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    • 1. 发明授权
    • Ultrasonic probe and ultrasonic diagnosis device
    • 超声波探头和超声波诊断装置
    • US08551003B2
    • 2013-10-08
    • US12602119
    • 2008-05-14
    • Makoto FukadaShuzo SanoAkifumi Sako
    • Makoto FukadaShuzo SanoAkifumi Sako
    • A61B8/00
    • B06B1/0292
    • An ultrasonic probe and an ultrasonic diagnosis device which can improve electrical safety for an operator are provided. The ultrasonic probe 2 has an insulating portion 62 between a mounting board 43 and a case 25. Since electrical leakage from the internal device of the ultrasonic probe 2 can be prevented, electrical safety of the ultrasonic probe 2 for the operator can be improved. A conductive film 61 is provided on the ultrasonic wave radiation side of a cMUT chip 20, and a conductive member 63 is provided along the insulating member 62. A conductive film 61 and a conductive member 63 are connected by a conductive member 64. A closed space having a ground potential is formed by the conductive film 61, the conductive member 63 and a coaxial cable 55 connected to ground. Main components or the body circuits of the ultrasonic probe 2 are contained in the closed space having the ground potential and shielded electrically from the outside.
    • 提供了能够提高操作者的电气安全性的超声波探头和超声波诊断装置。 超声波探头2在安装基板43和外壳25之间具有绝缘部62.由于可以防止来自超声波探头2的内部装置的漏电,因此能够提高操作者的超声波探头2的电气安全性。 在cMUT芯片20的超声波辐射侧设置有导电膜61,并且沿着绝缘构件62设置导电构件63.导电膜61和导电构件63通过导电构件64连接。封闭 具有接地电位的空间由导电膜61,导电构件63和连接到地的同轴电缆55形成。 超声波探头2的主要部件或体电路被包含在具有接地电位的封闭空间中并与外部电隔离。
    • 4. 发明申请
    • ULTRASONIC PROBE AND ULTRASONIC DIAGNOSIS DEVICE
    • 超声探头和超声诊断装置
    • US20100154547A1
    • 2010-06-24
    • US12602119
    • 2008-05-14
    • Makoto FukadaShuzo SanoAkifumi Sako
    • Makoto FukadaShuzo SanoAkifumi Sako
    • G01N29/24
    • B06B1/0292
    • An ultrasonic probe and an ultrasonic diagnosis device which can improve electrical safety for an operator are provided. The ultrasonic probe 2 has an insulating portion 62 between a mounting board 43 and a case 25. Since electrical leakage from the internal device of the ultrasonic probe 2 can be prevented, electrical safety of the ultrasonic probe 2 for the operator can be improved. A conductive film 61 is provided on the ultrasonic wave radiation side of a cMUT chip 20, and a conductive member 63 is provided along the insulating member 62. A conductive film 61 and a conductive member 63 are connected by a conductive member 64. A closed space having a ground potential is formed by the conductive film 61, the conductive member 63 and a coaxial cable 55 connected to ground. Main components or the body circuits of the ultrasonic probe 2 are contained in the closed space having the ground potential and shielded electrically from the outside.
    • 提供了能够提高操作者的电气安全性的超声波探头和超声波诊断装置。 超声波探头2在安装基板43和外壳25之间具有绝缘部62.由于可以防止来自超声波探头2的内部装置的漏电,因此能够提高操作者的超声波探头2的电气安全性。 在cMUT芯片20的超声波辐射侧设置有导电膜61,并且沿着绝缘构件62设置导电构件63.导电膜61和导电构件63通过导电构件64连接。封闭 具有接地电位的空间由导电膜61,导电构件63和连接到地的同轴电缆55形成。 超声波探头2的主要部件或体电路被包含在具有接地电位的封闭空间中并与外部电隔离。
    • 6. 发明申请
    • ULTRASONIC PROBE AND ULTRASONIC DIAGNOSTIC APPARATUS USING THE SAME
    • 超声波探头和超声波诊断装置
    • US20100036257A1
    • 2010-02-11
    • US12513858
    • 2007-11-06
    • Shuzo SanoAkifumi SakoTakashi KobayashiMikio Izumi
    • Shuzo SanoAkifumi SakoTakashi KobayashiMikio Izumi
    • A61B8/00
    • A61B8/4281A61B8/4455A61B8/4483B06B1/0292H04R19/005
    • Provided is an ultrasonic probe including: a cMUT chip having a plurality of vibration elements whose electromechanical coupling coefficient or sensitivity is changed according to a bias voltage and transmitting and receiving ultrasonic waves; an acoustic lens arranged above the cMUT chip: and a backing layer arranged below the cMUT chip.Electric leakage preventing means is provided at the ultrasonic wave transmission/reception surface side of the acoustic lens or between the acoustic lens and the cMUT chip.The electric leakage preventing means is, for example, an insulating layer such as a ground layer.By using such a structure, it is possible to provide an ultrasonic probe capable of preventing electric leakage from the ultrasonic probe to an object to be examined so as to improve the electric safety and an ultrasonic diagnostic apparatus using the probe.
    • 本发明提供一种超声波探头,包括:cMUT芯片,具有多个振动元件,其机电耦合系数或灵敏度根据偏置电压而变化,并且发送和接收超声波; 布置在cMUT芯片上方的声透镜;以及布置在cMUT芯片下方的背衬层。 在声透镜的超声波发射/接收表面侧或声透镜和cMUT芯片之间设置防漏电装置。 漏电防止装置例如是诸如接地层的绝缘层。 通过使用这样的结构,能够提供能够防止从超声波探头向被检体的电泄漏以提高电气安全性的超声波探头和使用该探针的超声波诊断装置。
    • 7. 发明授权
    • Ultrasonic probe and ultrasonic diagnostic apparatus using the same
    • 超声波探头和超声波诊断仪使用相同
    • US08758253B2
    • 2014-06-24
    • US12513858
    • 2007-11-06
    • Shuzo SanoAkifumi SakoTakashi KobayashiMikio Izumi
    • Shuzo SanoAkifumi SakoTakashi KobayashiMikio Izumi
    • A61B8/14A61B8/00
    • A61B8/4281A61B8/4455A61B8/4483B06B1/0292H04R19/005
    • An ultrasonic probe is disclosed which includes a cMUT chip having a plurality of vibration elements whose electromechanical coupling coefficient or sensitivity is changed according to a bias voltage and transmitting and receiving ultrasonic waves, an acoustic lens arranged above the cMUT chip, and a backing layer arranged below the cMUT chip. An electric leakage preventing unit is provided at the ultrasonic wave transmission/reception surface side of the acoustic lens or between the acoustic lens and the cMUT chip. The electric leakage preventing unit can be, for example, an insulating layer such as a ground layer. Such a structure makes it is possible to provide an ultrasonic probe capable of preventing electric leakage from the ultrasonic probe to an object to be examined so as to improve the electric safety and an ultrasonic diagnostic apparatus using the probe.
    • 公开了一种超声波探头,其包括具有多个振动元件的cMUT芯片,其中机电耦合系数或灵敏度根据偏置电压而变化,并且发送和接收超声波,布置在cMUT芯片上方的声透镜,以及布置在 在cMUT芯片之下。 在声透镜的超声波发送/接收表面侧或声透镜和cMUT芯片之间设置漏电防止单元。 防漏电单元可以是例如绝缘层,例如接地层。 通过这样的结构,能够提供能够防止从超声波探头向被检体的漏电以提高电气安全性的超声波探头以及使用该探针的超声波诊断装置。
    • 8. 发明授权
    • Ultrasonic probe and method for manufacturing the same and ultrasonic diagnostic device
    • 超声波探头及其制造方法及超声波诊断装置
    • US08540640B2
    • 2013-09-24
    • US12525353
    • 2008-02-27
    • Shuzo SanoAkifumi SakoTakashi KobayashiMikio Izumi
    • Shuzo SanoAkifumi SakoTakashi KobayashiMikio Izumi
    • A61B8/14
    • G01N29/2406B06B1/0292G01N29/0654G01N29/221G01N2291/106
    • An ultrasonic probe (2) comprises a cMUT chip (20), which has a plurality of vibration elements whose electromechanical coupling coefficient or the sensitivity changes depending on a bias voltage, and transmits/receives an ultrasonic wave; an acoustic lens (26) provided on the ultrasonic wave radiation side of the cMUT chip (20); a backing layer (22) provided on the back side of the cMUT chip (20) for absorbing propagation of the ultrasonic wave; an electric wiring portion (flexible substrate (72)), which is provided from the peripheral portion of the cMUT chip (20) to the side face of the backing layer (22) and has a signal pattern connected with the electrode of the cMUT chip (20) arranged thereon; and a housing (ultrasonic probe cover (25)) for containing the cMUT chip (20), the acoustic lens (26), the backing layer (22) and the electric wiring portion (flexible substrate (72)). A ground layer (conductive film (76)) of ground potential is provided on the ultrasonic wave radiation side of the cMUT chip (20).
    • 超声波探头(2)包括cMUT芯片(20),其具有多个振动元件,其机电耦合系数或灵敏度根据偏置电压而变化,并且发送/接收超声波; 设置在cMUT芯片(20)的超声波辐射侧的声透镜(26); 设置在所述cMUT芯片(20)背面的用于吸收超声波传播的背衬层(22); 从cMUT芯片(20)的周边部分到背衬层(22)的侧面设置的电连接部分(柔性基板(72)),并且具有与cMUT芯片的电极连接的信号图案 (20); 以及用于容纳cMUT芯片(20),声透镜(26),背层(22)和电布线部分(柔性基板(72))的外壳(超声波探头盖(25))。 地电位的接地层(导电膜(76))设置在cMUT芯片(20)的超声波辐射侧。
    • 9. 发明申请
    • Ultrasonic Probe, Production Method Therefor, and Ultrasonic Diagnostic Apparatus
    • 超声波探头及其制作方法及超声波诊断装置
    • US20130031980A1
    • 2013-02-07
    • US13641695
    • 2011-04-06
    • Akifumi SakoMakoto FukadaKazunari Ishida
    • Akifumi SakoMakoto FukadaKazunari Ishida
    • G01N29/24B32B37/12
    • B06B1/0292Y10T156/10
    • Disclosed is an ultrasonic probe wherein the warpage of a CMUT due to thermal stress produced at the joint between a backing layer and the CMUT is minimized, thereby improving the durability of the bond between the CMUT and the backing layer. To accomplish this the ultrasonic probe is provided with: a CMUT (20) having vibratory elements that change the electromechanical coupling coefficient or sensitivity according to the bias voltage to be applied; a backing layer (22) adhered to the rear side of the ultrasonic transmission surface of the CMUT (20); and a thermal-stress balancing member (24) to be adhered to the backing layer (22) while being disposed facing the CMUT (20) in such a manner that the backing layer (22) is sandwiched therebetween so as to minimize the warpage of the CMUT (20) due to thermal stress produced between the CMUT (20).
    • 公开了一种超声波探头,其中由于在背衬层和CMUT之间的接合处产生的热应力引起的CMUT的翘曲最小化,从而提高了CMUT与背衬层之间的结合的耐久性。 为了实现这一点,超声波探头设置有:具有根据要施加的偏置电压改变机电耦合系数或灵敏度的振动元件的CMUT(20) 粘附到CMUT(20)的超声波传播表面的后侧的背衬层(22); 以及在将背衬层(22)夹在其间的方式面对CMUT(20)设置的同时被粘附到背衬层(22)上的热应力平衡构件(24),以便最小化 CMUT(20)由于在CMUT(20)之间产生的热应力。