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    • 8. 发明授权
    • Semiconductor light emitting device
    • 半导体发光器件
    • US08488647B2
    • 2013-07-16
    • US12923634
    • 2010-09-30
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • H01S5/00
    • H01S5/0264H01S5/18313H01S5/18325
    • The present invention provides a semiconductor light emitting device realizing increased light detection precision by a simple manufacture process. One or more second oxidation layers are provided between an active layer and a semiconductor light detecting element in addition to a first oxidation layer for narrowing current. Since natural emission light includes many divergence components, the natural emission light is reflected and scattered by the second oxidation layer, and propagation of the natural emission light to the semiconductor light detecting element side is suppressed. The detection level of the natural emission light by the semiconductor light detecting element decreases, and light detection precision increases. The first and second oxidation layers are formed by a single oxidizing process so that the manufacturing process is simplified.
    • 本发明提供一种通过简单的制造工艺实现增加的光检测精度的半导体发光器件。 除了用于变窄的电流的第一氧化层之外,在有源层和半导体光检测元件之间提供一个或多个第二氧化层。 由于天然发射光包含许多发散分量,所以天然发射光被第二氧化层反射和散射,并且抑制了将自然发射光传播到半导体光检测元件侧。 半导体光检测元件的自然发光的检测水平降低,光检测精度提高。 第一和第二氧化层通过单一氧化工艺形成,从而简化了制造工艺。
    • 10. 发明申请
    • Semiconductor light emitting device
    • 半导体发光器件
    • US20110096806A1
    • 2011-04-28
    • US12923634
    • 2010-09-30
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • H01S5/02
    • H01S5/0264H01S5/18313H01S5/18325
    • The present invention provides a semiconductor light emitting device realizing increased light detection precision by a simple manufacture process. One or more second oxidation layers are provided between an active layer and a semiconductor light detecting element in addition to a first oxidation layer for narrowing current. Since natural emission light includes many divergence components, the natural emission light is reflected and scattered by the second oxidation layer, and propagation of the natural emission light to the semiconductor light detecting element side is suppressed. The detection level of the natural emission light by the semiconductor light detecting element decreases, and light detection precision increases. The first and second oxidation layers are formed by a single oxidizing process so that the manufacturing process is simplified.
    • 本发明提供一种通过简单的制造工艺实现增加的光检测精度的半导体发光器件。 除了用于变窄的电流的第一氧化层之外,在有源层和半导体光检测元件之间提供一个或多个第二氧化层。 由于天然发射光包含许多发散分量,所以天然发射光被第二氧化层反射和散射,并且抑制了将自然发射光传播到半导体光检测元件侧。 半导体光检测元件的自然发光的检测水平降低,光检测精度提高。 第一和第二氧化层通过单一氧化工艺形成,从而简化了制造工艺。