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    • 1. 发明授权
    • Semiconductor light emitting device
    • 半导体发光器件
    • US08488647B2
    • 2013-07-16
    • US12923634
    • 2010-09-30
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • H01S5/00
    • H01S5/0264H01S5/18313H01S5/18325
    • The present invention provides a semiconductor light emitting device realizing increased light detection precision by a simple manufacture process. One or more second oxidation layers are provided between an active layer and a semiconductor light detecting element in addition to a first oxidation layer for narrowing current. Since natural emission light includes many divergence components, the natural emission light is reflected and scattered by the second oxidation layer, and propagation of the natural emission light to the semiconductor light detecting element side is suppressed. The detection level of the natural emission light by the semiconductor light detecting element decreases, and light detection precision increases. The first and second oxidation layers are formed by a single oxidizing process so that the manufacturing process is simplified.
    • 本发明提供一种通过简单的制造工艺实现增加的光检测精度的半导体发光器件。 除了用于变窄的电流的第一氧化层之外,在有源层和半导体光检测元件之间提供一个或多个第二氧化层。 由于天然发射光包含许多发散分量,所以天然发射光被第二氧化层反射和散射,并且抑制了将自然发射光传播到半导体光检测元件侧。 半导体光检测元件的自然发光的检测水平降低,光检测精度提高。 第一和第二氧化层通过单一氧化工艺形成,从而简化了制造工艺。
    • 2. 发明申请
    • Semiconductor light emitting device
    • 半导体发光器件
    • US20110096806A1
    • 2011-04-28
    • US12923634
    • 2010-09-30
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • H01S5/02
    • H01S5/0264H01S5/18313H01S5/18325
    • The present invention provides a semiconductor light emitting device realizing increased light detection precision by a simple manufacture process. One or more second oxidation layers are provided between an active layer and a semiconductor light detecting element in addition to a first oxidation layer for narrowing current. Since natural emission light includes many divergence components, the natural emission light is reflected and scattered by the second oxidation layer, and propagation of the natural emission light to the semiconductor light detecting element side is suppressed. The detection level of the natural emission light by the semiconductor light detecting element decreases, and light detection precision increases. The first and second oxidation layers are formed by a single oxidizing process so that the manufacturing process is simplified.
    • 本发明提供一种通过简单的制造工艺实现增加的光检测精度的半导体发光器件。 除了用于变窄的电流的第一氧化层之外,在有源层和半导体光检测元件之间提供一个或多个第二氧化层。 由于天然发射光包含许多发散分量,所以天然发射光被第二氧化层反射和散射,并且抑制了将自然发射光传播到半导体光检测元件侧。 半导体光检测元件的自然发光的检测水平降低,光检测精度提高。 第一和第二氧化层通过单一氧化工艺形成,从而简化了制造工艺。
    • 9. 发明申请
    • Vertical cavity surface emitting laser
    • 垂直腔表面发射激光
    • US20090180506A1
    • 2009-07-16
    • US12318421
    • 2008-12-29
    • Osamu MaedaMasaki ShiozakiTakahiro Arakida
    • Osamu MaedaMasaki ShiozakiTakahiro Arakida
    • H01S5/183
    • H01S5/18394H01S5/0425H01S5/18311H01S5/18327H01S5/18347H01S5/18358H01S2301/166H01S2301/176
    • A Vertical Cavity Surface Emitting Laser (VCSEL) capable of providing high output of fundamental transverse mode while preventing oscillation of high-order transverse mode is provided. The VCSEL includes a semiconductor layer including an active layer and a current confinement layer, and a transverse mode adjustment section formed on the semiconductor layer. The current confinement layer has a current injection region and a current confinement region. The transverse mode adjustment section has a high reflectance area and a low reflectance area. The high reflectance area is formed in a region including a first opposed region opposing to a center point of the current injection region. A center point of the high reflectance area is arranged in a region different from the first opposed region. The low reflectance area is formed in a region where the high reflectance area is not formed, in an opposed region opposing to the current injection region.
    • 提供了能够提供高输出基本横模的垂直腔面发射激光器(VCSEL),同时防止高阶横模的振荡。 VCSEL包括形成在半导体层上的包括有源层和电流限制层的半导体层和横向模式调整部。 电流限制层具有电流注入区域和电流限制区域。 横模调整部具有高反射面积和低反射面积。 高反射率区域形成在包括与电流注入区域的中心点相对的第一相对区域的区域中。 高反射率区域的中心点布置在与第一相对区域不同的区域中。 在与电流注入区域相对的相对区域中,在没有形成高反射率区域的区域中形成低反射率区域。