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    • 2. 发明授权
    • Conductive contact plug and a method of forming a conductive contact
plug in an integrated circuit using laser planarization
    • 导电接触插塞和使用激光平面化在集成电路中形成导电接触插塞的方法
    • US5124780A
    • 1992-06-23
    • US713187
    • 1991-06-10
    • Gurtej S. SandhuChang YuTrung T. DoanMark E. Tuttle
    • Gurtej S. SandhuChang YuTrung T. DoanMark E. Tuttle
    • H01L21/28H01L21/321H01L21/768H01L23/532
    • H01L23/53223H01L21/32115H01L21/7684H01L21/76879H01L2924/0002
    • The invention is a method of forming a conductive contact plug and an interconnect line independent of each other. The contact plug is formed using laser planarization and a blanket etch back. The invention is also the contact plug thus formed. The contact plug and interconnect line may be fabricated with conductive materials having substantially similar methods of deposition. The integrity of the contact plug is enhanced using laser planarization.The process begins with a wafer having a dielectric layer, the upper surface of which has been planarized. A masking step defines a contact hole. An etch creates the contact hole which passes through the dielectric layer to a conductive region where contact is to be made. A first layer of conductive material is then deposited overlying the dielectric layer. A layer of material having an anti-reflective coating (ARC) (or a layer of material having a higher boiling point than the first layer) is deposited overlying the first layer. The ARC enhances the fluidity of the first layer during a subsequent laser planarization. The first layer and ARC overlying the dielectric are then laser planarized. The laser planarization is followed by a blanket etch of the first layer and ARC. The etch forms a contact plug substantially coplanar with the surface of the dielectric layer. At this juncture a second layer of conductive material may be deposited and masked to form interconnect lines for joining contact plugs.
    • 本发明是形成彼此独立的导电接触插塞和互连线的方法。 接触塞是使用激光平面化和毯式回蚀而形成的。 本发明也是如此形成的接触塞。 接触插塞和互连线可以用具有基本相似的沉积方法的导电材料制成。 使用激光平面化增强了接触插塞的完整性。 该方法开始于具有介电层的晶片,其上表面已被平坦化。 掩模步骤限定接触孔。 蚀刻产生穿过介电层的接触孔到要进行接触的导电区域。 然后将第一层导电材料沉积在电介质层上。 具有抗反射涂层(ARC)(或具有比第一层沸点高的材料层)的材料层沉积在第一层上。 ARC在随后的激光平面化期间增强了第一层的流动性。 然后将覆盖电介质的第一层和ARC激光平面化。 激光平面化之后是第一层和ARC的毯式蚀刻。 蚀刻形成与电介质层的表面基本上共面的接触插塞。 在这个时刻,第二层导电材料可以被沉积和掩蔽以形成用于连接接触插塞的互连线。
    • 3. 发明授权
    • Method of forming a capacitor in semiconductor wafer processing
    • 在半导体晶片加工中形成电容器的方法
    • US5202278A
    • 1993-04-13
    • US757197
    • 1991-09-10
    • Viju K. MathewsChang YuMark E. TuttleTrung T. Doan
    • Viju K. MathewsChang YuMark E. TuttleTrung T. Doan
    • H01L21/02
    • H01L28/82Y10S438/964
    • A method of forming a capacitor in semiconductor water processing comprising the following steps: a) providing a conductively doped first layer of polysilicon atop a silicon wafer to a first thickness; b) depositing an undoped second layer of polysilicon over the conductively doped first layer of polysilicon to a second thickness, the layer of undoped polysilicon being deposited at a deposition temperature of at least 590.degree. and having an upper surface; c) impinging laser energy onto the upper surface of the second polysilicon layer at a laser fluence of 0.3 J/cm.sup.2 or greater to roughen the upper surface and thereby increase the capacitance of the second polysilicon layer; d) patterning and etching the first and second polysilicon layers to define a lower capacitor plate; e) providing a layer of capacitor dielectric atop the roughened second polysilicon layer upper surface; and f) providing a layer of conductive material atop the capacitor dielectric to define an upper capacitor plate.
    • 一种在半导体水处理中形成电容器的方法,包括以下步骤:a)在硅晶片顶上提供导电掺杂的多晶硅第一层至第一厚度; b)在导电掺杂的第一多晶硅层上沉积未掺杂的第二多晶硅层至第二厚度,所述未掺杂多晶硅层在至少590°的沉积温度下沉积并具有上表面; c)以0.3J / cm 2或更大的激光能量密度将激光能量照射到第二多晶硅层的上表面上以使上表面粗糙化,从而增加第二多晶硅层的电容; d)图案化和蚀刻第一和第二多晶硅层以限定下电容器板; e)在粗糙化的第二多晶硅层上表面的上方提供电容器电介质层; 以及f)在电容器电介质顶部提供导电材料层以限定上电容器板。
    • 6. 发明授权
    • Split-polysilicon CMOS process incorporating self-aligned silicidation
of conductive regions
    • 分离多晶硅CMOS工艺结合导电区域的自对准硅化物
    • US5021353A
    • 1991-06-04
    • US485029
    • 1990-02-26
    • Tyler A. LowreyDermot M. DurcanTrung T. DoanGordon A. HallerMark E. Tuttle
    • Tyler A. LowreyDermot M. DurcanTrung T. DoanGordon A. HallerMark E. Tuttle
    • H01L21/336H01L21/8238
    • H01L29/665H01L21/823835
    • An improved CMOS fabrication process which uses separate masking steps to pattern N-channel and P-channel transistor gates from a single layer of conductively-doped polycrystalline silicon (poly) and incorporates self-aligned salicidation of conductive regions. The object of the improved process is to reduce the cost and improve the reliability, performance and manufacturability of CMOS devices by a process which features a dramatically reduced number of photomasking steps and which further allows self-aligned salicidation of transistor conductive regions. By processing N-channel and P-channel devices separately, the number of photomasking steps required to fabricate complete CMOS circuitry in a single-polysilicon-layer or single-metal layer process can be reduced from eleven to eight. Starting with a substrate of P-type material, N-channel devices are formed first, with unetched poly left in the future P-channel regions until N-channel processing is complete. The improved CMOS process provides the following advantages over conventional process technology: Use of a masked high-energy punch-through implant for N-channel devices is not required; individual optimization of N-channel and P-channel transistors is made possible; a lightly-doped drain (LDD) design for both N-channel and P-channel transistors is readily implemented; source/drain-to-gate offset may be changed independently for N-channel and P-channel devices; and N-channel and P-channel transistors can be independently controlled and optimized for best LDD performance and reliability.
    • 一种改进的CMOS制造工艺,其使用单独的掩模步骤来从单层导电掺杂多晶硅(poly)中的N沟道和P沟道晶体管栅极图案化,并且引入导电区域的自对准的阳离子化。 改进方法的目的是降低成本,并且通过具有显着减少的光掩模步骤数目并进一步允许晶体管导电区域的自对准盐化的方法来降低CMOS器件的可靠性,性能和可制造性。 通过分别处理N沟道和P沟道器件,在单多晶硅层或单金属层工艺中制造完整的CMOS电路所需的光掩模步骤的数量可以从11减少到8个。 从P型材料的衬底开始,首先形成N沟道器件,在未来的P沟道区域中留下未蚀刻的聚合物,直到N沟道处理完成。 与传统工艺技术相比,改进的CMOS工艺提供了以下优点:不需要对N沟道器件使用掩模的高能穿孔注入器; N通道和P沟道晶体管的单独优化成为可能; 容易实现用于N沟道和P沟道晶体管的轻掺杂漏极(LDD)设计; 源/漏 - 门偏移可以针对N沟道和P沟道器件独立地改变; 可以独立控制和优化N沟道和P沟道晶体管,以获得最佳的LDD性能和可靠性。
    • 9. 发明授权
    • Radio frequency identification device operating methods, radio frequency identification device configuration methods, and radio frequency identification devices
    • 射频识别装置的操作方法,射频识别装置的配置方法和射频识别装置
    • US08624711B2
    • 2014-01-07
    • US11968561
    • 2008-01-02
    • Mark E. TuttleJohn R. Tuttle
    • Mark E. TuttleJohn R. Tuttle
    • H04Q5/22
    • H01Q1/2225G01S13/767G01S13/78G06K7/10346G06K19/0723G06K19/0726G06K19/07749H01Q1/22H01Q7/00
    • An adjustable radio frequency data communications device has a monolithic semiconductor integrated circuit with integrated circuitry, interrogation receiving circuitry provided on the monolithic integrated circuit forming at least part of the integrated circuitry and configured to receive an interrogation signal from the interrogator unit, an antenna electrically coupled to the interrogation receiving circuitry and configured to communicate with the remote interrogator unit, a power source electrically coupled to the integrated circuitry and configured to generate operating power for the communications device, and at least one of the antenna and the interrogation receiving circuitry having reconfigurable electrical characteristics, the electrical characteristics being reconfigurable to selectively tune the at least one of the antenna and the interrogation receiving circuitry within a range of tuned and detuned states to realize a desired receiver sensitivity of the communications device. Additionally, a method for tuning receiver sensitivity and/or transmitter sensitivity according to construction of the above device is disclosed.
    • 一种可调节射频数据通信设备具有集成电路的单片半导体集成电路,在单片集成电路上提供的询问接收电路,其形成集成电路的至少一部分并且被配置为从询问器单元接收询问信号,天线电耦合 所述询问接收电路被配置为与所述远程询问器单元通信;电源,其耦合到所述集成电路并且被配置为生成所述通信设备的操作功率,并且所述天线和所述询问接收电路中的至少一个具有可重新配置的电 特性,电特性是可重构的,以在调谐和失谐状态的范围内选择性地调谐天线和询问接收电路中的至少一个,以实现通信设备的期望接收机灵敏度 e。 此外,公开了根据上述装置的结构来调整接收机灵敏度和/或发射机灵敏度的方法。
    • 10. 再颁专利
    • Method for electronic tracking of units associated with a batch
    • 电子跟踪与批次相关的单元的方法
    • USRE44409E1
    • 2013-08-06
    • US13269853
    • 2011-10-10
    • Ross S. DandoMark E. Tuttle
    • Ross S. DandoMark E. Tuttle
    • G08B13/14
    • G06K7/10366A22B5/0064A22B7/00A22B7/007A22C17/10G06K7/0008G06K17/0022G06K2017/0045G08B13/2434G08B13/2462
    • In one aspect, the invention encompasses a method for electronic tracking of units originating from a common source which comprises a plurality of units physically joined with one another. A first transponder is physically associated with the common source, and the source is split to separate it into three or more of the units. A second transponder is physically associated with one of the three or more units, and the second transponder sends a code. The code of the second transponder is electrically associated with an identifier of the common source. In a particular aspect, the common source is an animal carcass. A batch comprises separate units of objects that are physically joined together. RFID tags are attached to each of the units and to the batch. The codes stored in the RFID tags are electrically associated with one another in the database.
    • 一方面,本发明包括用于电子跟踪源自公共源的单元的方法,该方法包括彼此物理连接的多个单元。 第一个转发器与公共源物理关联,源被拆分成三个或更多个单元。 第二个转发器与三个或更多个单元中的一个物理相关联,第二个应答器发送一个代码。 第二应答器的代码与公共源的标识符电连接。 在一个特定方面,共同的来源是动物尸体。 批次包括物理连接在一起的单独的物体单元。 RFID标签连接到每个单元和批次。 存储在RFID标签中的代码在数据库中彼此电联系。