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    • 2. 发明申请
    • DELAY OPTIMAL COMPRESSOR TREE SYNTHESIS FOR LUT-BASED FPGAS
    • 延迟用于基于LUT的FPGAS的最佳压缩机树合成
    • US20110153709A1
    • 2011-06-23
    • US12717520
    • 2010-03-04
    • Juinn-Dar HUANGJhih-Hong LuBu-Ching LinJing-Yang Jou
    • Juinn-Dar HUANGJhih-Hong LuBu-Ching LinJing-Yang Jou
    • G06F7/50
    • G06F7/5318
    • A compressor tree synthesis algorithm, named DOCT, which guarantees the delay optimal implementation in LUT-based FPGAs. Given a targeted K-input LUT architecture, DOCT firstly derives a finite set of prime patterns as essential building blocks. Then, it shows that a delay optimal compressor tree can always be constructed by those derived prime patterns via integer linear programming (ILP). Without loss of delay optimality, a post-processing procedure is invoked to reduce the number of demanded LUTs for the generated compressor tree design. DOCT has been evaluated over a broad set of benchmark circuits. The DOCT reduces the depth of the compressor tree and the number of LUTs based on the modern 8-input LUT-based FPGA architecture.
    • 一种称为DOCT的压缩器树合成算法,其保证了基于LUT的FPGA中的延迟最优实现。 给定一个有针对性的K输入LUT架构,DOCT首先将有限的主要模式集合作为必要的构建块。 然后,它表明延迟最优压缩器树可以总是通过整数线性规划(ILP)由那些导出的素数模式来构造。 在不损失延迟最优性的情况下,调用后处理过程以减少所生成的压缩器树设计所需的LUT的数量。 已经对广泛的基准电路进行了DOCT评估。 DOCT基于现代的基于8输入LUT的FPGA架构,降低了压缩树的深度和LUT的数量。
    • 3. 发明授权
    • Built-in self verification circuit for system chip design
    • 内置自检电路,用于系统芯片设计
    • US06675337B1
    • 2004-01-06
    • US09630905
    • 2000-08-02
    • Shing-Wu TungChun-Yao WangJing-Yang Jou
    • Shing-Wu TungChun-Yao WangJing-Yang Jou
    • G01R3128
    • G01R31/318342
    • A built-in verification circuit having a circuit-under-test circuit, a test pattern generator, a bi-directional signal flow switch and three unidirectional, signal flow switches. The test pattern generator produces a testing pattern based on an input/output port order fault model. The bi-directional signal flow switch is positioned between the input terminal of the built-in verification circuit and the circuit-under-test circuit. The first unidirectional signal flow switch is positioned between the circuit-under-test circuit and the test pattern generator. The second unidirectional signal flow switch is positioned between the circuit-under-test circuit and the output terminal of the built-in verification circuit. The third unidirectional signal flow switch is positioned between the test pattern generator and the output terminal of the built-in verification circuit. The bi-directional signal flow switch and the first unidirectional signal flow switch are used for controlling the input terminal of the built-in verification circuit and the signal flow direction of the test pattern generator. The second and the third unidirectional signal flow switch are used for controlling the signal source of the output from the built-in verification circuit.
    • 具有电路不足测试电路,测试图形发生器,双向信号流开关和三个单向信号流开关的内置验证电路。 测试模式生成器基于输入/输出端口顺序故障模型生成测试模式。 双向信号流开关位于内置验证电路的输入端和被测电路之间。 第一单向信号流开关位于测试电路和测试图案发生器之间。 第二单向信号流开关位于被测电路和内置验证电路的输出端之间。 第三单向信号流开关位于测试图形发生器和内置验证电路的输出端之间。 双向信号流开关和第一单向信号流开关用于控制内置验证电路的输入端和测试模式发生器的信号流向。 第二和第三单向信号流开关用于控制来自内置验证电路的输出的信号源。
    • 4. 发明授权
    • Programmable logic array
    • 可编程逻辑阵列
    • US4768196A
    • 1988-08-30
    • US923984
    • 1986-10-28
    • Jing-Yang JouChristopher Rosebrugh
    • Jing-Yang JouChristopher Rosebrugh
    • G01R31/28G01R31/3185G06F11/22G06F11/27H03K19/177G01R31/02
    • G01R31/318516G06F11/27
    • Built-in self-test programmable logic arrays use a deterministic test pattern generator to generate test patterns such that each cross point in an AND-plane can be evaulated sequentially. A multiple input signature register which uses X.sup.Q +1 as its characteristic polynomial is used to evaulate the test results, where Q is the number of outputs. The final signature can be further compressed into only one bit. Instead of only determining the probability of fault detection, in this scheme, the fault detection capability has been analyzed using both the stuck at fault and the contact fault model. It can be shown that all of these faults can be detected. Shorts between two adjacent lines can be detected by using NOR gates.
    • 内置自检可编程逻辑阵列使用确定性测试模式发生器来产生测试模式,使得可以依次对AND平面中的每个交叉点进行排除。 使用XQ + 1作为特征多项式的多输入签名寄存器用于表示测试结果,其中Q是输出数。 最后的签名可以进一步压缩成只有一个位。 而不是仅仅确定故障检测的概率,在这种方案中,故障检测能力已经使用故障和接触故障模型进行了分析。 可以看出可以检测到所有这些故障。 可以通过使用NOR门检测两条相邻行之间的短路。
    • 9. 发明授权
    • Prioritized debugging of an error space in program code
    • 程序代码中错误空间的优先调试
    • US07013457B2
    • 2006-03-14
    • US09682140
    • 2001-07-26
    • Tai-Ying ChiangJing-Yang JouMing-Chih LaiJien-Shen Tsai
    • Tai-Ying ChiangJing-Yang JouMing-Chih LaiJien-Shen Tsai
    • G06F9/44
    • G06F11/362
    • A computer system has an input system and an output system. Program code to be debugged has a plurality of program code statements. The input system is utilized to indicate an error variable in the program code. The error variable has an error value that differs from a desired value. An error set of the error variable is obtained, which is a subset of the statements in the computer readable code. Each statement in the error set is relationally connected to the error variable. A priority value is given to each statement in the error set. The priority values indicate a computed probability that the associated statement is an error source of the error variable. Finally, the output system is used to present each statement in the error set in an ordered manner according to the priority values.
    • 计算机系统具有输入系统和输出系统。 要调试的程序代码具有多个程序代码语句。 输入系统用于指示程序代码中的错误变量。 错误变量的值与所需值不同。 获得错误变量的错误集,这是计算机可读代码中的语句的一个子集。 错误集中的每个语句都与错误变量相关联。 给出错误集中的每个语句的优先级值。 优先级值表示计算出的关联语句是错误变量的错误源的概率。 最后,输出系统用于根据优先级值以有序的方式向错误集中呈现每个语句。