The temperature detection circuit is configured to produce an output signal dependent upon the input signal and indicative of whether a temperature of the integrated circuit die is greater than a selected temperature. During a normal operating mode of the integrated circuit die the input signal comprises the calibration data. A system and methods for calibrating the temperature detection circuit are also described.
摘要翻译：公开了一种集成电路管芯，其包括温度检测电路和配置为存储校准数据的存储器。温度检测电路可操作地耦合到存储器，并且接收输入信号。温度检测电路被配置为根据输入信号产生输出信号，并且指示集成电路管芯的温度是否大于所选择的温度。在集成电路管芯的正常操作模式期间，输入信号包括校准数据。还描述了用于校准温度检测电路的系统和方法。

5. 发明申请

US20060192597A1 Temperature sensing circuits, and temperature detection circuits including same 审中-公开
标题翻译：温度检测电路和包括其的温度检测电路
公开(公告)号：US20060192597A1
公开(公告)日：2006-08-31
申请号：US11052495
申请日：2005-02-04
申请人： Charles Johns , Michael Wang , Munehiro Yoshida
发明人： Charles Johns , Michael Wang , Munehiro Yoshida
IPC分类号： H03K5/22 , H03K5/153
CPC分类号： G01K7/425 , G01K1/026 , G01K7/01
摘要： Temperature sensing circuits are disclosed. One embodiment of a temperature sensing circuit includes a voltage divider and an analog multiplexer. The voltage divider network divides an analog voltage into multiple derived analog voltages. The analog multiplexer receives at least two of the derived analog voltages and a control signal, and is configured to produce one of the received derived analog voltages dependent upon the control signal. Temperature detection circuits including the temperature sensing circuits are also disclosed.
摘要翻译：公开了温度感测电路。温度感测电路的一个实施例包括分压器和模拟多路复用器。分压网络将模拟电压分为多个衍生的模拟电压。模拟多路复用器接收导出的模拟电压和控制信号中的至少两个，并且被配置为根据控制信号产生接收的导出的模拟电压之一。还公开了包括温度检测电路的温度检测电路。

6. 发明授权

US06876588B2 Semiconductor storage device formed to optimize test technique and redundancy technology 失效
公开(公告)号：US06876588B2
公开(公告)日：2005-04-05
申请号：US10664464
申请日：2003-09-17
申请人： Daisuke Kato , Takashi Taira , Kenji Ishizuka , Yohji Watanabe , Munehiro Yoshida
发明人： Daisuke Kato , Takashi Taira , Kenji Ishizuka , Yohji Watanabe , Munehiro Yoshida
IPC分类号： G11C8/02 , G11C29/00 , G11C29/26 , G11C7/00
CPC分类号： G11C29/785 , G11C29/26 , G11C29/787 , G11C2029/2602
摘要： There is provided a semiconductor storage device in which only a defective element is replaced by a row redundant element to compensate for a defect if at least one of a plurality of elements is defective in a case where the plurality of elements in a memory cell array are simultaneously activated. The semiconductor storage device includes an array control circuit which is configured to interrupt the operation of the defective element by preventing a word line state signal from being received based on a signal to determine whether a row redundancy replacement process is performed or not. The word line state signal is input to the plurality of memory blocks in the cell array unit via a single signal line.

7. 发明授权

US06646932B2 Semiconductor memory device having redundancy system 失效
标题翻译：具有冗余系统的半导体存储器件
公开(公告)号：US06646932B2
公开(公告)日：2003-11-11
申请号：US10162433
申请日：2002-06-03
申请人： Daisuke Kato , Munehiro Yoshida , Yohji Watanabe
发明人： Daisuke Kato , Munehiro Yoshida , Yohji Watanabe
IPC分类号： G11C700
CPC分类号： G11C29/808 , G11C29/785
摘要： A semiconductor memory device has a cell array, first normal elements each defined within the cell array as a group of memory cells arranged in a first direction of the cell array, second normal elements each defined within the cell array as a group of memory cells arranged in a second direction of the cell array, each the second normal element selecting a memory cells in operative association with a corresponding one of the first normal elements, first redundant elements disposed for replacement of defective first normal elements within the cell array, and second redundant elements disposed for replacement of defective second normal elements within the cell array. There are defined within the cell array first/second repair region as group of first/second normal elements with permission of replacement by each first/second redundant element.
摘要翻译：半导体存储器件具有单元阵列，每个在单元阵列内定义的第一法向元件作为沿单元阵列的第一方向布置的一组存储单元，每个在单元阵列内被定义为一组存储单元，每个存储单元被布置在所述单元阵列的第二方向上，每个所述第二普通元件选择与所述第一正常元件中的对应的一个操作关联的存储器单元，用于替换所述单元阵列内的有缺陷的第一正常元件的第一冗余元件和所述第二冗余元件用于替换电池阵列内的有缺陷的第二正常元件的元件。在单元阵列第一/第二修复区域内被定义为具有第一/第二正常元素的组，并且允许由每个第一/第二冗余元素替换。

8. 发明申请

US20060153277A1 Advanced thermal sensor 有权
标题翻译：先进的热传感器
公开(公告)号：US20060153277A1
公开(公告)日：2006-07-13
申请号：US11034644
申请日：2005-01-13
申请人： Munehiro Yoshida
发明人： Munehiro Yoshida
IPC分类号： G01K7/00
CPC分类号： G01K3/005 , G01K7/01
摘要： Systems and methods for reducing the complexity and size of thermal sensors, where the voltage of a thermally sensitive device is compared to a reference voltage that varies as a function of temperature, rather than being constant. One embodiment comprises a thermal sensing system including a reference voltage generator, a thermal sensor and a comparator. The reference voltage generator is configured to generate a non-constant reference voltage that varies as a known function of temperature. The thermal sensor is configured to generate a sensor voltage that also varies as a known function of temperature. The functions of the reference and sensor voltages cross at a known temperature/voltage. The comparator is configured to compare the sensor voltage and the reference voltage and to generate a comparison output signal based on the comparison of the sensor voltage and the first reference voltage. A transition in this signal indicates the reference temperature.
摘要翻译：用于降低热传感器的复杂性和尺寸的系统和方法，其中将热敏元件的电压与作为温度的函数变化的参考电压进行比较，而不是恒定。一个实施例包括包括参考电压发生器，热传感器和比较器的热感测系统。参考电压发生器被配置为产生作为已知温度函数而变化的非恒定参考电压。热传感器被配置为产生也随温度已知功能而变化的传感器电压。参考电压和传感器电压的功能在已知的温度/电压下交叉。比较器被配置为比较传感器电压和参考电压，并且基于传感器电压和第一参考电压的比较来产生比较输出信号。此信号中的转换表示参考温度。

9. 发明授权

US6063131A Emulator system and emulation method 失效
标题翻译：仿真器系统和仿真方法
公开(公告)号：US6063131A
公开(公告)日：2000-05-16
申请号：US948520
申请日：1997-10-10
申请人： Munehiro Yoshida
发明人： Munehiro Yoshida
IPC分类号： G06F11/34 , G06F11/22 , G06F11/26 , G06F11/36 , G06F9/455
CPC分类号： G06F11/3636 , G06F11/261 , G06F11/3656
摘要： An emulator system solving a problem of conventional emulator systems by recognizing a task execution history. In conventional systems, it was necessary for a microcomputer to incorporate a specific task for storing in a memory an identification number and switching time of a task to be executed next in a program to be debugged. The novel emulator system includes a first detector for detecting a write cycle of a microcomputer in which the identification number of a task to be executed next is recorded. A second detector detects the start cycle and end cycle of an interrupt. A measurement memory stores the timing of the write cycle and the timing of the start cycle and end cycle of the interrupt.
摘要翻译：通过识别任务执行历史来解决常规仿真器系统的问题的仿真器系统。在常规系统中，微型计算机需要将待调试的程序中的下一个要执行的任务的识别号码和切换时间存入存储器的特定任务。该新颖的仿真器系统包括：第一检测器，用于检测其中记录下一个要执行的任务的识别号码的微型计算机的写入周期。第二个检测器检测中断的起始周期和结束周期。测量存储器存储写周期的定时和中断的起始周期和结束周期的定时。

10. 发明授权

US5110750A Semiconductor device and method of making the same 失效
标题翻译：半导体器件及其制造方法
公开(公告)号：US5110750A
公开(公告)日：1992-05-05
申请号：US561608
申请日：1990-08-02
申请人： Munehiro Yoshida
发明人： Munehiro Yoshida
IPC分类号： H01L21/8238 , H01L21/265 , H01L27/092 , H01L29/10
CPC分类号： H01L29/107
摘要： For compensating a decreased impurity concentration at a peripheral portion of a well region provided in a semiconductor substrate, an impurity whose conductivity type is same as that of the well region is diffused into the peripheral portion thereof to form a diffused region thereon. Therefore, the well region having the approximately uniform surface impurity concentration is provided.

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