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    • 3. 发明授权
    • Method and apparatus for logical simulation
    • 逻辑仿真的方法和装置
    • US5051941A
    • 1991-09-24
    • US478511
    • 1990-02-12
    • Yoshio TakamineShunsuke MiyamotoTakayuki NakagawaYoshiharu KazamaYoshiaki Kinoshita
    • Yoshio TakamineShunsuke MiyamotoTakayuki NakagawaYoshiharu KazamaYoshiaki Kinoshita
    • G06F17/50
    • G06F17/5022
    • A method of logic simulation for simulating operation of a logic circuit by using basic signal values corresponding to states of output signals of elements of the logic circuit to be simulated and expanded signal values including the basic signal values. The logic circuit to be simulated is divided into a portion to be simulated by using the basic signal values and the expanded signal values and a portion to be simulated by using the basic signal values without using the expanded signal values. The elements for which definition of calculation method for output signal values for the input signal values including the expanded signal values is not easy are included in the latter portion, and other elements are included in the former portion. A virtual signal conversion element for converting the expanded signal into the basic signal is provided at a position where a signal is sent from the former portion to the latter portion so that the expanded signal value outputted from the element of the former portion is converted into the basic signal value before it is sent to the element of the latter portion.
    • 一种逻辑仿真方法,用于通过使用与要被仿真的逻辑电路的元件的输出信号的状态对应的基本信号值和包括基本信号值的扩展信号值来模拟逻辑电路的操作。 要模拟的逻辑电路通过使用基本信号值和扩展信号值以及通过使用基本信号值而不使用扩展信号值而要被仿真的部分来划分为要被模拟的部分。 对于包括扩展信号值的输入信号值的输出信号值的计算方法的定义不容易的元件包括在后一部分中,并且其它元件包括在前一部分中。 将扩展信号转换为基本信号的虚拟信号转换元件设置在信号从前一部分发送到后一部分的位置,使得从前一部分的元件输出的扩展信号值被转换为 基本信号值被发送到后一部分的元素之前。
    • 7. 发明授权
    • Apparatus for wire routing of VLSI
    • VLSI线路设备
    • US5245550A
    • 1993-09-14
    • US820995
    • 1992-01-15
    • Yoshio MikiKei SuzukiYoshio Takamine
    • Yoshio MikiKei SuzukiYoshio Takamine
    • H01L21/82G06F17/50
    • G06F17/5077
    • A wiring route is determined between terminals on an integrated circuit on the basis of information concerning the terminals and areas of the integrated circuit through which a wire can be routed. A mesh memory holds information of mesh points of a wiring area partitioned in a mesh-like pattern. A wavefront memory holds information concerning mesh points constituting the leads of searching point arrays. An expansion point extracting unit selects a source point from the mesh points for a succeeding search from the leading mesh points on the basis of costs. Addresses and costs for mesh points neighboring the source point are calculated. A searching point register holds information concerning the mesh points obtained through the calculation. A determination is made of whether or not the mesh points placed in the searching point register can be searched, and if so they are written to the mesh memory. Duplicate information stored in the searching point register is eliminated. It is then determined whether or not the mesh points corresponding to the terminals to be wired are contained in the searching point register. If so, the wiring route is determined and the process concluded.
    • 在集成电路的端子之间根据关于可以布线的集成电路的端子和区域的信息确定布线路线。 网格存储器保持以网状图案划分的布线区域的网格点的信息。 波前存储器保存关于构成搜索点阵列的引线的网点的信息。 扩展点提取单元根据成本从前述网格点从网格点中选择来自后续搜索的源点。 计算与源点相邻的网格点的地址和成本。 搜索点寄存器保存关于通过计算获得的网格点的信息。 确定是否可以搜索放置在搜索点寄存器中的网格点,如果是,则将其写入网格存储器。 消除了存储在搜索点寄存器中的重复信息。 然后,确定与要接线的终端相对应的网格点是否包含在搜索点寄存器中。 如果是这样,则确定布线路线,结束处理。
    • 10. 发明申请
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US20090063913A1
    • 2009-03-05
    • US12073885
    • 2008-03-11
    • Kaname YamasakiYoshio Takamine
    • Kaname YamasakiYoshio Takamine
    • G11C29/04G06F11/22
    • G11C29/20G11C2029/3602
    • Test functions are expanded by adopting a test part, and an increase in circuit scale is reduced by adding the test part. A semiconductor integrated circuit comprises a memory that includes plural memory banks and is accessed by specifying a bank address, an X address, and a Y address, and a self-test part that tests the memory in response to commands. The self-test part has an address counter covering plural addressing modes that are different in how to update X addresses, Y addresses, and bank addresses. A variety of addressing modes provided for testing contribute to the expansion of BIST-based test functions. Since the self-test part has plural test sequencers corresponding to plural test modes, the area of the semiconductor integrated circuit can be easily reduced in comparison with program-controlled general-purpose sequencers requiring memory for storing programs.
    • 通过采用测试部件扩展测试功能,通过添加测试部件来减小电路规模的增加。 半导体集成电路包括包括多个存储体的存储器,并且通过指定存储体地址,X地址和Y地址以及响应于命令来测试存储器的自检部件被访问。 自检部分具有地址计数器,覆盖了如何更新X地址,Y地址和银行地址的不同的寻址模式。 为测试提供的各种寻址模式有助于扩展基于BIST的测试功能。 由于自检部分具有对应于多个测试模式的多个测试序列器,所以与需要用于存储程序的存储器的程序控制的通用定序器相比,可以容易地减少半导体集成电路的面积。