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    • 8. 发明申请
    • IN-SITU TCO CHAMBER CLEAN
    • 现场TCO室清洁
    • WO2014039420A1
    • 2014-03-13
    • PCT/US2013/057785
    • 2013-09-03
    • MATHESON TRI-GAS, INC.
    • WYSE, Carrie, L.MITCHELL, GlennTORRES, Robert, Jr.SUBRAMANIAN, RamkumarSHINRIKI, Matt
    • B08B5/00C23C16/448A61L9/20
    • B08B7/00C11D11/0041C23C14/564C23C16/4405
    • The present invention discloses new chamber clean chemistries for low temperature, gas phase, in-situ removal of fluorine doped tin oxide (FTO) films. These new in-situ cleaning chemistries will enable solar glass and low-emissivity glass manufacturers to improve the quality of FTO films produced, as well as reduce costs associated manual cleaning of FTO deposition systems. The end result is increased production throughput and better quality FTO films. This is achieved by using gas phase, in-situ cleaning molecules, such as, but not limited to, HI, CH 3 I, and HBr, in the FTO deposition chamber to remove unwanted buildup of FTO from chamber walls and components. Significant revenue can be derived from this customer benefit through molecule and technology solution sales related to in-situ FTO TCO chamber cleaning.
    • 本发明公开了用于低温,气相,原位去除氟掺杂氧化锡(FTO)膜的新型室清洁化学品。 这些新的原位清洁化学品将使太阳能玻璃和低辐射玻璃制造商能够提高生产的FTO薄膜的质量,并降低手动清洗FTO沉积系统的成本。 最终的结果是提高了生产量和更好的质量FTO薄膜。 这通过在FTO沉积室中使用气相,原位清洗分子,例如但不限于HI,CH 3 I和HBr来除去室壁和组分中不必要的FTO积累来实现。 通过与现场FTO TCO室清洗相关的分子和技术解决方案销售,可以从此客户利益中获得重要收入。