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    • 3. 发明授权
    • Single-chip semiconductor integrated circuit device and microcomputer
integrated on a semiconductor chip
    • 集成在半导体芯片上的单片半导体集成电路器件和微计算机
    • US5784637A
    • 1998-07-21
    • US414157
    • 1995-03-31
    • Terumi SawaseKouki NoguchiHideo NakamuraYasushi AkaoShiro BabaYoshimune Hagiwara
    • Terumi SawaseKouki NoguchiHideo NakamuraYasushi AkaoShiro BabaYoshimune Hagiwara
    • G06F9/24G06F15/78
    • G06F9/24G06F15/7814
    • A semiconductor integrated circuit device formed on a single chip or a microcomputer integrated on a semiconductor chip includes a central processing unit (CPU), an interface circuit (or an input/output port), a bus coupled to the CPU and the interface circuit (or the input/output port) and a variable logic circuit (or a subprocessor). The variable logic circuit (or the subprocessor) includes non-volatile memory elements storing instructions, a control circuit generating control signals in accordance with the stored instructions, and an arithmetic logic unit controlled by the generated control signals. Information can be written into the non-volatile memory elements from outside to construct the variable logic circuit or the subprocessor with any desired logical functions. The wiring operation of the memory elements can be executed in a short time, and a user can thus quickly obtain a single-chip microprocessor or a single-chip semiconductor integrated circuit device having hardware of peculiar prescribed specifications.
    • 形成在集成在半导体芯片上的单个芯片或微计算机上的半导体集成电路装置包括中央处理单元(CPU),接口电路(或输入/输出端口),耦合到CPU和接口电路的总线 或输入/输出端口)和可变逻辑电路(或子处理器)。 可变逻辑电路(或子处理器)包括存储指令的非易失性存储器元件,根据存储的指令产生控制信号的控制电路以及由所生成的控制信号控制的算术逻辑单元。 可以从外部将信息写入非易失性存储器元件,以任何期望的逻辑功能构建可变逻辑电路或子处理器。 存储元件的布线操作可以在短时间内执行,因此用户可以快速获得具有特定规定规格的硬件的单芯片微处理器或单芯片半导体集成电路器件。
    • 10. 发明授权
    • Method of diagnosing integrated logic circuit
    • 诊断集成逻辑电路的方法
    • US4996659A
    • 1991-02-26
    • US84153
    • 1987-08-12
    • Noboru YamaguchiHideo NakamuraYoshimune HagiwaraTsukasa SatoHaruo Koizumi
    • Noboru YamaguchiHideo NakamuraYoshimune HagiwaraTsukasa SatoHaruo Koizumi
    • G01R31/305G01R31/3193
    • G01R31/3193G01R31/305
    • A method of diagnosis of an integrated logic circuit having function blocks, in which a test signal is supplied to the logic circuit; an input signal to and an output signal from at least one of the function blocks are detected by the use of a contactless probing device such as an electron beam probing device or laser beam probing device; simulation is carried out of a normal logic operation of the function block with the detected input signal to provide a simulated output signal; the detected and simulated output signals are compared with each other; and the function block is determined as being normal or abnormal according to the result of the comparison. When the function block includes plural logic elements, the cause of the abnormality may be traced back to a faulty function element by detecting the output of a function element by a contactless probing device, comparing the detected output with a corresponding simulated output and repeating the detection and comparison on other function elements in the function block until the comparison results in coincidence. The function element which receives the signal providing the coincidence as a result of the comparison is determined as the faulty function element.
    • 一种诊断具有功能块的集成逻辑电路的方法,其中测试信号被提供给逻辑电路; 通过使用诸如电子束探测装置或激光束探测装置的非接触探测装置来检测来自至少一个功能块的输入信号和输出信号; 利用检测到的输入信号对功能块的正常逻辑运算进行仿真,以提供模拟输出信号; 检测和模拟的输出信号相互比较; 并且根据比较的结果将功能块确定为正常或异常。 当功能块包括多个逻辑元件时,通过非接触探测装置检测功能元件的输出,将检测到的输出与对应的模拟输出进行比较并重复检测,可以将异常的原因追溯到故障功能元件 并比较功能块中的其他功能元素,直到比较结果重合。 将作为比较结果提供一致的信号的功能元件确定为故障功能元件。